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PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
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TZID:America/Los_Angeles
BEGIN:DAYLIGHT
DTSTART:20260308T030000
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3
TZNAME:PDT
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BEGIN:STANDARD
DTSTART:20251102T010000
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TZOFFSETTO:-0800
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BEGIN:VEVENT
DTSTAMP:20251210T134153Z
UID:5D27A7F3-6FC9-45C5-96A8-D84CCD1DE0A4
DTSTART;TZID=America/Los_Angeles:20251120T073000
DTEND;TZID=America/Los_Angeles:20251205T170000
DESCRIPTION:[]This symposium will focus on quantified reliability\, acceler
 ated testing and probabilistic assessments of the useful lifetime of elect
 ronic\, photonic\, MEMS and MOEMS materials\, assemblies\, packages and sy
 stems in electronics and photonics packaging. This includes failure modes\
 , mechanisms\, testing schemes\, accelerated testing\, stress levels\, and
  environmental stresses. Registration is now open.\n\nVisit our website fo
 r details\, for our Advance Program\, and to register. https://attend.ieee
 .org/repp.\n\nMilpitas\, California\, United States\, Virtual: https://eve
 nts.vtools.ieee.org/m/495693
LOCATION:Milpitas\, California\, United States\, Virtual: https://events.vt
 ools.ieee.org/m/495693
ORGANIZER:p.wesling@ieee.org
SEQUENCE:50
SUMMARY:IEEE Symposium on Reliability for Electronics and Photonics Packagi
 ng
URL;VALUE=URI:https://events.vtools.ieee.org/m/495693
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;img style=&quot;float: right\;&quot; src=&quot;https://e
 vents.vtools.ieee.org/vtools_ui/media/display/21a07023-6e28-4f71-9411-ed16
 e5615638&quot; alt=&quot;&quot; width=&quot;493&quot; height=&quot;271&quot;&gt;This symposium will focus on qua
 ntified reliability\, accelerated testing and probabilistic assessments of
  the useful lifetime of electronic\, photonic\, MEMS and MOEMS materials\,
  assemblies\, packages and systems in electronics and photonics packaging.
  &amp;nbsp\;This includes failure modes\, mechanisms\, testing schemes\, accel
 erated testing\, stress levels\, and environmental stresses. Registration 
 is now open.&lt;/p&gt;\n&lt;p&gt;Visit our website for details\, for our Advance Progr
 am\, and to register. &lt;strong&gt;&lt;a href=&quot;https://attend.ieee.org/repp&quot;&gt;https
 ://attend.ieee.org/repp&lt;/a&gt;&lt;/strong&gt;.&amp;nbsp\;&lt;/p&gt;
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