BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:Asia/Shanghai
BEGIN:STANDARD
DTSTART:19910915T010000
TZOFFSETFROM:+0900
TZOFFSETTO:+0800
TZNAME:CST
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20250611T073359Z
UID:98A35A79-E6E0-44BA-B73B-244FE34523BF
DTSTART;TZID=Asia/Shanghai:20250611T090000
DTEND;TZID=Asia/Shanghai:20250611T102000
DESCRIPTION:Salient features of the talk\n\n•Degradation Modeling History
 : Review 38 years of model development from industrial projects.\n•Stoch
 astic &amp; Statistical Integration: Combine modeling\, inference\, and mainte
 nance strategies.\n•Failure-Free Life Modeling: Explore models to explai
 n the existence of failure-free life.\n\nSpeaker(s): Loon Ching TANG \n\nA
 genda: \n•09:00-09:05 Welcome\, introduction &amp; photo session\n•09:05-1
 0:15 Professor Loon Ching TANG: Degradation Models in Reliability: A Histo
 rical Account and Future Outlook\n•10:15-10:20 Questions and discussions
 \n\nRoom: C1-213\, Bldg: MAIN BUILDING\, QINGSHUIHE CAMPUS. UESTC\, Chengd
 u \, Sichuan\, China\, Virtual: https://events.vtools.ieee.org/m/488402
LOCATION:Room: C1-213\, Bldg: MAIN BUILDING\, QINGSHUIHE CAMPUS. UESTC\, Ch
 engdu \, Sichuan\, China\, Virtual: https://events.vtools.ieee.org/m/48840
 2
ORGANIZER:yuliu@uestc.edu.cn
SEQUENCE:19
SUMMARY:Invited talk#2 by Prof. Loon Ching TANG\, titled &quot;Degradation Model
 s in Reliability: A Historical Account and Future Outlook&quot;
URL;VALUE=URI:https://events.vtools.ieee.org/m/488402
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;Salient features of the talk&lt;/p&gt;\n&lt;p&gt;&amp;bull
 \;Degradation Modeling History: Review 38 years of model development from 
 industrial projects.&lt;br&gt;&amp;bull\;Stochastic &amp;amp\; Statistical Integration: 
 Combine modeling\, inference\, and maintenance strategies.&lt;br&gt;&amp;bull\;Failu
 re-Free Life Modeling: Explore models to explain the existence of failure-
 free life.&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;&amp;bull\;09:00-09:05 Welcome\, in
 troduction &amp;amp\; photo session&amp;nbsp\;&lt;br&gt;&amp;bull\;09:05-10:15 Professor Loo
 n Ching TANG: Degradation Models in Reliability: A Historical Account and 
 Future Outlook&lt;br&gt;&amp;bull\;10:15-10:20 Questions and discussions&lt;/p&gt;
END:VEVENT
END:VCALENDAR