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DESCRIPTION:IEEE San Diego EMC and Product Safety Chapter talk\n\nCISPR and
  ANSI C63® Overview on Site Validation Measurements from 18 GHz to 40 GHz
  - Latest Advances in EMC Test Site Evaluation Using Advanced Antenna Meas
 urement Techniques\n\nes\n\nBy Zhong Chen\, Chief Engineer\, ETS-Lindgren\
 , Cedar Park\, Texas\, USA\n\n[AMTA 2022 Best Paper Winners Announced! | A
 ntenna Measurement Techniques Association]\n\nAbstract: This presentation 
 introduces a novel approach for EMC chamber validation beyond 18 GHz\, cur
 rently under consideration in ANSI C63 and CISPR standards. By integrating
  Cylindrical Mode Filtered Site Voltage Standing Wave Ratio (CMF SVSWR) wi
 th Compressed Sensing (CS)\, we address inherent challenges in traditional
  SVSWR methods\, such as inconsistency and slow data acquisition. CMF SVSW
 R utilizes circular path measurements and mode domain post-processing to d
 iscern antenna and chamber reflections\, crucial for comprehensive VSWR an
 alysis. Compressed Sensing\, a data-driven machine learning technique\, ex
 ploits signal sparsity to reconstruct data from fewer randomly sampled mea
 surement points\, thereby reducing test times and eliminating the need for
  precise turntable positioning.\n\nCylindrical Mode Filtered SVSWR Demonst
 ration\n\nDemonstration Abstract: The Cylindrical Mode Filtered SVSWR (CMF
  SVSWR) is measured by placing the transmit antenna (typically a low gain 
 omni-directional antenna) at the edge of the turntable and performing a si
 ngle cut vector pattern measurement. The vector S21 as a function of turnt
 able angle at each frequency is transformed to the spectrum domain\, where
  a filter can be applied to mathematically remove the chamber effects. The
  SVSWR is derived by comparing the original pattern in the chamber to the 
 “clean” filtered pattern. This CMF SVSWR provides a more comprehensive
  evaluation of the EMC chamber quiet zone and can be readily measured with
 out any special positioning fixtures. The demonstration will show an entir
 e measurement process including the post processing which can be performed
  in real time. This new measurement technique is under consideration for t
 he new draft standard ANSI C63.25.3 under development by the ANSC C63® co
 mmittee for EMC test sites from 18 GHz to 40 GHz.\n\nSpeaker Bio:\n\nZhong
  Chen is Chief Engineer at ETS-Lindgren\, located in Cedar Park\, Texas. H
 e has over 25 years of\nexperience in RF testing\, anechoic chamber design
 \, as well as EMC antenna and field probe design and\nmeasurements. He is 
 an active member of the ANSC C63® committee currently serving as Vice-Cha
 ir\nand is the immediate past Chair of Subcommittee 1 which is responsible
  for the antenna calibration\n(ANSI C63.5) and chamber/test site validatio
 n standards (ANSI C63.4 and the ANSI C63.25 series). Mr.\nChen is chair of
  the IEEE Standard 1309 committee responsible for developing calibration s
 tandards for\nfield probes\, and IEEE Standard 1128 for absorber evaluatio
 n. Currently he is a member of the IEEE EMC\nSociety Board of Directors an
 d a former member of the Antenna Measurement Techniques Association\n(AMTA
 ) Board of Directors. He is a past Distinguished Lecturer for the EMC Soci
 ety and is recognized as\nan AMTA Fellow. His research interests include m
 easurement uncertainty\, time domain measurements\nfor site validation and
  antenna calibration\, and development of novel RF absorber materials. Sev
