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PRODID:IEEE vTools.Events//EN
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BEGIN:DAYLIGHT
DTSTART:20170312T030000
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
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DTSTART:20171105T010000
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BEGIN:VEVENT
DTSTAMP:20170224T001359Z
UID:71CA14C2-F49D-11E6-A7C6-0050568D7F66
DTSTART;TZID=US/Eastern:20170320T183000
DTEND;TZID=US/Eastern:20170320T203000
DESCRIPTION:With the advance of technology\, electrical and electronic syst
 ems designs have become progressively more complex. This advancing complex
 ity of design has led to intra-system and inter-system interactions not an
 ticipated by the original designers. The vast majority of these interactio
 ns have resulted in system disoperation and failure.\n\nThe talk provides 
 an overview of EMC engineering. The origins and history of the discipline 
 is briefly reviewed. Types of EMI interactions are discussed. Methods of a
 ddressing EMC are also presented\, including the most widely used standard
 s. Some working examples and anecdotes are explored. The examples encompas
 s conducted as well as radiated interactions.\n\nCo-sponsored by: Mey Sen\
 n\nSpeaker(s): Harry\, \, Harry\, \n\nBldg: Westinghouse Energy Center\, 4
 350 Northern Pike\, Monroeville\, Pennsylvania\, United States\, 15146
LOCATION:Bldg: Westinghouse Energy Center\, 4350 Northern Pike\, Monroevill
 e\, Pennsylvania\, United States\, 15146
ORGANIZER:senml@ieee.org
SEQUENCE:1
SUMMARY:EMC: What is it?
URL;VALUE=URI:https://events.vtools.ieee.org/m/43949
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;With the advance of technology\, electrica
 l and electronic systems designs have become progressively more complex. T
 his advancing complexity of design has led to intra-system and inter-syste
 m interactions not anticipated by the original designers. The vast majorit
 y of these interactions have resulted in system disoperation and failure.&lt;
 /p&gt;\n&lt;p&gt;The talk provides an overview of EMC engineering. The origins and 
 history of the discipline is briefly reviewed. Types of EMI interactions a
 re discussed. Methods of addressing EMC are also presented\, including the
  most widely used standards. Some working examples and anecdotes are explo
 red. The examples encompass conducted as well as radiated interactions.&lt;/p
 &gt;
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