BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:Europe/Berlin BEGIN:DAYLIGHT DTSTART:20250330T030000 TZOFFSETFROM:+0100 TZOFFSETTO:+0200 RRULE:FREQ=YEARLY;BYDAY=-1SU;BYMONTH=3 TZNAME:CEST END:DAYLIGHT BEGIN:STANDARD DTSTART:20251026T020000 TZOFFSETFROM:+0200 TZOFFSETTO:+0100 RRULE:FREQ=YEARLY;BYDAY=-1SU;BYMONTH=10 TZNAME:CET END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20250416T161442Z UID:00D3EE11-A766-4C7D-A1E0-96BABE6EBA09 DTSTART;TZID=Europe/Berlin:20250416T170000 DTEND;TZID=Europe/Berlin:20250416T180000 DESCRIPTION:Using the FFT-based measurement systems for EMI testing can red uce test time\, improve the repeatability of EMI tests. With the availabil ity of high speed high resolution ADCs and large computation power today F FT-based measurement systems exceed the performance of traditional EMI rec eivers\, regarding noise floor\, measurement speed and accuracy. Today a r eal-time analysis bandwidth up to 1000 MHz for Quasi-Peak in full complian ce mode is available\, reducing the test time from 9 hours down to 1 secon d. Such a Technology can be used to speed up full compliance testing. Usin g correlation analysis of such patterns allows identifying radiation direc tion of individual sources and the effect of EMI measures that have applie d. EMC debugging on a complete system can be carried out based on the iden tification of sources. Another topic is the EMI measurement in presence of ambient noise. During the presentation a dual channel FFT-based EMI measu rement system is presented. While the first antenna receives the signal of the EUT and the ambient noise\, the second antenna only receives the ambi ent noise. By using a wideband LMS filter algorithm it is possible to canc el the ambient noise and show the EMI of the EUT. Measurement results show that typical ambient noise signals can be suppressed and even modulated s ignals of an EUT that are masked by ambient noise can be recovered. The sy stem can cancel ambient noise with a bandwidth of more than 100 MHz. Durin g the presentation the possibility for full compliance testing and the lim itations of such a system are discussed.\n\nSpeaker(s): Dr. Stephan Maximi lian Braun\n\nVirtual: https://events.vtools.ieee.org/m/478119 LOCATION:Virtual: https://events.vtools.ieee.org/m/478119 ORGANIZER:sebastian.koj@ieee.org SEQUENCE:18 SUMMARY:EMC Professional Talk: Correlation Measurements Methods and Practic al Applications for EMI Testing URL;VALUE=URI:https://events.vtools.ieee.org/m/478119 X-ALT-DESC:Description: <br /><p>Using the FFT-based measurement systems fo r EMI testing can reduce test time\, improve the repeatability of EMI test s. With the availability of high speed high resolution ADCs and large comp utation power today FFT-based measurement systems exceed the performance o f traditional EMI receivers\, regarding noise floor\, measurement speed an d accuracy. Today a real-time analysis bandwidth up to 1000 MHz for Quasi- Peak in full compliance mode is available\, reducing the test time from 9 hours down to 1 second. Such a Technology can be used to speed up full com pliance testing. Using correlation analysis of such patterns allows identi fying radiation direction of individual sources and the effect of EMI meas ures that have applied. EMC debugging on a complete system can be carried out based on the identification of sources. Another topic is the EMI measu rement in presence of ambient noise. During the presentation a dual channe l FFT-based EMI measurement system is presented. While the first antenna r eceives the signal of the EUT and the ambient noise\, the second antenna o nly receives the ambient noise. By using a wideband LMS filter algorithm i t is possible to cancel the ambient noise and show the EMI of the EUT. Mea surement results show that typical ambient noise signals can be suppressed and even modulated signals of an EUT that are masked by ambient noise can be recovered. The system can cancel ambient noise with a bandwidth of mor e than 100 MHz. During the presentation the possibility for full complianc e testing and the limitations of such a system are discussed.</p> END:VEVENT END:VCALENDAR