BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/Denver BEGIN:DAYLIGHT DTSTART:20240310T030000 TZOFFSETFROM:-0700 TZOFFSETTO:-0600 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:MDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20241103T010000 TZOFFSETFROM:-0600 TZOFFSETTO:-0700 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:MST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20241028T153751Z UID:119264D0-AD00-4F96-9BAA-1F6D6EA5CC66 DTSTART;TZID=America/Denver:20241025T110000 DTEND;TZID=America/Denver:20241025T230000 DESCRIPTION:X-ray detected ferromagnetic resonance (XFMR) spectroscopy prov ides a unique tool for measuring magnetic dynamics at and across interface s\, due to its ability to measure individually the ferromagnetic resonance of each element in a sample. Until now\, XFMR has generally been shown at frequencies below 12 GHz\, and has been performed only at synchrotron sou rces. I will present a laboratory-scale instrument developed at NIST-Bould er that uses ultrafast\, extreme ultraviolet (EUV) light to perform XFMR s pectroscopy. It exhibits a timing jitter of lower than 1.2ps between the m icrowave excitation and the EUV pulses\, even at frequencies exceeding 60 GHz. We used this instrument to measure three samples on opaque Si substra tes: permalloy (8.5 GHz)\, a Co-Fe alloy (17 GHz)\, and a Ni/TaOx/Fe multi layer (8.5 GHz\, exhibiting element-specific dynamics). These measurements highlight the ability to perform high-frequency\, element- and/or layer-r esolved XFMR. The applicability to higher frequencies enables XFMR measure ments of materials with high magnetic anisotropy\, in addition to ferrimag nets\, antiferromagnets\, and high-wavevector spinwaves in nanodevices. In the future\, we will be able to utilize the coherence of the source and c ombine this capability with dynamic\, nanoscale\, lensless imaging techniq ues such as ptychography and holography\, and measure dynamics and transpo rt in active devices.\n\nCo-sponsored by: UCCS\n\nSpeaker(s): Michael Tank salvala\n\nRoom: A204\, Bldg: Osborne Center for Science and Engineering\, 1420 Austin Bluffs Pkwy\, Colorado Springs\, Colorado\, United States\, 8 0918\, Virtual: https://events.vtools.ieee.org/m/442800 LOCATION:Room: A204\, Bldg: Osborne Center for Science and Engineering\, 14 20 Austin Bluffs Pkwy\, Colorado Springs\, Colorado\, United States\, 8091 8\, Virtual: https://events.vtools.ieee.org/m/442800 ORGANIZER:eiacocca@uccs.edu SEQUENCE:6 SUMMARY:Tabletop\, High-Frequency\, Layer- and Element-Specific XFMR Spectr oscopy Detected with Extreme Ultraviolet Light URL;VALUE=URI:https://events.vtools.ieee.org/m/442800 X-ALT-DESC:Description: <br /><p class="MsoNormal" style="text-align: justi fy\;"><!-- [if gte vml 1]><v:shapetype\n id="_x0000_t75" coordsize="21600\ ,21600" o:spt="75" o:preferrelative="t"\n path="m@4@5l@4@11@9@11@9@5xe" fi lled="f" stroked="f">\n <v:stroke joinstyle="miter"/>\n <v:formulas>\n <v :f eqn="if lineDrawn pixelLineWidth 0"/>\n <v:f eqn="sum @0 1 0"/>\n <v: f eqn="sum 0 0 @1"/>\n <v:f eqn="prod @2 1 2"/>\n <v:f eqn="prod @3 2160 0 pixelWidth"/>\n <v:f eqn="prod @3 21600 pixelHeight"/>\n <v:f eqn="sum @0 0 1"/>\n <v:f eqn="prod @6 1 2"/>\n <v:f eqn="prod @7 21600 pixelWid th"/>\n <v:f eqn="sum @8 21600 0"/>\n <v:f eqn="prod @7 21600 pixelHeigh t"/>\n <v:f eqn="sum @10 21600 0"/>\n </v:formulas>\n <v:path o:extrusion ok="f" gradientshapeok="t" o:connecttype="rect"/>\n <o:lock v:ext="edit" a spectratio="t"/>\n</v:shapetype><v:shape id="Picture_x0020_1" o:spid="_x00 00_s1026" type="#_x0000_t75"\n style='position:absolute\;left:0\;text-alig n:left\;margin-left:0\;margin-top:.65pt\;\n width:121.4pt\;height:121.4pt\ ;z-index:2\;visibility:visible\;mso-wrap-style:square\;\n mso-height-perce nt:0\;mso-wrap-distance-left:9pt\;mso-wrap-distance-top:0\;\n mso-wrap-dis tance-right:9pt\;mso-wrap-distance-bottom:0\;\n mso-position-horizontal:le ft\;mso-position-horizontal-relative:margin\;\n mso-position-vertical:abso lute\;mso-position-vertical-relative:text\;\n mso-height-percent:0\;mso-he ight-relative:margin'>\n <v:imagedata src="file:///C:/Users/EZIOLA~1/AppDa ta/Local/Temp/msohtmlclip1/01/clip_image001.jpg"\n o:title=""/>\n <w:wrap type="tight" anchorx="margin"/>\n</v:shape><![endif]--><!