BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/Chicago BEGIN:DAYLIGHT DTSTART:20250309T030000 TZOFFSETFROM:-0600 TZOFFSETTO:-0500 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:CDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20251102T010000 TZOFFSETFROM:-0500 TZOFFSETTO:-0600 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:CST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20251020T161958Z UID:EB8B343A-029B-4AB9-A8E4-A791A7312BB6 DTSTART;TZID=America/Chicago:20251017T103000 DTEND;TZID=America/Chicago:20251017T140000 DESCRIPTION:The IEEE EMC (Electromagnetic Compatility) Central Texas Chapte r and MTT-S TAMU (IEEE Microwave Theory and Technology Society at Texas A& M University)\, in partnership with Intelligent Electromagnetic Sensor Lab oratories (iEMSL)\, Texas A&M ECEN department and ETS-Lindgren\, invite Te xas A&M engineering students and IEEE Chapter members to a half-day techni cal OTA (Over-the-Air) workshop that unlocks the essentials of antennas an d OTA testing!\n\nFrom your smartphones to connected cars\, antennas and O TA testing are at the heart of today’s wireless world. This workshop wil l consolidate key concepts from Antenna Basics and Introduction to OTA Tes ting to provide both a theoretical foundation and practical insights into modern wireless testing.\n\nCo-sponsored by: MTT-S TAMU (IEEE Microwave Th eory and Technology Society at Texas A&M University)\, Intelligent Electro magnetic Sensor Laboratories (iEMSL)\, Texas A&M ECEN department and ETS-L indgren\n\nSpeaker(s): \, \, \, \n\nAgenda: \nWorkshop Topics:\n\n· Anten na Basics – Core principles\, radiation patterns\, polarization\, and ef ficiency\n\n· Introduction to OTA – Why OTA testing is essential for re al-world device performance verification\n\n· OTA Chamber Systems – Des ign elements\, shielding\, absorbers\, positioning systems\, and all relev ant instrumentation\n\n· TRP and TIS Tests – Standardized metrics for t ransmit and receive performance\n\n· Calibration and Measurement Uncertai nty – Ensuring accuracy through ripple tests\, range calibration\, and u nderstanding uncertainty contributions\n\nWhy Attend?\n\nWireless devices today integrate multiple technologies (cellular\, Wi-Fi\, Bluetooth\, GPS\ , etc.)\, making OTA performance critical to product success. This worksho p will help participants:\n\n- Understand antenna fundamentals in the cont ext of system performance\n- Learn how an OTA chamber replicates free-spac e conditions for accurate testing\n- Gain familiarity with TRP/TIS metrics that define link budgets\n- Recognize the importance of calibration and m easurement uncertainty in ensuring reliable\, repeatable test results\n\nW orkshop Schedule\n\n- 10:30am-11:00am Opening Remarks from MTT-S TAMU and IEEE EMC Central Texas Chapter (Roman Venegas & Tara Kellogg)\n- 11:00am-1 2:00pm OTA Presentation (Tara Kellogg and Mingfei Xie))\n- 12:00pm-1:00pm Lunch (Pizza and desserts provided by ETS-Lindgren)\n- 1:00pm-2:00pm OTA D emo Session (Prof. Marco Iskander and Mingfei Xie)\n\nWorkshop Details:\n\ nDate: Friday\, October 17\, 2025\n\nTime: 10:30am – 2:00pm CT\n\nLocati on: Seminar Room WEB 232 (Presentation) and Lab WEB 160 (Live Demo Session )\n\nLunch: A complimentary lunch will be provided courtesy of ETS-Lindgre n\n\nFormat: In-person only\n\nNote: There is no cost to attend this works hop\, all Texas A&M engineering students\, IEEE members and guests are wel come! However\, you MUST register in advance in order to secure seating an d lunch! Please register at https://events.vtools.ieee.org/m/501238\n\nBad ges will be available onsite for all advance registrants.\n\nDon’t miss the opportunity to expand your knowledge and get a behind-the-scenes look at how world-class wireless devices are tested!\n\nSave your spot today an d join us!