BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:Pacific/Honolulu
BEGIN:STANDARD
DTSTART:19470608T023000
TZOFFSETFROM:-1130
TZOFFSETTO:-1000
TZNAME:HST
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20251105T020331Z
UID:23F0A91B-5502-4092-A022-9B62DA9CAA7E
DTSTART;TZID=Pacific/Honolulu:20251024T180000
DTEND;TZID=Pacific/Honolulu:20251024T190000
DESCRIPTION:Modern Vector Network Analyzers (VNA) have flexible hardware an
 d software with much higher performance than VNAs of even a few years ago.
  There are a wide range of measurement applications\, beyond simple S-para
 meters\, that a VNA can address\, and with precision that cannot be achiev
 ed by other test methods. VNAs now act as a multi-functional test system\,
  providing an extremely wide range of device- and signal-characterization 
 capabilities including noise figure\, gain-compression\, true-mode differe
 ntial device characterization\, two-tone Inter-Modulation Distortion (IMD)
 \, phase-noise\, mixer and frequency converter gain/phase/delay measuremen
 ts. Very recently Vector Spectrum Analysis (VSA)\ncapabilities have been a
 dded\, including measurements of complex modulated signals such as Error V
 ector Magnitude (EVM)\, Adjacent Channel Power Ratio (ACPR) and characteri
 stics of Digital Pre-Distortion (DPD). These capabilities\, when properly 
 configured\, provide the most precise measurements of high-frequency mm-wa
 ve and sub-THz modulated signals\, beyond the capabilities of stand-alone 
 measurement instruments\, as will be demonstrated using 20 GHz bandwidth m
 odulated signals at 250 GHz. This lecture illuminates the methods and capa
 bilities for these advanced measurement methods for characterizing microwa
 ve components.\n\nSpeaker(s): \, Joel\n\nAgenda: \n6 pm- 6:40 pm- Distingu
 ished Microwave Lecturers Seminar\n\n6:40 pm- 7:15 pm- Newtroking over din
 ner\n\nBldg: Holmes Hall 389\, 2540 Dole Street\, Honolulu\, Hawaii\, Unit
 ed States\, 96822
LOCATION:Bldg: Holmes Hall 389\, 2540 Dole Street\, Honolulu\, Hawaii\, Uni
 ted States\, 96822
ORGANIZER:marahman@hawaii.edu
SEQUENCE:34
SUMMARY:Advanced Methods for Precise and Complete Microwave Component Measu
 rements
URL;VALUE=URI:https://events.vtools.ieee.org/m/506999
X-ALT-DESC:Description: <br /><p>Modern Vector Network Analyzers (VNA) have
  flexible hardware and software with much higher&nbsp\;performance than VN
 As of even a few years ago. There are a wide range of measurement applicat
 ions\,&nbsp\;beyond simple S-parameters\, that a VNA can address\, and wit
 h precision that cannot be achieved by&nbsp\;other test methods. VNAs now 
 act as a multi-functional test system\, providing an extremely wide range 
 of&nbsp\;device- and signal-characterization capabilities including noise 
 figure\, gain-compression\, true-mode&nbsp\;differential device characteri
 zation\, two-tone Inter-Modulation Distortion (IMD)\, phase-noise\, mixer 
 and&nbsp\;frequency converter gain/phase/delay measurements. Very recently
  Vector Spectrum Analysis (VSA)<br>capabilities have been added\, includin
 g measurements of complex modulated signals such as Error&nbsp\;Vector Mag
 nitude (EVM)\, Adjacent Channel Power Ratio (ACPR) and characteristics of 
 Digital Pre-Distortion (DPD). These capabilities\, when properly configure
 d\, provide the most precise measurements&nbsp\;of high-frequency mm-wave 
 and sub-THz modulated signals\, beyond the capabilities of stand-alone&nbs
 p\;measurement instruments\, as will be demonstrated using 20 GHz bandwidt
 h modulated signals at 250&nbsp\;GHz. This lecture illuminates the methods
  and capabilities for these advanced measurement methods for&nbsp\;charact
 erizing microwave components.</p><br /><br />Agenda: <br /><p>6 pm- 6:40 p
 m- Distinguished Microwave Lecturers Seminar</p>\n<p>6:40 pm- 7:15 pm- New
 troking over dinner&nbsp\;</p>
END:VEVENT
END:VCALENDAR