 eral\npapers authored and co-authored by Mr. Chen have received best paper
  recognition at global\nconferences. Zhong Chen received his M.S.E.E. degr
 ee in Electromagnetics from the Ohio State\nUniversity at Columbus. He may
  be reached at zhong.chen@ets-lindgren.com\n\nSpeaker(s): Zhong Chen\n\nAg
 enda: \nAgenda:\n\n6PM - 6:45PM Dinner and Networking\n\n6:45PM - 8PM Talk
  and Questions\n\nMonday\, Oct 6th\, 2025\n\n2210 Faraday Ave Ste 150\, Ne
 mko USA Inc.\, Carlsbad\, California\, United States\, 92008
LOCATION:2210 Faraday Ave Ste 150\, Nemko USA Inc.\, Carlsbad\, California\
 , United States\, 92008
ORGANIZER:galcala@atecorp.com
SEQUENCE:31
SUMMARY:CISPR and ANSI C63® Overview on Site Validation Measurements from 
 18 GHz to 40 GHz - Latest Advances in EMC Test Site Evaluation Using Advan
 ced Antenna Measurement Techniques
URL;VALUE=URI:https://events.vtools.ieee.org/m/500156
X-ALT-DESC:Description: &lt;br /&gt;&lt;h2&gt;IEEE San Diego EMC and&amp;nbsp\;Product Safe
 ty Chapter talk&lt;/h2&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-left: .5in\;&quot;&gt;&lt;s
 trong&gt;&lt;span style=&quot;font-size: 11.0pt\;&quot;&gt;CISPR and ANSI C63&amp;reg\; Overview 
 on Site Validation Measurements from 18 GHz to 40 GHz - Latest Advances in
  EMC Test Site Evaluation Using Advanced Antenna Measurement Techniques&lt;/s
 pan&gt;&lt;/strong&gt;&lt;/p&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-left: .5in\;&quot;&gt;&lt;stro
 ng&gt;&lt;span style=&quot;font-size: 11.0pt\;&quot;&gt;&lt;em&gt;&lt;img src=&quot;https://events.vtools.i
 eee.org/vtools_ui/media/display/c7f8f155-b8fb-404c-972e-06b2bdda7fd1&quot; widt
 h=&quot;229&quot; height=&quot;184&quot;&gt;&lt;/em&gt;&lt;/span&gt;&lt;/strong&gt;&lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot;&gt;&lt;span
  style=&quot;background-color: rgb(255\, 255\, 255)\; color: rgb(255\, 255\, 25
 5)\;&quot;&gt;&lt;strong&gt;es&lt;/strong&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-
 left: .5in\;&quot;&gt;&lt;em&gt;&lt;span style=&quot;font-size: 11.0pt\;&quot;&gt;By Zhong Chen\, Chief 
 Engineer\, ETS-Lindgren\, Cedar Park\, Texas\, USA&lt;/span&gt;&lt;/em&gt;&lt;/p&gt;\n&lt;p cla
 ss=&quot;xmsonormal&quot; style=&quot;margin-left: .5in\;&quot;&gt;&lt;em&gt;&lt;span style=&quot;font-size: 11
 .0pt\;&quot;&gt;&amp;nbsp\;&lt;img src=&quot;https://www.amta.org/images/2023/ZC_Headshot.jpg&quot;
  alt=&quot;AMTA 2022 Best Paper Winners Announced! | Antenna Measurement Techni
 ques Association&quot; width=&quot;128&quot; height=&quot;162&quot;&gt;&lt;/span&gt;&lt;/em&gt;&lt;/p&gt;\n&lt;p class=&quot;xms
 onormal&quot; style=&quot;margin-left: .5in\;&quot;&gt;&lt;strong&gt;&lt;span style=&quot;font-size: 11.0p
 t\;&quot;&gt;Abstract:&lt;/span&gt;&lt;/strong&gt;&lt;em&gt;&lt;span style=&quot;font-size: 11.0pt\;&quot;&gt;&amp;nbsp\
 ; &lt;/span&gt;&lt;/em&gt;&lt;span style=&quot;font-size: 11.0pt\;&quot;&gt;This presentation introduc
 es a novel approach for EMC chamber validation beyond 18 GHz\, currently u
 nder consideration in ANSI C63 and CISPR standards. By integrating Cylindr
 ical Mode Filtered Site Voltage Standing Wave Ratio (CMF SVSWR) with Compr
 essed Sensing (CS)\, we address inherent challenges in traditional SVSWR m
 ethods\, such as inconsistency and slow data acquisition. CMF SVSWR utiliz
 es circular path measurements and mode domain post-processing to discern a
 ntenna and chamber reflections\, crucial for comprehensive VSWR analysis. 