\n\nRoom: Seminar room WEB 232\, Bldg: Wisenbaker Engineering Bu ilding (WEB)\, Wisenbaker Engineering Research Center\, 188 Bizzell St\, B ryan\, Texas\, United States\, 77801 LOCATION:Room: Seminar room WEB 232\, Bldg: Wisenbaker Engineering Building (WEB)\, Wisenbaker Engineering Research Center\, 188 Bizzell St\, Bryan\, Texas\, United States\, 77801 ORGANIZER:tara.kellogg@ieee.org SEQUENCE:96 SUMMARY:OTA Fundamentals and Testing Methods: Half-Day Technical Workshop A ddressing the Basics of OTA Testing\, Including a Live Demo URL;VALUE=URI:https://events.vtools.ieee.org/m/501238 X-ALT-DESC:Description: <br /><p class="MsoNormal" style="text-align: justi fy\; text-justify: inter-ideograph\;">The IEEE EMC (Electromagnetic Compat ility) Central Texas Chapter and MTT-S TAMU (IEEE Microwave Theory and Tec hnology Society at Texas A&amp\;M University)\, in partnership with Intell igent Electromagnetic Sensor Laboratories (iEMSL)\, Texas A&amp\;M ECEN de partment and ETS-Lindgren\, invite Texas A&amp\;M engineering students and IEEE Chapter members to a half-day technical OTA (Over-the-Air) workshop that unlocks the essentials of antennas and OTA testing!</p>\n<p class="Ms oNormal" style="text-align: justify\; text-justify: inter-ideograph\;">Fro m your smartphones to connected cars\, antennas and OTA testing are at the heart of today&rsquo\;s wireless world. This workshop will consolidate ke y concepts from Antenna Basics and Introduction to OTA Testing to provide both a theoretical foundation and practical insights into modern wireless testing.</p>\n<p class="MsoListParagraphCxSpLast" style="text-indent: -.25 in\; mso-list: l0 level1 lfo1\;">&nbsp\;</p><br /><br />Agenda: <br /><p c lass="MsoNormal"><strong>Workshop Topics:</strong></p>\n<p class="MsoListP aragraphCxSpFirst" style="text-indent: -.25in\; mso-list: l0 level1 lfo1\; "><!-- [if !supportLists]--><span style="font-family: Symbol\; mso-fareast -font-family: Symbol\; mso-bidi-font-family: Symbol\; mso-bidi-font-weight : bold\;"><span style="mso-list: Ignore\;">&middot\;<span style="font: 7.0 pt 'Times New Roman'\;">&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\; </span> </span></span><!--[endif]--><strong>Antenna Basics </strong>&ndash\; Core principles\, radiation patterns\, polarization\, and efficiency</p>\n<p cl ass="MsoListParagraphCxSpMiddle" style="text-indent: -.25in\; mso-list: l0 level1 lfo1\;"><!-- [if !supportLists]--><span style="font-family: Symbol \; mso-fareast-font-family: Symbol\; mso-bidi-font-family: Symbol\; mso-bi di-font-weight: bold\;"><span style="mso-list: Ignore\;">&middot\;<span st yle="font: 7.0pt 'Times New Roman'\;">&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;& nbsp\; </span></span></span><!--[endif]--><strong>Introduction to OTA </st rong>&ndash\; Why OTA testing is essential for real-world device performan ce verification</p>\n<p class="MsoListParagraphCxSpMiddle" style="text-ind ent: -.25in\; mso-list: l0 level1 lfo1\;"><!-- [if !supportLists]--><span style="font-family: Symbol\; mso-fareast-font-family: Symbol\; mso-bidi-fo nt-family: Symbol\; mso-bidi-font-weight: bold\;"><span style="mso-list: I gnore\;">&middot\;<span style="font: 7.0pt 'Times New Roman'\;">&nbsp\;&nb sp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\; </span></span></span><!--[endif]--><stron g>OTA Chamber Systems </strong>&ndash\; Design elements\, shielding\, abso rbers\, positioning systems\, and all relevant instrumentation</p>\n<p cla ss="MsoListParagraphCxSpMiddle" style="text-indent: -.25in\; mso-list: l0 level1 lfo1\;"><!-- [if !supportLists]--><span style="font-family: Symbol\ ; mso-fareast-font-family: Symbol\; mso-bidi-font-family: Symbol\; mso-bid i-font-weight: bold\;"><span style="mso-list: Ignore\;">&middot\;<span sty le="font: 7.0pt 'Times New Roman'\;">&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&n bsp\; </span></span></span><!--[endif]--><strong>TRP and TIS Tests </stron g>&ndash\; Standardized metrics for transmit and receive performance</p>\n <p class="MsoListParagraphCxSpLast" style="text-indent: -.25in\; mso-list: l0 level1 lfo1\;"><!