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DTSTAMP:20250525T140950Z
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DTSTART;TZID=America/New_York:20250331T140000
DTEND;TZID=America/New_York:20250331T151500
DESCRIPTION:Webinar Description:\n\nJoin us for an insightful webinar focus
 ed on the critical topic of de-embedding in high-frequency and high-speed 
 digital designs. As the demand for faster and more reliable electronic dev
 ices continues to grow\, understanding de-embedding techniques has become 
 essential for engineers and designers working in the fields of RF\, microw
 ave\, and digital signal integrity.\n\nWhat You Will Learn:\n\n- The funda
 mentals of VNA measurements\n- What S-parameters are and how they are used
  to measure network\n\n· The importance of calibration in network analyze
 r measurements\n\n- Fundamentals of De-Embedding\n- Test fixture performan
 ce criteria\n- Demo of De-embedding with R&amp;S ZNA\n\nWho Should Attend:\n\n
 This webinar is ideal for engineers\, designers\, and technicians involved
  in RF\, microwave\, and high-speed digital circuit design and testing. Wh
 ether you are a seasoned professional or new to the field\, this session w
 ill provide valuable insights to enhance your understanding and skills.\n\
 nSpeaker(s): Mahwash Arjumand\, \n\nVirtual: https://events.vtools.ieee.or
 g/m/474480
LOCATION:Virtual: https://events.vtools.ieee.org/m/474480
ORGANIZER:aabdella@ieee.org
SEQUENCE:28
SUMMARY:VNA Measurements and De-embedding for High Speed and RF Application
 s
URL;VALUE=URI:https://events.vtools.ieee.org/m/474480
X-ALT-DESC:Description: &lt;br /&gt;&lt;p class=&quot;MsoNormal&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-U
 S&quot;&gt;&lt;img style=&quot;display: block\; margin-left: auto\; margin-right: auto\;&quot; 
 src=&quot;https://events.vtools.ieee.org/vtools_ui/media/display/8144aa10-399b-
 470e-bec8-f77a3e80b181&quot; width=&quot;684&quot; height=&quot;384&quot;&gt;&lt;/span&gt;&lt;/strong&gt;&lt;/p&gt;\n&lt;p 
 class=&quot;MsoNormal&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot;&gt;Webinar Description:&lt;/span&gt;&lt;/
 strong&gt;&lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;Join us for an insigh
 tful webinar focused on the critical topic of de-embedding in high-frequen
 cy and high-speed digital designs. As the demand for faster and more relia
 ble electronic devices continues to grow\, understanding de-embedding tech
 niques has become essential for engineers and designers working in the fie
 lds of RF\, microwave\, and digital signal integrity.&lt;/span&gt;&lt;/p&gt;\n&lt;p class
 =&quot;MsoNormal&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot;&gt;What You Will Learn:&lt;/span&gt;&lt;/stron
 g&gt;&lt;/p&gt;\n&lt;ul style=&quot;margin-top: 0cm\;&quot; type=&quot;disc&quot;&gt;\n&lt;li class=&quot;MsoNormal&quot; 
 style=&quot;mso-list: l2 level1 lfo4\; tab-stops: list 36.0pt\;&quot;&gt;&lt;strong&gt;&lt;span 
 lang=&quot;EN-US&quot;&gt;The fundamentals of VNA measurements&lt;/span&gt;&lt;/strong&gt;&lt;/li&gt;\n&lt;l
 i class=&quot;MsoNormal&quot; style=&quot;mso-list: l2 level1 lfo4\; tab-stops: list 36.0
 pt\;&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot;&gt;What S-parameters are and how they are us
 ed to measure network&lt;/span&gt;&lt;/strong&gt;&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p class=&quot;MsoListParagr
 aph&quot; style=&quot;margin-left: 36.0pt\; text-indent: -18.0pt\; mso-list: l2 leve
 l1 lfo4\; tab-stops: list 36.0pt\;&quot;&gt;&lt;!-- [if !supportLists]--&gt;&lt;span lang=&quot;
 EN-US&quot; style=&quot;font-family: Symbol\; mso-fareast-font-family: Symbol\; mso-
 bidi-font-family: Symbol\; mso-bidi-font-weight: bold\;&quot;&gt;&lt;span style=&quot;mso-
 list: Ignore\;&quot;&gt;&amp;middot\;&lt;span style=&quot;font: 7.0pt &#39;Times New Roman&#39;\;&quot;&gt;&amp;nb
 sp\;&amp;nbsp\;&amp;nbsp\;&amp;nbsp\;&amp;nbsp\;&amp;nbsp\; &lt;/span&gt;&lt;/span&gt;&lt;/span&gt;&lt;!--[endif]--
 &gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot;&gt;The importance of calibration in network analy
 zer measurements&lt;/span&gt;&lt;/strong&gt;&lt;/p&gt;\n&lt;ul style=&quot;margin-top: 0cm\;&quot; type=&quot;
 disc&quot;&gt;\n&lt;li class=&quot;MsoNormal&quot; style=&quot;mso-list: l3 level1 lfo3\; tab-stops:
  list 36.0pt\;&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot;&gt;Fundamentals of De-Embedding&lt;/s
 pan&gt;&lt;/strong&gt;&lt;/li&gt;\n&lt;li class=&quot;MsoNormal&quot; style=&quot;mso-list: l3 level1 lfo3\
 ; tab-stops: list 36.0pt\;&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot;&gt;Test fixture perfor
 mance criteria&lt;/span&gt;&lt;/strong&gt;&lt;/li&gt;\n&lt;li class=&quot;MsoNormal&quot; style=&quot;mso-list
 : l3 level1 lfo3\; tab-stops: list 36.0pt\;&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot;&gt;De
 mo of De-embedding with R&amp;amp\;S ZNA&lt;/span&gt;&lt;/strong&gt;&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p class
 =&quot;MsoNormal&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot;&gt;Who Should Attend:&lt;/span&gt;&lt;/strong&gt;
 &lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;This webinar is ideal for en
 gineers\, designers\, and technicians involved in RF\, microwave\, and hig
 h-speed digital circuit design and testing. Whether you are a seasoned pro
 fessional or new to the field\, this session will provide valuable insight
 s to enhance your understanding and skills.&lt;/span&gt;&lt;/p&gt;
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