BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:America/Chicago
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DTSTART:20250309T030000
TZOFFSETFROM:-0600
TZOFFSETTO:-0500
RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3
TZNAME:CDT
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BEGIN:STANDARD
DTSTART:20241103T010000
TZOFFSETFROM:-0500
TZOFFSETTO:-0600
RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11
TZNAME:CST
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20250202T191150Z
UID:03DAADB1-9ED4-43F7-9226-F408378CD57B
DTSTART;TZID=America/Chicago:20241121T110000
DTEND;TZID=America/Chicago:20241121T120000
DESCRIPTION:In this talk\, the speaker (David Tatman from Texas Instruments
 ) will explore functional safety\, covering its purpose\, lifecycle concep
 ts\, safety integrity requirements\, safety analysis techniques\, and comm
 only used methods used for hardware reliability and failure analysis in th
 e context of functional safety.\n\nRoom: Conference Room: N1\, South Campu
 s – Corporate HQ (Texas Instruments)\, 12500 TI Boulevard\, Dallas\, Tex
 as\, United States\, 75243
LOCATION:Room: Conference Room: N1\, South Campus – Corporate HQ (Texas I
 nstruments)\, 12500 TI Boulevard\, Dallas\, Texas\, United States\, 75243
ORGANIZER:ewong@utdallas.edu
SEQUENCE:14
SUMMARY:Technical Seminar: An Overview of Functional Safety
URL;VALUE=URI:https://events.vtools.ieee.org/m/466428
X-ALT-DESC:Description: <br /><p style="margin: 0in\;"><span style="font-si
 ze: 11.0pt\; font-family: 'Times New Roman'\,serif\; color: #0e101a\;">In 
 this talk\, the speaker (<span style="font-size: 11.0pt\; font-family: 'Ti
 mes New Roman'\,serif\; mso-fareast-font-family: DengXian\; mso-fareast-th
 eme-font: minor-fareast\; color: #0e101a\; mso-ansi-language: EN-US\; mso-
 fareast-language: ZH-CN\; mso-bidi-language: AR-SA\;">David Tatman from Te
 xas Instruments)</span> will explore functional safety\, covering its purp
 ose\, </span><span style="font-size: 11.0pt\; font-family: 'Times New Roma
 n'\,serif\; color: #0e101a\;">lifecycle concepts\, safety integrity requir
 ements\, safety analysis&nbsp\;</span><span style="font-size: 11.0pt\; fon
 t-family: 'Times New Roman'\,serif\; color: #0e101a\;">techniques\, and co
 mmonly used methods used for hardware reliability&nbsp\;</span><span style
 ="font-size: 11.0pt\; font-family: 'Times New Roman'\,serif\; color: #0e10
 1a\;">and failure analysis in the context of functional safety.</span></p>
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