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VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
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TZID:Europe/Prague
BEGIN:DAYLIGHT
DTSTART:20240331T030000
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TZOFFSETTO:+0200
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TZNAME:CEST
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DTSTART:20241027T020000
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DTSTAMP:20250321T094611Z
UID:D9EB86EE-04BE-445B-8364-B7B46AC69872
DTSTART;TZID=Europe/Prague:20240903T140000
DTEND;TZID=Europe/Prague:20240903T150000
DESCRIPTION:The impact of stack artefacts on gated CT imaging and strategie
 s for improvement\n\nPrague\, Czech Republic\, Czech Republic
LOCATION:Prague\, Czech Republic\, Czech Republic
ORGANIZER:andre.sopczak@cern.ch
SEQUENCE:2
SUMMARY:The impact of stack artefacts on gated CT imaging and strategies fo
 r improvement
URL;VALUE=URI:https://events.vtools.ieee.org/m/476970
X-ALT-DESC:Description: &lt;br /&gt;&lt;h2&gt;The impact of stack artefacts on gated CT
  imaging and strategies for improvement&lt;/h2&gt;
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