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DTSTART:20260308T030000
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DTSTART:20251102T010000
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DTSTAMP:20251113T231608Z
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DTSTART;TZID=America/New_York:20251106T140000
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DESCRIPTION:This session provides a technical overview of tradeoffs in the 
 use of precision\, multi-lane millimeter-wave test fixtures for empirical 
 characterization of 200G and 400G silicon SerDes. Measurement data from 67
  GHz and 110 GHz channel emulators are analyzed\, with emphasis on the imp
 act of higher order modes in coaxial test cables relative to 200G and 400G
  Nyquist frequencies. For 224G SerDes\, results demonstrate the ability to
  trade test cable loss at Nyquist against modal bandwidth\, maintaining at
  least 20% BW margin. The discussion extends to candidate signaling strate
 gies for 400G\, evaluating whether these trends persist as modulation form
 ats and channel requirements evolve. The findings inform the design and va
 lidation of next-generation serial PHYs\, highlighting physical layer cons
 traints and opportunities for advancing high-speed data center interconnec
 ts.\n\nSpeaker(s): Andrew Josephson\, \n\nVirtual: https://events.vtools.i
 eee.org/m/505970
LOCATION:Virtual: https://events.vtools.ieee.org/m/505970
ORGANIZER:aabdella@ieee.org
SEQUENCE:18
SUMMARY:Precision mm-Wave Test Fixtures for 400Gbps Serial PHY Characteriza
 tion
URL;VALUE=URI:https://events.vtools.ieee.org/m/505970
X-ALT-DESC:Description: <br /><p><img style="display: block\; margin-left: 
 auto\; margin-right: auto\;" src="https://events.vtools.ieee.org/vtools_ui
 /media/display/72e5d438-2a01-45dd-9af0-5d1ea5a9538d" width="531" height="3
 01"></p>\n<p style="text-align: justify\;">This session provides a technic
 al overview of tradeoffs in the use of precision\, multi-lane millimeter-w
 ave test fixtures for empirical characterization of 200G and 400G silicon 
 SerDes. Measurement data from 67 GHz and 110 GHz channel emulators are ana
 lyzed\, with emphasis on the impact of higher order modes in coaxial test 
 cables relative to 200G and 400G Nyquist frequencies. For 224G SerDes\, re
 sults demonstrate the ability to trade test cable loss at Nyquist against 
 modal bandwidth\, maintaining at least 20% BW margin. The discussion exten
 ds to candidate signaling strategies for 400G\, evaluating whether these t
 rends persist as modulation formats and channel requirements evolve. The f
 indings inform the design and validation of next-generation serial PHYs\, 
 highlighting physical layer constraints and opportunities for advancing hi
 gh-speed data center interconnects.</p>
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