BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:Europe/Bucharest
BEGIN:DAYLIGHT
DTSTART:20250330T040000
TZOFFSETFROM:+0200
TZOFFSETTO:+0300
RRULE:FREQ=YEARLY;BYDAY=-1SU;BYMONTH=3
TZNAME:EEST
END:DAYLIGHT
BEGIN:STANDARD
DTSTART:20251026T030000
TZOFFSETFROM:+0300
TZOFFSETTO:+0200
RRULE:FREQ=YEARLY;BYDAY=-1SU;BYMONTH=10
TZNAME:EET
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20250529T101035Z
UID:76174FB6-F6B4-422B-8F46-F2CEE68BD4C9
DTSTART;TZID=Europe/Bucharest:20250528T103000
DTEND;TZID=Europe/Bucharest:20250528T180000
DESCRIPTION:IEEE EMC Society in Region 8\, Krzysztof Sieczkarek\, IEEE EMC-
 S BoG\, Region 8 Coordinator\, Poland Chapter Chair\, Poland\n\nTechnical 
 Tour of E-INFRA EMC Laboratory\n\nThe Opportunity of Electromagnetic Compa
 tibility Analyses in Strategic Projects with Regional Impact\, Gianina Pel
 ea\, E-INFRA\, Romania\nThe News from EMC Measurements\, Lukasz Wilk\, ALB
 ATROSS PROJECTS\, Germany\nLatest Developments in the EMC Test and Measure
 ments\, Balasz Nagy\, ROHDE &amp; SCHWARZ\, Hungary\nSimulation of Conducted E
 missions Using CST Studio Suite\, Radu Voina\, KEYTEK INNOVATION\, Romania
 \nYour All-in-One Solution for T&amp;M and EMC Challenges\, Andrei Serbanescu\
 , ROMTEK ELECTRONICS\, Romania\nTest Solutions for E-Vehicles and Chargers
 \, Mihai Mitarca\, AMETEK CTS\, Germany\nPractical Use of Near Field Scann
 ing to Troubleshoot Electromagnetic Interference of Devices\, Krzysztof Ma
 zur\, PENDULUM INSTRUMENTS\, Poland\n\nCo-sponsored by: E-INFRA\, Technica
 l University of Cluj-Napoca\n\nAgenda: \n10:00- 10:30 Welcome of participa
 nts\n10:30- 11:30 OFFICIAL CEREMONY\nProf. Vasile Topa Rector of TUCN\, He
 ad of NUMELEC Research Center\nDr. Teofil Muresan Founder and CEO E-INFRA\
 nDr. Andrei Marinescu Founder of ACER\, Co-Founder of IEEE EMC-S RO Chapte
 r\nDr. Krzysztof Sieczkarek IEEE EMC-S Board of Governors and Region 8 Coo
 rdinator\nProf. Calin Munteanu Head of EMC E-INFRA Lab\, Chair of IEEE EMC
 -S RO Chapter\n11:30- 12:00 Coffee break\n\nTUCN\, 71-73 Dorobantilor str\
 , Cluj- Napoca\n13:00- 14:00 VISIT of the EMC E-INFRA LABORATORY\n14:00- 1
 4:30 Cocktail\n14:30- 17:00 EMC LATEST TECHNOLOGY PRESENTATIONS\n14:30 - 1
 4:50 The Opportunity of Electromagnetic Compatibility Analyses in Strategi
 c Projects with Regional Impact\, Gianina Pelea\, E-INFRA\, Romania\n14:50
  - 15:10 The News from EMC Measurements\, Lukasz Wilk\, ALBATROSS PROJECTS
 \, Germany\n15:10 - 15:30 Latest Developments in the EMC Test and Measurem
 ents\, Balasz Nagy\, ROHDE &amp; SCHWARZ\, Hungary\n15:30 - 15:40 Coffee Break
 \n15:40 - 16:00 Simulation of Conducted Emissions Using CST Studio Suite\,
  Radu Voina\, KEYTEK INNOVATION\, Romania\n16:00 - 16:20 Your All-in-One S
 olution for T&amp;M and EMC Challenges\, Andrei Serbanescu\, ROMTEK ELECTRONIC
 S\, Romania\n16:20 - 16:40 Test Solutions for E-Vehicles and Chargers\, Mi
 hai Mitarca\, AMETEK CTS\, Germany\n16:40 - 17:00 Practical Use of Near Fi
 eld Scanning to Troubleshoot Electromagnetic Interference of Devices\, Krz
 ysztof Mazur\, PENDULUM INSTRUMENTS\, Poland\n\n Technical University of C
 luj-Napoca\, Cluj-Napoca\, Cluj\, Romania\, 407714
LOCATION: Technical University of Cluj-Napoca\, Cluj-Napoca\, Cluj\, Romani
 a\, 407714
ORGANIZER:Calin.Munteanu@ethm.utcluj.ro
SEQUENCE:31
SUMMARY:IEEE EMC-S RO no 1/2025 &quot;Inauguration E-INFRA EMC Cluj-Napoca Labor
