BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:Europe/Rome
BEGIN:DAYLIGHT
DTSTART:20250330T030000
TZOFFSETFROM:+0100
TZOFFSETTO:+0200
RRULE:FREQ=YEARLY;BYDAY=-1SU;BYMONTH=3
TZNAME:CEST
END:DAYLIGHT
BEGIN:STANDARD
DTSTART:20251026T020000
TZOFFSETFROM:+0200
TZOFFSETTO:+0100
RRULE:FREQ=YEARLY;BYDAY=-1SU;BYMONTH=10
TZNAME:CET
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20250618T165804Z
UID:BD88C006-1E84-4D70-9654-8F7908CE09C6
DTSTART;TZID=Europe/Rome:20250618T143000
DTEND;TZID=Europe/Rome:20250618T170000
DESCRIPTION:The automotive industry[] has been progressing at a rapid pace 
 with the development of electric propulsion and advanced driver assistance
  systems\, thus facing new challenges related to Electromagnetic Compatibi
 lity (EMC). This technical meeting will cover the most modern trends in Au
 tomotive EMC measurements and modeling. Namely\, the latest developments i
 n test chambers for radiated emissions and immunity\, as well as novel met
 hodologies for conducted emission measurement and electromagnetic-interfer
 ence filter design will be reviewed by two leading international experts. 
 Recent trends in EMC modeling techniques will be presented by researchers 
 working in the Italian academia. Finally\, the meeting will end with a vis
 it to the EMC laboratory (EMCLAB) at the Department of Electronics\, Infor
 mation and Bioengineering (DEIB) of Politecnico di Milano.\n\nVenue\n\nPol
 itecnico di Milano\, Campus Leonardo (Piazza Leonardo da Vinci 32\, Milano
 )\, Edificio 5\, Aula Beltrami\n\n[]\n\nPartecipation is free and open to 
 all (whether they are IEEE members or not). Please\, register for in-perso
 n participation at Politecnico di Milano (see registration panel below).\n
 \nHybrid event\n\nThe talks 14:30-16:20 CEST (UTC+2) can be also attended 
 online (find the Webex link below in the location panel). No registration 
 is required to participate online.\n\nCo-sponsored by: : speakers from ETS
 -Lindgren (Cedar Park\, TX\, USA)\, EMZER (Barcelona\, Spain)\, Politecnic
 o di Milano\, Politecnico di Torino. Special thanks to Asea Sistemi (Casel
 le Torinese).\n\nSpeaker(s): Xinglong Wu\, Albert-Miquel Sánchez\, Amirho
 ssein Ahmadi\, Zhong Chen\n\nAgenda: \n14:30–14:40 Welcome\n\n14:40–15
 :05 EMC Modeling Techniques for Automotive and Industrial Applications\n\n
 Xinglong Wu\, IEEE EMC-S Young Professional Ambassador &amp; Politecnico di Mi
 lano\, DEIB\n\n15:05–15:30 Conducted Emissions and Power Line Filtering:
  Insights into Three-Phase Measurement and PLF Design for automotive appli
 cations\n\nAlbert-Miquel Sànchez Delgado\, EMZER\, Barcelona\, Spain\n\n1
 5:30–15:55 Susceptibility to EMI of the Vertical Interface of a Battery 
 Management System for Electric Vehicles\n\nAmirhossein Ahmadi\, Politecnic
 o di Torino\, DET\n\n15:55–16:20 Novel Chamber Designs for Full Vehicle 
 EMC and Antenna Testing\n\nZhong Chen\, ETS-Lindgren\, Cedar Park\, Texas\
 , USA\n\n16:20-17:00 Visit of the EMCLAB at DEIB (Building 7).\n\nRoom: Au
 la Beltrami\, Bldg: Edificio 5\, Politecnico di Milano\, Piazza Leonardo d
 a Vinci 32\, Milano\, Lombardia\, Italy\, 20133\, Virtual: https://events.
