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DTSTART:20251102T010000
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DTSTAMP:20260114T010535Z
UID:EFEC833E-6B11-4705-AF0D-DD525B66A8F6
DTSTART;TZID=America/New_York:20250603T120000
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DESCRIPTION:Trends in modern wireless communications\, including the use of
  massive MIMO and millimeter wave frequencies\, have supported an increase
 d deployment of electrically large antennas. This created technical and ec
 onomic challenges as many EMC or regulatory tests require a far-field cond
 ition. This talk provides an overview of the recent findings in defining t
 he shortest possible far-field test distance\, depending on the size of th
 e device under test\, its operation frequency\, the target metric and the 
 upper bound acceptable measurement deviation. Practical ways are also desc
 ribed to determine the maximum antenna aperture size that can be tested in
  the far-field at a given frequency and for a maximum error\, in an existi
 ng chamber with a defined range length.\n\nThis seminar is supported by [A
 P-S Wireless Communications Technical Committee](https://www.ieeeaps.org/c
 ommittees/tc/tc8).\n\nSpeaker(s): Dr. Benoit Derat\, \n\nBldg: HUB 350\, 3
 50 Legget Dr.\, Kanata\, Ontario\, Canada
LOCATION:Bldg: HUB 350\, 350 Legget Dr.\, Kanata\, Ontario\, Canada
ORGANIZER:aabdella@ieee.org
SEQUENCE:32
SUMMARY:How Close Can Far-Field Be? Getting the Best Out of Your Measuremen
 t Range
URL;VALUE=URI:https://events.vtools.ieee.org/m/483707
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;img style=&quot;display: block\; margin-left: 
 auto\; margin-right: auto\;&quot; src=&quot;https://events.vtools.ieee.org/vtools_ui
 /media/display/e65feb24-d5eb-44e1-8345-1f0300ce15ca&quot; width=&quot;774&quot; height=&quot;4
 33&quot;&gt;&lt;/p&gt;\n&lt;p&gt;Trends in modern wireless communications\, including the use 
 of massive MIMO and millimeter wave frequencies\, have supported an increa
 sed deployment of electrically large antennas. This created technical and 
 economic challenges as many EMC or regulatory tests require a far-field co
 ndition. This talk provides an overview of the recent findings in defining
  the shortest possible far-field test distance\, depending on the size of 
 the device under test\, its operation frequency\, the target metric and th
 e upper bound acceptable measurement deviation. Practical ways are also de
 scribed to determine the maximum antenna aperture size that can be tested 
 in the far-field at a given frequency and for a maximum error\, in an exis
 ting chamber with a defined range length.&lt;/p&gt;\n&lt;p&gt;&lt;em&gt;This seminar is supp
 orted by&amp;nbsp\;&lt;a href=&quot;https://www.ieeeaps.org/committees/tc/tc8&quot;&gt;AP-S Wi
 reless Communications Technical Committee&lt;/a&gt;.&lt;/em&gt;&lt;/p&gt;
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