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PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
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TZID:Europe/Paris
BEGIN:DAYLIGHT
DTSTART:20250330T030000
TZOFFSETFROM:+0100
TZOFFSETTO:+0200
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TZNAME:CEST
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DTSTART:20251026T020000
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BEGIN:VEVENT
DTSTAMP:20250825T144053Z
UID:E9214C3A-DBF5-4848-A274-5369A4410B11
DTSTART;TZID=Europe/Paris:20250427T090000
DTEND;TZID=Europe/Paris:20250427T193700
DESCRIPTION:The Hello World 5.0 event\, dedicated to problem solving\, was 
 a great success\, gathering over 120 participants\, including students\, m
 embers of the scientific community\, and industry professionals. Organized
  by IEEE Computer Society ENIS Student Branch Chapter\, in collaboration w
 ith several partners\, the event was held in a spirit of innovation and te
 amwork. It provided attendees with the opportunity to tackle technical cha
 llenges\, sharpen their critical thinking\, and strengthen their problem-s
 olving skills in a dynamic and engaging environment.\n\n[][][][][]\n\nSpea
 ker(s): Kadhem Belghith\, \n\nBldg: Centre de recherche en numérique de S
 fax\, Cité el Ons\, Sfax\, Sfax\, Tunisia\, 3000
LOCATION:Bldg: Centre de recherche en numérique de Sfax\, Cité el Ons\, S
 fax\, Sfax\, Tunisia\, 3000
ORGANIZER:maissamakni@ieee.org
SEQUENCE:42
SUMMARY:Hello World 5.0 – A Successful Problem Solving Experience
URL;VALUE=URI:https://events.vtools.ieee.org/m/486766
X-ALT-DESC:Description: &lt;br /&gt;&lt;p data-start=&quot;238&quot; data-end=&quot;812&quot;&gt;The &lt;em da
 ta-start=&quot;261&quot; data-end=&quot;278&quot;&gt;Hello World 5.0&lt;/em&gt; event\, dedicated to pr
 oblem solving\, was a great success\, gathering over 120 participants\, in
 cluding students\, members of the scientific community\, and industry prof
 essionals. Organized by&amp;nbsp\;&lt;strong data-start=&quot;468&quot; data-end=&quot;521&quot;&gt;IEEE
  Computer Society ENIS Student Branch Chapter&lt;/strong&gt;\, in collaboration 
 with several partners\, the event was held in a spirit of innovation and t
 eamwork. It provided attendees with the opportunity to tackle technical ch
 allenges\, sharpen their critical thinking\, and strengthen their problem-
 solving skills in a dynamic and engaging environment.&lt;/p&gt;\n&lt;p data-start=&quot;
 238&quot; data-end=&quot;812&quot;&gt;&lt;img src=&quot;https://events.vtools.ieee.org/vtools_ui/med
 ia/display/9ce13c73-d45c-4238-9030-a0d5c7dd2b56&quot; alt=&quot;&quot; width=&quot;200&quot; height
 =&quot;196&quot;&gt;&lt;img src=&quot;https://events.vtools.ieee.org/vtools_ui/media/display/d1
 2cda25-f62c-4da3-822d-c066717fb6d7&quot; alt=&quot;&quot; width=&quot;200&quot; height=&quot;198&quot;&gt;&lt;img s
 rc=&quot;https://events.vtools.ieee.org/vtools_ui/media/display/c14db6f1-a62f-4
 0f1-a1a3-4f620262dbd1&quot; alt=&quot;&quot; width=&quot;200&quot; height=&quot;201&quot;&gt;&lt;img src=&quot;https://e
 vents.vtools.ieee.org/vtools_ui/media/display/d16998ef-ed2d-4e68-9e78-617c
 2f7b31ee&quot; alt=&quot;&quot; width=&quot;200&quot; height=&quot;199&quot;&gt;&lt;img src=&quot;https://events.vtools.
 ieee.org/vtools_ui/media/display/ee7a6d99-9154-4673-b72a-878c2e42dc9a&quot; alt
 =&quot;&quot; width=&quot;200&quot; height=&quot;199&quot;&gt;&lt;/p&gt;
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