-- [if !vml]-->< !--[endif]--></p>\n<p class="MsoNormal" style="text-align: justify\;"><!-- [if gte vml 1]><v:shapetype\n id="_x0000_t75" coordsize="21600\,21600" o: spt="75" o:preferrelative="t"\n path="m@4@5l@4@11@9@11@9@5xe" filled="f" s troked="f">\n <v:stroke joinstyle="miter"/>\n <v:formulas>\n <v:f eqn="if lineDrawn pixelLineWidth 0"/>\n <v:f eqn="sum @0 1 0"/>\n <v:f eqn="sum 0 0 @1"/>\n <v:f eqn="prod @2 1 2"/>\n <v:f eqn="prod @3 21600 pixelWid th"/>\n <v:f eqn="prod @3 21600 pixelHeight"/>\n <v:f eqn="sum @0 0 1"/> \n <v:f eqn="prod @6 1 2"/>\n <v:f eqn="prod @7 21600 pixelWidth"/>\n < v:f eqn="sum @8 21600 0"/>\n <v:f eqn="prod @7 21600 pixelHeight"/>\n <v :f eqn="sum @10 21600 0"/>\n </v:formulas>\n <v:path o:extrusionok="f" gra dientshapeok="t" o:connecttype="rect"/>\n <o:lock v:ext="edit" aspectratio ="t"/>\n</v:shapetype><v:shape id="Picture_x0020_1" o:spid="_x0000_s1026" type="#_x0000_t75"\n style='position:absolute\;left:0\;text-align:left\;ma rgin-left:0\;margin-top:.75pt\;\n width:100pt\;height:125pt\;z-index:-2516 57216\;visibility:visible\;\n mso-wrap-style:square\;mso-width-percent:0\; mso-height-percent:0\;\n mso-wrap-distance-left:9pt\;mso-wrap-distance-top :0\;mso-wrap-distance-right:9pt\;\n mso-wrap-distance-bottom:0\;mso-positi on-horizontal:left\;\n mso-position-horizontal-relative:margin\;mso-positi on-vertical:absolute\;\n mso-position-vertical-relative:text\;mso-width-pe rcent:0\;mso-height-percent:0\;\n mso-width-relative:page\;mso-height-rela tive:page'>\n <v:imagedata src="file:///C:/Users/EZIOLA~1/AppData/Local/Te mp/msohtmlclip1/01/clip_image001.jpg"\n o:title=""/>\n <w:wrap type="tigh t" anchorx="margin"/>\n</v:shape><![endif]--><!-- [if !vml]--><!--[endif]- -><span style="mso-bidi-font-family: Calibri\; mso-bidi-theme-font: minor- latin\; mso-no-proof: yes\;">X-ray detected ferromagnetic resonance (XFMR) spectroscopy provides a unique tool for measuring magnetic dynamics at an d across interfaces\, due to its ability to measure individually the ferro magnetic resonance of each element in a sample. Until now\, XFMR has gener ally been shown at frequencies below 12 GHz\, and has been performed only at synchrotron sources. I will present a laboratory-scale instrument devel oped at NIST-Boulder that uses ultrafast\, extreme ultraviolet (EUV) light to perform XFMR spectroscopy. It exhibits a timing jitter of lower than 1 .2ps between the microwave excitation and the EUV pulses\, even at frequen cies exceeding 60 GHz. We used this instrument to measure three samples on opaque Si substrates: permalloy (8.5 GHz)\, a Co-Fe alloy (17 GHz)\, and a Ni/TaOx/Fe multilayer (8.5 GHz\, exhibiting element-specific dynamics). These measurements highlight the ability to perform high-frequency\, eleme nt- and/or layer-resolved XFMR. The applicability to higher frequencies en ables XFMR measurements of materials with high magnetic anisotropy\, in ad dition to ferrimagnets\, antiferromagnets\, and high-wavevector spinwaves in nanodevices. In the future\, we will be able to utilize the coherence o f the source and combine this capability with dynamic\, nanoscale\, lensle ss imaging techniques such as ptychography and holography\, and measure dy namics and transport in active devices.</span></p> END:VEVENT END:VCALENDAR