 vtools.ieee.org/m/487878
LOCATION:Room: Aula Beltrami\, Bldg: Edificio 5\, Politecnico di Milano\, P
 iazza Leonardo da Vinci 32\, Milano\, Lombardia\, Italy\, 20133\, Virtual:
  https://events.vtools.ieee.org/m/487878
ORGANIZER:giordano.spadacini@polimi.it
SEQUENCE:248
SUMMARY:Modern Trends in Automotive EMC
URL;VALUE=URI:https://events.vtools.ieee.org/m/487878
X-ALT-DESC:Description: &lt;br /&gt;&lt;p class=&quot;Default&quot;&gt;&lt;span style=&quot;color: rgb(0\
 , 0\, 0)\; font-size: 14pt\; font-family: arial\, helvetica\, sans-serif\;
 &quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;The automotive industry&lt;img style=&quot;float: right\;&quot; sr
 c=&quot;https://events.vtools.ieee.org/vtools_ui/media/display/0db725a7-9b2e-44
 e8-b57b-689a1f9d09e6&quot; alt=&quot;&quot; width=&quot;483&quot; height=&quot;278&quot;&gt;&lt;/span&gt;&lt;span lang=&quot;E
 N-US&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;&amp;nbsp\;has been progressing at a rapid pace with 
 the development of electric propulsion and advanced driver assistance syst
 ems\, thus facing new ch&lt;/span&gt;&lt;span lang=&quot;EN-US&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;allen
 g&lt;/span&gt;&lt;span lang=&quot;EN-US&quot;&gt;e&lt;/span&gt;&lt;span lang=&quot;EN-US&quot;&gt;s related to Elect&lt;/
 span&gt;&lt;span lang=&quot;EN-US&quot;&gt;ro&lt;/span&gt;&lt;span lang=&quot;EN-US&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;ma&lt;
 /span&gt;&lt;span lang=&quot;EN-US&quot;&gt;gnetic Compatibility (EMC). This technical meetin
 g will cover the most modern trends in Automotive EMC measurements and mod
 eling.&amp;nbsp\;&lt;/span&gt;Namely\, the latest developments in test chambers for 
 radiated emissions and immunity\, as well as novel methodologies for condu
 cted emission measurement and electromagnetic-interference filter design w
 ill be reviewed by two leading international experts. Recent trends in EMC
  modeling techniques will be presented by researchers working in the Itali
 an academia. Finally\, the meeting will end with a visit to the EMC labora
 tory (EMCLAB) at the Department of Electronics\, Information and Bioengine
 ering (DEIB) of Politecnico di Milano.&lt;/span&gt;&lt;/span&gt;&lt;/span&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p
  class=&quot;MsoNormal&quot; style=&quot;text-align: left\;&quot; align=&quot;center&quot;&gt;&amp;nbsp\;&lt;/p&gt;\n
 &lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: left\;&quot; align=&quot;center&quot;&gt;&amp;nbsp\;&lt;/p&gt;
 \n&lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: left\;&quot; align=&quot;center&quot;&gt;&amp;nbsp\;&lt;/
 p&gt;\n&lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: left\;&quot; align=&quot;center&quot;&gt;&lt;strong
 &gt;&lt;span lang=&quot;EN-US&quot; style=&quot;font-size: 11.0pt\; mso-ansi-language: EN-US\;&quot;
 &gt;Venue&lt;/span&gt;&lt;/strong&gt;&lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: left\;
 &quot; align=&quot;center&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;font-size: 11.0pt\; mso
 -ansi-language: EN-US\;&quot;&gt;Politecnico di Milano\, Campus Leonardo (Piazza L
 eonardo da Vinci 32\, Milano)\, Edificio 5\, Aula Beltrami&lt;/span&gt;&lt;/strong&gt;
 &lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: left\;&quot; align=&quot;center&quot;&gt;&lt;img 
 src=&quot;https://events.vtools.ieee.org/vtools_ui/media/display/368dd508-a40a-
 4bcd-8eda-60cbedb27532&quot; alt=&quot;&quot; width=&quot;628&quot; height=&quot;339&quot;&gt;&lt;/p&gt;\n&lt;p class=&quot;Ms
