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DESCRIPTION:[]\n\nTitle: Introduction to Electromagnetic Compatibility at M
 issouri S&amp;T – Ensuring Products are Immune to Electrostatic Discharge\n\
 nAbstract: Electrostatic discharge (ESD) is a common cause of failures in 
 electronic products. Ensuring that ESD protection strategies adequately pr
 otect the device is challenging\, particularly in the early stages of the 
 design process. Methods of modeling the ESD protection to ensure adequate 
 protection will be presented in this talk\, with an emphasis on the modeli
 ng of the transient voltage suppressor (TVS). TVS are commonly a centerpie
 ce of ESD protection strategies. Examples of their use in system-level ESD
  simulations will be included. A brief introduction to the Electromagnetic
  Compatibility Laboratory at the Missouri University of Science and Techno
 logy will also be given.\n\nSpeaker(s): Daryl Beetner \n\nAgenda: \n12:00p
 m Welcome and Introduction to Guest Speaker\n12:05pm Lecture\n12:45pm Ques
 tions and Discussions\n\n(Eastern Standard Time)\n\nVirtual: https://event
 s.vtools.ieee.org/m/470965
LOCATION:Virtual: https://events.vtools.ieee.org/m/470965
ORGANIZER:kishma.meyers@gtri.gatech.edu
SEQUENCE:21
SUMMARY:Introduction to Electromagnetic Compatibility at Missouri S&amp;T - Ens
 uring Products are Immune to Electrostatic Discharge
URL;VALUE=URI:https://events.vtools.ieee.org/m/470965
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;img src=&quot;https://events.vtools.ieee.org/v
 tools_ui/media/display/6606ef56-cdba-4fc2-a0be-8a2874cabdb2&quot; alt=&quot;&quot; width=
 &quot;640&quot; height=&quot;360&quot;&gt;&lt;/p&gt;\n&lt;p&gt;&lt;span style=&quot;background-color: rgb(251\, 238\,
  184)\;&quot;&gt;&lt;strong&gt;Title:&lt;/strong&gt;&lt;/span&gt; Introduction to Electromagnetic Co
 mpatibility at Missouri S&amp;amp\;T &amp;ndash\; Ensuring Products are Immune to 
 Electrostatic Discharge&lt;/p&gt;\n&lt;p&gt;&lt;br&gt;&lt;span style=&quot;background-color: rgb(251
 \, 238\, 184)\;&quot;&gt;&lt;strong&gt;Abstract:&lt;/strong&gt;&lt;/span&gt; Electrostatic discharge
  (ESD) is a common cause of failures in electronic products. Ensuring that
  ESD protection strategies adequately protect the device is challenging\, 
 particularly in the early stages of the design process. Methods of modelin
 g the ESD protection to ensure adequate protection will be presented in th
 is talk\, with an emphasis on the modeling of the transient voltage suppre
 ssor (TVS). TVS are commonly a centerpiece of ESD protection strategies. E
 xamples of their use in system-level ESD simulations will be included. A b
 rief introduction to the Electromagnetic Compatibility Laboratory at the M
 issouri University of Science and Technology will also be given.&amp;nbsp\;&lt;/p
 &gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;12:00pm Welcome and Introduction to Guest Sp
 eaker&lt;br&gt;12:05pm Lecture&lt;br&gt;12:45pm Questions and Discussions&lt;/p&gt;\n&lt;p&gt;(Eas
 tern Standard Time)&lt;/p&gt;
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