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DTSTART:20170312T030000
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BEGIN:VEVENT
DTSTAMP:20170524T221727Z
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DTSTART;TZID=America/Chicago:20170530T170000
DTEND;TZID=America/Chicago:20170530T200000
DESCRIPTION:Measurement system variability in a test laboratory can be a so
 urce of discomfort for the test engineer\, the designer and management. Th
 is is especially true in product development laboratories where the questi
 on of exactly what effect a design change had on system behavior is of cen
 tral interest. The use of Statistical Process Control (SPC) methods to gag
 e and track the variability of system measurements can provide confidence 
 in the repeatability of the system setup\, and in the data it produces.\n\
 nHowever\, the use of SPC in an EMC Lab\, especially for frequency domain 
 measurements\, requires decisions to limit the quantity of the data to avo
 id information overload. To accomplish this careful selection of the measu
 rement methods is essential.\n\nIn addition to the above topic\, a brief p
 resdnetation will be given on Life and Time Management - looking back on 7
 5 years of life\, and some suggestions on how to use time and planning to 
 achieve the goals you select and work toward.\n\nSpeaker(s): KIMBALL WILLI
 AMS\, \, KIMBALL WILLIAMS\, \, KIMBALL WILLIAMS\, \n\nAgenda: \n5:00 PM 
 – Registration and networking\, pizza and sodas/bottled water available\
 n\n5:45 PM – EMC-S Chapter business meeting (we have some important issu
 es to discuss)\n\n6:00 PM – Start of Presentation\n\nRoom: Large confere
 nce room\, Bldg: Marion Public Library\, 1095 6th Ave.\, Marion\, Iowa\, U
 nited States\, 52302-3428
LOCATION:Room: Large conference room\, Bldg: Marion Public Library\, 1095 6
 th Ave.\, Marion\, Iowa\, United States\, 52302-3428
ORGANIZER:e-n-asystems@earthlink.net
SEQUENCE:3
SUMMARY:Statistical Process Control for an EMC Laboratory + Meet the Chapte
 r Angel
URL;VALUE=URI:https://events.vtools.ieee.org/m/45496
X-ALT-DESC:Description: <br /><p>Measurement system variability in a test l
 aboratory can be a source of discomfort for the test engineer\, the design
 er and management.&nbsp\; This is especially true in product development l
 aboratories where the question of exactly what effect a design change had 
 on system behavior is of central interest.&nbsp\; The use of Statistical P
 rocess Control (SPC) methods to gage and track the variability of system m
 easurements can provide confidence in the repeatability of the system setu
 p\, and in the data it produces.&nbsp\;</p>\n<p>However\, the use of SPC i
 n an EMC Lab\, especially for frequency domain measurements\, requires dec
 isions to limit the quantity of the data to avoid information overload.&nb
 sp\; To accomplish this careful selection of the measurement methods is es
 sential.&nbsp\;</p>\n<p>In addition to the above topic\, a brief presdneta
 tion will be given on <strong>Life and Time Management - </strong>looking 
 back on 75 years of life\, and some suggestions on how to use time and pla
 nning to achieve the goals you select and work toward.&nbsp\;</p>\n<p>&nbs
 p\;</p><br /><br />Agenda: <br /><p><strong>5:00 PM</strong> &ndash\; Regi
 stration and networking\, pizza and sodas/bottled water available</p>\n<p>
 <strong>5:45 PM</strong> &ndash\; EMC-S Chapter business meeting (we have 
 some important issues to discuss)&nbsp\;</p>\n<p><strong>6:00 PM</strong> 
 &ndash\; Start of Presentation&nbsp\;</p>
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