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BEGIN:DAYLIGHT
DTSTART:20250309T030000
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DTSTART:20241103T010000
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DTSTAMP:20250415T005051Z
UID:3262BDEB-BB89-4050-A291-1EA90E0914F2
DTSTART;TZID=US/Eastern:20250218T130000
DTEND;TZID=US/Eastern:20250218T140000
DESCRIPTION:During this session\, we will illustrate the most rapid and eff
 ective methodologies for validating your RF components through the applica
 tion of real-world 5G and Wi-Fi scenarios. Participants can expect to stre
 amline their testing operations with the following benefits:\n\n- **Increa
 sed Speed**: Attain quicker product verification while maintaining accurac
 y.\n\n- **Cost Efficiency**: Decrease testing expenses through optimized w
 orkflows.\n\n- **Automation Excellence**: Take advantage of built-in autom
 ation and standard-compliant demodulation features to enhance throughput.\
 n\n- **Improved Correlation**: Maintain consistency across research and de
 velopment\, characterization\, and production setups\, thereby reducing de
 sign cycles and accelerating time-to-market.\n\nFurthermore\, we will exam
 ine advanced tools and insights\, including integrated sequencing and fast
  power servoing\, to foster next-level efficiency and precision in your wo
 rkflows.\n\nThis is an invaluable opportunity to transform your testing pr
 ocesses. We encourage you to reserve your place in this webinar to expedit
 e your RF component validation. The agenda will cover:\n\n- Challenges and
  best practices in RF component testing\n\n- The application of integrated
  sequencing\, fast power serving\, and integrated EVM measurements for cha
 racterization\n\n- Strategies to streamline test setups for characterizati
 on and production to optimize throughput.\n\nCo-sponsored by: IEEE North J
 ersey Section\n\nSpeaker(s): Markus Loerner\, Konstantin Bick\, \n\nVirtua
 l: https://events.vtools.ieee.org/m/468093
LOCATION:Virtual: https://events.vtools.ieee.org/m/468093
ORGANIZER:anisha_apte@ieee.org
SEQUENCE:34
SUMMARY:Improve Throughput in Characterization and Production
URL;VALUE=URI:https://events.vtools.ieee.org/m/468093
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;During this session\, we will illustrate t
 he most rapid and effective methodologies for validating your RF component
 s through the application of real-world 5G and Wi-Fi scenarios. Participan
 ts can expect to streamline their testing operations with the following be
 nefits:&lt;/p&gt;\n&lt;p&gt;- **Increased Speed**: Attain quicker product verification
  while maintaining accuracy.&lt;/p&gt;\n&lt;p&gt;- **Cost Efficiency**: Decrease testi
 ng expenses through optimized workflows.&lt;/p&gt;\n&lt;p&gt;- **Automation Excellence
 **: Take advantage of built-in automation and standard-compliant demodulat
 ion features to enhance throughput.&lt;/p&gt;\n&lt;p&gt;- **Improved Correlation**: Ma
 intain consistency across research and development\, characterization\, an
 d production setups\, thereby reducing design cycles and accelerating time
 -to-market.&lt;/p&gt;\n&lt;p&gt;Furthermore\, we will examine advanced tools and insig
 hts\, including integrated sequencing and fast power servoing\, to foster 
 next-level efficiency and precision in your workflows.&lt;/p&gt;\n&lt;p&gt;This is an 
 invaluable opportunity to transform your testing processes. We encourage y
 ou to reserve your place in this webinar to expedite your RF component val
 idation. The agenda will cover:&lt;/p&gt;\n&lt;p&gt;- Challenges and best practices in
  RF component testing&lt;/p&gt;\n&lt;p&gt;- The application of integrated sequencing\,
  fast power serving\, and integrated EVM measurements for characterization
 &lt;/p&gt;\n&lt;p&gt;- Strategies to streamline test setups for characterization and p
 roduction to optimize throughput.&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;
 &amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;
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