 oNormal&quot; style=&quot;text-align: left\;&quot; align=&quot;center&quot;&gt;Partecipation is &lt;stron
 g&gt;free&lt;/strong&gt; and &lt;strong style=&quot;mso-bidi-font-weight: normal\;&quot;&gt;&lt;span l
 ang=&quot;EN-US&quot; style=&quot;mso-ansi-language: EN-US\;&quot;&gt;open to all&lt;/span&gt;&lt;/strong&gt;
 &lt;span lang=&quot;EN-US&quot; style=&quot;mso-ansi-language: EN-US\;&quot;&gt; (whether they are I
 EEE members or not). &lt;/span&gt;Please\, &lt;strong&gt;register&lt;/strong&gt; for&amp;nbsp\;&lt;
 strong&gt;in-person&lt;/strong&gt; participation at Politecnico di Milano (see regi
 stration panel below).&lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: left\;
 &quot; align=&quot;center&quot;&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: left
 \;&quot; align=&quot;center&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;font-size: 11.0pt\; m
 so-ansi-language: EN-US\;&quot;&gt;Hybrid event&lt;/span&gt;&lt;/strong&gt;&lt;/p&gt;\n&lt;p class=&quot;Mso
 Normal&quot; style=&quot;text-align: left\;&quot; align=&quot;center&quot;&gt;The talks 14:30-16:20 CE
 ST (UTC+2) can be also attended online (find the Webex link below in the l
 ocation panel). No registration is required to participate online.&lt;/p&gt;&lt;br 
 /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p class=&quot;xdefault&quot;&gt;&lt;span style=&quot;background-color: r
 gb(255\, 255\, 255)\; font-family: arial\, helvetica\, sans-serif\; font-s
 ize: 12pt\;&quot;&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;background-color: rgb(255\, 255\, 2
 55)\;&quot;&gt;&lt;strong&gt;14:30&amp;ndash\;14:40&lt;/strong&gt;&lt;span style=&quot;mso-tab-count: 1\;&quot;
 &gt; &amp;nbsp\;&lt;/span&gt;&lt;strong&gt;Welcome&lt;/strong&gt;&lt;/span&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;b
 ackground-color: rgb(255\, 255\, 255)\;&quot;&gt;&lt;span style=&quot;mso-tab-count: 1\;&quot;&gt;
 &lt;strong&gt;&amp;nbsp\;&lt;/strong&gt; &amp;nbsp\; &amp;nbsp\; &amp;nbsp\; &amp;nbsp\; &amp;nbsp\; &amp;nbsp\; &amp;
 nbsp\;&lt;/span&gt;&lt;/span&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;xdefault&quot;&gt;&lt;span style=&quot;backgrou
 nd-color: rgb(255\, 255\, 255)\; font-family: arial\, helvetica\, sans-ser
 if\; font-size: 12pt\;&quot;&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;background-color: rgb(25
 5\, 255\, 255)\;&quot;&gt;&lt;strong&gt;14:40&amp;ndash\;15:05&lt;/strong&gt; &amp;nbsp\;&lt;/span&gt;&lt;stron
 g&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;background-color: rgb(255\, 255\, 255)\;&quot;&gt;EMC 
 Modeling Techniques for Automotive and Industrial Applications&lt;/span&gt;&lt;/str
 ong&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-left: 35.4pt\; text-i
 ndent: 35.4pt\;&quot;&gt;&lt;span style=&quot;background-color: rgb(255\, 255\, 255)\; fon
 t-family: arial\, helvetica\, sans-serif\; font-size: 12pt\;&quot;&gt;&lt;em&gt;&lt;span la
 ng=&quot;EN-US&quot; style=&quot;mso-ansi-language: EN-US\;&quot;&gt;Xinglong Wu\, IEEE EMC-S You
 ng Professional Ambassador &amp;amp\; Politecnico di Milano\, DEIB&lt;/span&gt;&lt;/em&gt;
 &lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;xdefault&quot; style=&quot;margin-left: 70.5pt\; text-indent:
  -70.5pt\;&quot;&gt;&lt;span style=&quot;background-color: rgb(255\, 255\, 255)\; font-fam
 ily: arial\, helvetica\, sans-serif\; font-size: 12pt\;&quot;&gt;&lt;strong&gt;&lt;span lan
 g=&quot;EN-US&quot; style=&quot;background-color: rgb(255\, 255\, 255)\;&quot;&gt;15:05&lt;/span&gt;&lt;sp
 an lang=&quot;EN-US&quot; style=&quot;background-color: rgb(255\, 255\, 255)\;&quot;&gt;&amp;ndash\;&lt;