 Compressed Sensing\, a data-driven machine learning technique\, exploits s
 ignal sparsity to reconstruct data from fewer randomly sampled measurement
  points\, thereby reducing test times and eliminating the need for precise
  turntable positioning.&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-le
 ft: .5in\;&quot;&gt;&lt;strong&gt;&lt;span style=&quot;font-size: 11.0pt\;&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;/stro
 ng&gt;&lt;/p&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-left: .5in\;&quot;&gt;&lt;strong&gt;&lt;span s
 tyle=&quot;font-size: 11.0pt\;&quot;&gt;Cylindrical Mode Filtered SVSWR Demonstration&lt;/
 span&gt;&lt;/strong&gt;&lt;/p&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-left: .5in\;&quot;&gt;&lt;em&gt;
 &lt;span style=&quot;font-size: 11.0pt\;&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;/em&gt;&lt;/p&gt;\n&lt;p class=&quot;xmson
 ormal&quot; style=&quot;margin-left: .5in\;&quot;&gt;&lt;strong&gt;&lt;span style=&quot;font-size: 11.0pt\
 ;&quot;&gt;Demonstration Abstract:&lt;/span&gt;&lt;/strong&gt;&lt;span style=&quot;font-size: 11.0pt\;
 &quot;&gt;&amp;nbsp\; The Cylindrical Mode Filtered SVSWR (CMF SVSWR) is measured by p
 lacing the transmit antenna (typically a low gain omni-directional antenna
 ) at the edge of the turntable and performing a single cut vector pattern 
 measurement.&amp;nbsp\; The vector S21 as a function of turntable angle at eac
 h frequency is transformed to the spectrum domain\, where a filter can be 
 applied to mathematically remove the chamber effects.&amp;nbsp\; The SVSWR is 
 derived by comparing the original pattern in the chamber to the &amp;ldquo\;cl
 ean&amp;rdquo\; filtered pattern.&amp;nbsp\; This CMF SVSWR provides a more compre
 hensive evaluation of the EMC chamber quiet zone and can be readily measur
 ed without any special positioning fixtures.&amp;nbsp\; The demonstration will
  show an entire measurement process including the post processing which ca
 n be performed in real time.&amp;nbsp\; This new measurement technique is unde
 r consideration for the new draft standard ANSI C63.25.3 under development
  by the ANSC C63&amp;reg\; committee for EMC test sites from 18 GHz to 40 GHz.
 &lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-left: .5in\;&quot;&gt;&lt;strong&gt;Spe
 aker Bio:&lt;/strong&gt;&lt;/p&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-left: .5in\;&quot;&gt;
 Zhong Chen is Chief Engineer at ETS-Lindgren\, located in Cedar Park\, Tex
 as. He has over 25 years of&amp;nbsp\;&lt;br&gt;experience in RF testing\, anechoic 
 chamber design\, as well as EMC antenna and field probe design and&amp;nbsp\;&lt;
 br&gt;measurements. He is an active member of the ANSC C63&amp;reg\; committee cu
 rrently serving as Vice-Chair&amp;nbsp\;&lt;br&gt;and is the immediate past Chair of
  Subcommittee 1 which is responsible for the antenna calibration&amp;nbsp\;&lt;br
 &gt;(ANSI C63.5) and chamber/test site validation standards (ANSI C63.4 and t
 he ANSI C63.25 series). Mr.&amp;nbsp\;&lt;br&gt;Chen is chair of the IEEE Standard 1
 309 committee responsible for developing calibration standards for&amp;nbsp\;&lt;
 br&gt;field probes\, and IEEE Standard 1128 for absorber evaluation. Currentl
 y he is a member of the IEEE EMC&amp;nbsp\;&lt;br&gt;Society Board of Directors and 
 a former member of the Antenna Measurement Techniques Association&amp;nbsp\;&lt;b
 r&gt;(AMTA) Board of Directors. He is a past Distinguished Lecturer for the E
 MC Society and is recognized as&amp;nbsp\;&lt;br&gt;an AMTA Fellow. His research int
 erests include measurement uncertainty\, time domain measurements&amp;nbsp\;&lt;b
 r&gt;for site validation and antenna calibration\, and development of novel R
 F absorber materials. Several&amp;nbsp\;&lt;br&gt;papers authored and co-authored by
  Mr. Chen have received best paper recognition at global&amp;nbsp\;&lt;br&gt;confere
 nces. Zhong Chen received his M.S.E.E. degree in Electromagnetics from the
  Ohio State&amp;nbsp\;&lt;br&gt;University at Columbus. He may be reached at zhong.c
 hen@ets-lindgren.com&lt;/p&gt;\n&lt;p class=&quot;xmsonormal&quot; style=&quot;margin-left: .5in\;
 &quot;&gt;&amp;nbsp\;&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;Agenda:&lt;/p&gt;\n&lt;p&gt;6PM - 6:45PM Din
 ner and Networking&lt;/p&gt;\n&lt;p&gt;6:45PM - 8PM Talk and Questions&lt;/p&gt;\n&lt;p&gt;Monday\
 , Oct 6th\, 2025&lt;/p&gt;
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