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DTSTAMP:20250724T130747Z
UID:CC6758CB-32CB-48DF-9CB8-0C55FEAFAB4B
DTSTART;TZID=America/New_York:20250721T120000
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DESCRIPTION:The number of power electronics converters connected to electri
 cal networks has been growing exponentially as they are part of all new ge
 neration connected to the grid. While the rapid control and fast electroni
 c switching available with this technology offer flexibility in network op
 eration\, the dynamic interactions between several of them threaten the op
 erational stability of the transmission grid is a concern. It is required 
 to develop a methodology for identifying the risks associated with the sta
 bility and control interaction before a new power electronic device (e.g. 
 Windfarm\, interconnector\, STATCOM) is introduced to the network. The tal
 k will focus on an analytical framework in impedance domain to quantify th
 e interaction between the new plant and the rest of the network for settin
 g additional grid connection study specifications which will include detai
 l technical study to check and mitigate the risks associated with new powe
 r electronics interfaced generation. The framework developed is to support
  MMC technology\, control delay\, system strength and FRT capability of dy
 namic voltage support devices and windfarm through technical case study co
 nducted at the research group of Bikash Pal at Imperial College London. Fu
 ture research challenges and opportunities will be highlighted.\n\nSpeaker
 (s): Bikash Pal\, \n\nVirtual: https://events.vtools.ieee.org/m/487106
LOCATION:Virtual: https://events.vtools.ieee.org/m/487106
ORGANIZER:junbo@uconn.edu
SEQUENCE:10
SUMMARY:Stability Modelling and Analysis of Converter Driven Power System
URL;VALUE=URI:https://events.vtools.ieee.org/m/487106
X-ALT-DESC:Description: <br /><p class="MsoNormal" style="margin-bottom: 0i
 n\; text-align: justify\; line-height: normal\;"><span lang="EN-GB" style=
 "font-family: 'Arial'\,sans-serif\; color: black\;">The number of power el
 ectronics converters connected to electrical networks has been growing exp
 onentially as they are part of all new generation connected to the grid. W
 hile the rapid control and fast electronic switching available with this t
 echnology offer flexibility in network operation\, the dynamic interaction
 s between several of them threaten the operational stability of the transm
 ission grid is a concern. It is required to develop a methodology for iden
 tifying the risks associated with the stability and control interaction be
 fore a new power electronic device (e.g. Windfarm\, interconnector\, STATC
 OM) is introduced to the network. </span><span lang="EN-GB" style="font-si
 ze: 11.0pt\; line-height: 115%\; font-family: 'Arial'\,sans-serif\; mso-fa
 reast-font-family: Calibri\; color: black\; mso-ansi-language: EN-GB\; mso
 -fareast-language: EN-US\; mso-bidi-language: AR-SA\;">The talk will focus
  on an analytical framework in impedance domain to quantify the interactio
 n between the new plant and the rest of the network for setting additional
  grid connection study specifications which will include detail technical 
 study to check and mitigate the risks associated with new power electronic
 s interfaced generation. The framework developed is to support MMC technol
 ogy\, control delay\, system strength and FRT capability of dynamic voltag
 e support devices and windfarm through technical case study conducted at t
 he research group of Bikash Pal at Imperial College London. Future researc
 h challenges and opportunities will be highlighted.</span></p>
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