-- [if !supportLists]--><span style="font-family: Sym bol\; mso-fareast-font-family: Symbol\; mso-bidi-font-family: Symbol\; mso -bidi-font-weight: bold\;"><span style="mso-list: Ignore\;">&middot\;<span style="font: 7.0pt 'Times New Roman'\;">&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp \;&nbsp\; </span></span></span><!--[endif]--><strong>Calibration and Measu rement Uncertainty </strong>&ndash\; Ensuring accuracy through ripple test s\, range calibration\, and understanding uncertainty contributions</p>\n< p class="MsoListParagraphCxSpLast" style="text-indent: -.25in\; mso-list: l0 level1 lfo1\;">&nbsp\;</p>\n<p class="MsoNormal"><strong>Why Attend?</s trong></p>\n<p class="MsoNormal" style="text-align: justify\; text-justify : inter-ideograph\;">Wireless devices today integrate multiple technologie s (cellular\, Wi-Fi\, Bluetooth\, GPS\, etc.)\, making OTA performance cri tical to product success. This workshop will help participants:</p>\n<ul>\ n<li class="MsoNormal" style="text-align: justify\;"><!-- [if !supportList s]-->Understand antenna fundamentals in the context of system performance< /li>\n<li class="MsoNormal" style="text-align: justify\;"><!-- [if !suppor tLists]-->Learn how an OTA chamber replicates free-space conditions for ac curate testing</li>\n<li class="MsoNormal" style="text-align: justify\;">< !-- [if !supportLists]-->Gain familiarity with TRP/TIS metrics that define link budgets</li>\n<li class="MsoNormal" style="text-align: justify\;"><! -- [if !supportLists]-->Recognize the importance of calibration and measur ement uncertainty in ensuring reliable\, repeatable test results</li>\n</u l>\n<p class="MsoNormal">&nbsp\;</p>\n<p class="MsoNormal"><strong>Worksho p Schedule</strong></p>\n<ul style="margin-top: 0in\;" type="disc">\n<li c lass="MsoNormal" style="mso-list: l0 level1 lfo1\; tab-stops: list .5in\;" >10:30am-11:00am&nbsp\; &nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\; Opening Remark s from MTT-S TAMU and IEEE EMC Central Texas Chapter (Roman Venegas &amp\; Tara Kellogg)</li>\n<li class="MsoNormal" style="mso-list: l0 level1 lfo1 \; tab-stops: list .5in\;">11:00am-12:00pm&nbsp\; &nbsp\;&nbsp\;&nbsp\;&nb sp\;&nbsp\; OTA Presentation (Tara Kellogg and Mingfei Xie))</li>\n<li cla ss="MsoNormal" style="mso-list: l0 level1 lfo1\; tab-stops: list .5in\;">1 2:00pm-1:00pm&nbsp\;&nbsp\;&nbsp\; &nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\; Lun ch (Pizza and desserts provided by ETS-Lindgren)</li>\n<li class="MsoNorma l" style="mso-list: l0 level1 lfo1\; tab-stops: list .5in\;">1:00pm-2:00pm &nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\; &nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\; OT A Demo Session (Prof. Marco Iskander and Mingfei Xie)</li>\n</ul>\n<p clas s="MsoNormal">&nbsp\;</p>\n<p class="MsoNormal"><strong>Workshop Details:< /strong></p>\n<p class="MsoNormal">Date: Friday\, October 17\, 2025</p>\n< p class="MsoNormal">Time: 10:30am &ndash\; 2:00pm CT</p>\n<p class="MsoNor mal">Location: Seminar Room WEB 232 (Presentation) and Lab WEB 160 (Live D emo Session)</p>\n<p class="MsoNormal">Lunch: A complimentary lunch will b e provided courtesy of ETS-Lindgren</p>\n<p class="MsoNormal">Format: In-p erson only</p>\n<p class="MsoNormal"><em><u>Note: There is no cost to atte nd this workshop\, all Texas A&amp\;M engineering students\, IEEE members and guests are welcome! However\, you MUST register in advance in order to secure seating and lunch! Please register at https://events.vtools.ieee.o rg/m/501238</u></em></p>\n<p class="MsoNormal"><em><u>Badges will be avail able onsite for all advance registrants.</u></em></p>\n<p class="MsoNormal ">&nbsp\;</p>\n<p class="MsoNormal"><strong><em>Don&rsquo\;t miss the oppo rtunity to expand your knowledge and get a behind-the-scenes look at how w orld-class wireless devices are tested! </em></strong></p>\n<p class="MsoN ormal"><strong><em>Save your spot today and join us! </em></strong></p>\n< p class="MsoListParagraphCxSpLast" style="text-indent: -.25in\; mso-list: l0 level1 lfo1\;">&nbsp\;</p> END:VEVENT END:VCALENDAR