 /span&gt;&lt;/strong&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;background-color: rgb(255\, 255\,
  255)\;&quot;&gt;&lt;strong&gt;15:30&amp;nbsp\; &lt;/strong&gt;&lt;/span&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot; s
 tyle=&quot;background-color: rgb(255\, 255\, 255)\;&quot;&gt;Conducted Emissions and Po
 wer Line Filtering: Insights into Three-Phase Measurement and PLF Design f
 or automotive applications&lt;/span&gt;&lt;/strong&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;xmsonorma
 l&quot; style=&quot;margin-left: 35.4pt\; text-indent: 35.4pt\;&quot;&gt;&lt;span style=&quot;backgr
 ound-color: rgb(255\, 255\, 255)\; font-family: arial\, helvetica\, sans-s
 erif\; font-size: 12pt\;&quot;&gt;&lt;em&gt;Albert-Miquel S&amp;agrave\;nchez Delgado\, EMZE
 R\, Barcelona\, Spain&lt;/em&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;xdefault&quot; style=&quot;margin-l
 eft: 70.5pt\; text-indent: -70.5pt\;&quot;&gt;&lt;span style=&quot;background-color: rgb(2
 55\, 255\, 255)\; font-family: arial\, helvetica\, sans-serif\; font-size:
  12pt\;&quot;&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;background-color: rgb(255\, 255\, 255)\
 ;&quot;&gt;&lt;strong&gt;15:30&amp;ndash\;15:55&lt;/strong&gt;&lt;span style=&quot;mso-tab-count: 1\;&quot;&gt; &amp;n
 bsp\;&lt;/span&gt;&lt;/span&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;background-color: rgb
 (255\, 255\, 255)\;&quot;&gt;Susceptibility to EMI of the Vertical Interface of a 
 Battery Management System for Electric Vehicles&lt;/span&gt;&lt;/strong&gt;&lt;/span&gt;&lt;/p&gt;
 \n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-left: 70.8pt\;&quot;&gt;&lt;span style=&quot;backgro
 und-color: rgb(255\, 255\, 255)\; font-family: arial\, helvetica\, sans-se
 rif\; font-size: 12pt\;&quot;&gt;&lt;em&gt;Amirhossein Ahmadi\, Politecnico di Torino\, 
 DET&lt;/em&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;xdefault&quot;&gt;&lt;span style=&quot;background-color: rg
 b(255\, 255\, 255)\; font-family: arial\, helvetica\, sans-serif\; font-si
 ze: 12pt\;&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;background-color: rgb(255\, 
 255\, 255)\;&quot;&gt;15:55&lt;/span&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;background-color: rgb(
 255\, 255\, 255)\;&quot;&gt;&amp;ndash\;&lt;/span&gt;&lt;/strong&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;back
 ground-color: rgb(255\, 255\, 255)\;&quot;&gt;&lt;strong&gt;16:20&lt;/strong&gt; &amp;nbsp\;&lt;/span
 &gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;background-color: rgb(255\, 255\, 255)\
 ;&quot;&gt;Novel Chamber Designs for Full Vehicle EMC and Antenna Testing &lt;/span&gt;&lt;
 /strong&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-left: 35.4pt\; te
 xt-indent: 35.4pt\;&quot;&gt;&lt;span style=&quot;background-color: rgb(255\, 255\, 255)\;
  font-family: arial\, helvetica\, sans-serif\; font-size: 12pt\;&quot;&gt;&lt;em&gt;&lt;spa
 n lang=&quot;EN-US&quot; style=&quot;mso-ansi-language: EN-US\;&quot;&gt;&amp;nbsp\;Zhong Chen\, ETS-
 Lindgren\, Cedar Park\, Texas\, USA&lt;/span&gt;&lt;/em&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;MsoN
 ormal&quot;&gt;&lt;span style=&quot;background-color: rgb(255\, 255\, 255)\; font-family: 
 arial\, helvetica\, sans-serif\; font-size: 12pt\;&quot;&gt;&lt;span lang=&quot;EN-US&quot; sty
 le=&quot;mso-ansi-language: EN-US\;&quot;&gt;&lt;strong&gt;16:20-17:00&lt;/strong&gt; &amp;nbsp\;&lt;stron
 g&gt;Visit of the EMCLAB at DEIB (Building 7).&lt;/strong&gt;&lt;/span&gt;&lt;/span&gt;&lt;/p&gt;
END:VEVENT
END:VCALENDAR