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DESCRIPTION:Making sure your IC works when you buy it: Integrated Circuit T
 esting and the International Test Conference\n\nTesting integrated circuit
 s and systems for defects has never been trivial. Exhaustive testing is im
 possible\, and test economics require testing to be fast and effective. Th
 is talk will discuss some of the work that engineers have done over the ye
 ars to help minimize test escapes and reduce the odds that customers end u
 p with defective devices. It will then cover some of the issues at the cut
 ting edge of test today\, and why they get so much attention at the Intern
 ational Test Conference.\n\nSpeaker(s): Jennifer Dworak \n\nAgenda: \nWEBI
 NAR: 7:00 - 8:00 P.M.\n\nThe Zoom Webinar link and password will be forwar
 ded to all registered participants after Noon on the day of the meeting. C
 heck your spam folder if you don&#39;t see the email.\n\nWebinar is open to al
 l.\n\nPDH certificates are available and an evaluation form will be emaile
 d to you after the meeting. PDH certificate are sent by IEEE USA 3-4 weeks
  after the meeting.\n\nVirtual: https://events.vtools.ieee.org/m/453863
LOCATION:Virtual: https://events.vtools.ieee.org/m/453863
ORGANIZER:ieee@gpamg.org
SEQUENCE:29
SUMMARY:Making sure your IC works when you buy it: Integrated Circuit Testi
 ng and the International Test Conference
URL;VALUE=URI:https://events.vtools.ieee.org/m/453863
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;strong&gt;Making sure your IC works when you
  buy it: Integrated Circuit Testing and the International Test Conference&lt;
 /strong&gt;&lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot;&gt;Testing integrated circuits and systems
  for defects has never been trivial.&lt;span style=&quot;mso-spacerun: yes\;&quot;&gt;&amp;nbs
 p\; &lt;/span&gt;Exhaustive testing is impossible\, and test economics require t
 esting to be fast and effective.&lt;span style=&quot;mso-spacerun: yes\;&quot;&gt;&amp;nbsp\; 
 &lt;/span&gt;This talk will discuss some of the work that engineers have done ov
 er the years to help minimize test escapes and reduce the odds that custom
 ers end up with defective devices.&lt;span style=&quot;mso-spacerun: yes\;&quot;&gt;&amp;nbsp\
 ; &lt;/span&gt;It will then cover some of the issues at the cutting edge of test
  today\, and why they get so much attention at the International Test Conf
 erence.&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;&lt;strong&gt;WEBINAR:&lt;/strong&gt;&amp;nbsp\;7:
 00 - 8:00 P.M.&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;The Zoom Webinar link and password will be f
 orwarded to all registered participants after Noon on the day of the meeti
 ng. &lt;strong&gt;Check your spam folder if you don&#39;t see the email.&amp;nbsp\;&lt;/str
 ong&gt;&lt;/p&gt;\n&lt;p&gt;Webinar is open to all.&lt;/p&gt;\n&lt;p&gt;PDH certificates are availabl
 e and an evaluation form will be emailed to you after the meeting. PDH cer
 tificate are sent by IEEE USA 3-4 weeks after the meeting.&lt;/p&gt;
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