 atory and Technical Lectures&quot;
URL;VALUE=URI:https://events.vtools.ieee.org/m/487152
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;IEEE EMC Society in Region 8\, Krzysztof S
 ieczkarek\, IEEE EMC-S BoG\, Region 8 Coordinator\, Poland Chapter Chair\,
  Poland&lt;/p&gt;\n&lt;p&gt;Technical Tour of E-INFRA EMC Laboratory&lt;/p&gt;\n&lt;p&gt;The Oppor
 tunity of Electromagnetic Compatibility Analyses in Strategic Projects wit
 h Regional Impact\, Gianina Pelea\, E-INFRA\, Romania&lt;br&gt;The News from EMC
  Measurements\, Lukasz Wilk\, ALBATROSS PROJECTS\, Germany&lt;br&gt;Latest Devel
 opments in the EMC Test and Measurements\, Balasz Nagy\, ROHDE &amp;amp\; SCHW
 ARZ\, Hungary&lt;br&gt;Simulation of Conducted Emissions Using CST Studio Suite\
 , Radu Voina\, KEYTEK INNOVATION\, Romania&lt;br&gt;Your All-in-One Solution for
  T&amp;amp\;M and EMC Challenges\, Andrei Serbanescu\, ROMTEK ELECTRONICS\, Ro
 mania&lt;br&gt;Test Solutions for E-Vehicles and Chargers\, Mihai Mitarca\, AMET
 EK CTS\, Germany&amp;nbsp\;&lt;br&gt;Practical Use of Near Field Scanning to Trouble
 shoot Electromagnetic Interference of Devices\, Krzysztof Mazur\, PENDULUM
  INSTRUMENTS\, Poland&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;div&gt;10:00- 10:30 Welco
 me of participants&lt;/div&gt;\n&lt;div&gt;10:30- 11:30 OFFICIAL CEREMONY&lt;/div&gt;\n&lt;div&gt;
 Prof. Vasile Topa&amp;nbsp\; Rector of TUCN\, Head of NUMELEC Research Center&lt;
 /div&gt;\n&lt;div&gt;Dr. Teofil Muresan&amp;nbsp\; Founder and CEO E-INFRA&lt;/div&gt;\n&lt;div&gt;
 Dr. Andrei Marinescu&amp;nbsp\; Founder of ACER\, Co-Founder of IEEE EMC-S RO 
 Chapter&lt;/div&gt;\n&lt;div&gt;Dr. Krzysztof Sieczkarek&amp;nbsp\; IEEE EMC-S Board of Go
 vernors and Region 8 Coordinator&lt;/div&gt;\n&lt;div&gt;Prof. Calin Munteanu&amp;nbsp\; H
 ead of EMC E-INFRA Lab\, Chair of IEEE EMC-S RO Chapter&lt;/div&gt;\n&lt;div&gt;11:30-
  12:00 Coffee break&lt;/div&gt;\n&lt;div&gt;&amp;nbsp\;&lt;/div&gt;\n&lt;div&gt;TUCN\, 71-73 Dorobanti
 lor str\, Cluj- Napoca&lt;/div&gt;\n&lt;div&gt;13:00- 14:00 VISIT of the EMC E-INFRA L
 ABORATORY&lt;/div&gt;\n&lt;div&gt;14:00- 14:30 Cocktail&lt;/div&gt;\n&lt;div&gt;14:30- 17:00 EMC L
 ATEST TECHNOLOGY PRESENTATIONS&lt;/div&gt;\n&lt;div&gt;14:30 - 14:50 The Opportunity o
 f Electromagnetic Compatibility Analyses in Strategic Projects with Region
 al Impact\, Gianina Pelea\, E-INFRA\, Romania&lt;/div&gt;\n&lt;div&gt;14:50 - 15:10 Th
 e News from EMC Measurements\, Lukasz Wilk\, ALBATROSS PROJECTS\, Germany&lt;
 /div&gt;\n&lt;div&gt;15:10 - 15:30 Latest Developments in the EMC Test and Measurem
 ents\, Balasz Nagy\, ROHDE &amp;amp\; SCHWARZ\, Hungary&lt;/div&gt;\n&lt;div&gt;15:30 - 15
 :40 Coffee Break&amp;nbsp\;&lt;/div&gt;\n&lt;div&gt;15:40 - 16:00 Simulation of Conducted 
 Emissions Using CST Studio Suite\, Radu Voina\, KEYTEK INNOVATION\, Romani
 a&lt;/div&gt;\n&lt;div&gt;16:00 - 16:20 Your All-in-One Solution for T&amp;amp\;M and EMC 
 Challenges\, Andrei Serbanescu\, ROMTEK ELECTRONICS\, Romania&lt;/div&gt;\n&lt;div&gt;
 16:20 - 16:40 Test Solutions for E-Vehicles and Chargers\, Mihai Mitarca\,
  AMETEK CTS\, Germany&amp;nbsp\;&lt;/div&gt;\n&lt;div&gt;16:40 - 17:00 Practical Use of Ne
 ar Field Scanning to Troubleshoot Electromagnetic Interference of Devices\
 , Krzysztof Mazur\, PENDULUM INSTRUMENTS\, Poland&lt;/div&gt;\n&lt;div&gt;&amp;nbsp\;&lt;/div
 &gt;
END:VEVENT
END:VCALENDAR

