BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/New_York BEGIN:DAYLIGHT DTSTART:20260308T030000 TZOFFSETFROM:-0500 TZOFFSETTO:-0400 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:EDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20251102T010000 TZOFFSETFROM:-0400 TZOFFSETTO:-0500 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:EST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20251114T004242Z UID:074A0368-7BBB-4DA1-9A9B-4C668197C152 DTSTART;TZID=America/New_York:20251112T110000 DTEND;TZID=America/New_York:20251112T120000 DESCRIPTION:In industries where reliability and authenticity are paramount\ , traditional metrics like the “two-year date code” are no longer suff icient. This Rochester Electronics webinar explores the evolving landscape of semiconductor traceability and its critical role in ensuring long-term reliability\, counterfeit mitigation\, and supply chain resilience.\n\nAs silicon fabrication technology advances\, older fab processes are phased out. At the same time\, package obsolescence is accelerating\, creating so urcing challenges for legacy and long-lifecycle systems. Attendees will ga in a deeper understanding of:\n\nWhy legacy date code constraints are outd ated and how traditional solderability tests may over-reject acceptable ag ed material.\n\n- How fully authorized and traceable sources support indus tries with long product lifecycles\n- Real-world lessons learned from the COVID-19 supply chain disruptions\n- How a long-term storage strategy can ensure a consistent supply chain\, long-term component availability\, and avoid unnecessary waste.\n\nSpeaker(s): Dan Deisz\, Peter Crudele\, \n\nAg enda: \nIn industries where reliability and authenticity are paramount\, t raditional metrics like the “two-year date code” are no longer suffici ent. This Rochester Electronics webinar explores the evolving landscape of semiconductor traceability and its critical role in ensuring long-term re liability\, counterfeit mitigation\, and supply chain resilience.\n\nAs si licon fabrication technology advances\, older fab processes are phased out . At the same time\, package obsolescence is accelerating\, creating sourc ing challenges for legacy and long-lifecycle systems. Attendees will gain a deeper understanding of:\n\nWhy legacy date code constraints are outdate d and how traditional solderability tests may over-reject acceptable aged material.\n\n- How fully authorized and traceable sources support industri es with long product lifecycles\n- Real-world lessons learned from the COV ID-19 supply chain disruptions\n- How a long-term storage strategy can ens ure a consistent supply chain\, long-term component availability\, and avo id unnecessary waste.\n\nVirtual: https://events.vtools.ieee.org/m/512276 LOCATION:Virtual: https://events.vtools.ieee.org/m/512276 ORGANIZER:rkolod@ieee.org SEQUENCE:54 SUMMARY:The Computer and Control Chapter (C&C) Presents: Beyond Date Codes – Rethinking Semiconductor Traceability for Reliability and Resilience URL;VALUE=URI:https://events.vtools.ieee.org/m/512276 X-ALT-DESC:Description: <br /><p class="MsoNormal"><span style="font-size: 10.0pt\; font-family: 'Arial'\,sans-serif\; color: black\; letter-spacing: .3pt\;">In industries where reliability and authenticity are paramount\, traditional metrics like the &ldquo\;two-year date code&rdquo\; are no lon ger sufficient. This Rochester Electronics webinar explores the evolving l andscape of semiconductor traceability and its critical role in ensuring l ong-term reliability\, counterfeit mitigation\, and supply chain resilienc e.</span></p>\n<p style="background: white\;"><span style="font-size: 10.0 pt\; font-family: 'Arial'\,sans-serif\; color: black\; letter-spacing: .3p t\;">As silicon fabrication technology advances\, older fab processes are phased out. At the same time\, package obsolescence is accelerating\, crea ting sourcing challenges for legacy and long-lifecycle systems. Attendees will gain a deeper understanding of:</span></p>\n<p style="margin: 0in\; b ackground: white\;"><span style="font-size: 10.0pt\; font-family: 'Arial'\ ,sans-serif\; color: black\; letter-spacing: .3pt\;">Why legacy date code constraints are outdated and how traditional solderability tests may over- reject acceptable aged material.</span></p>\n<ul type="disc">\n<li class=" MsoNormal" style="color: black\; mso-margin-top-alt: auto\; mso-margin-bot tom-alt: auto\; mso-list: l0 level1 lfo1\; tab-stops: list .5in\; backgrou nd: white\;"><span style="font-size: 10.0pt\; font-family: 'Arial'\,sans-s erif\; letter-spacing: .3pt\;">How fully authorized and traceable sources support industries with long product lifecycles</span></li>\n<li class="Ms oNormal" style="color: black\; mso-margin-top-alt: auto\; mso-margin-botto m-alt: auto\; mso-list: l0 level1 lfo1\; tab-stops: list .5in\; background : white\;"><span style="font-size: 10.0pt\; font-family: 'Arial'\,sans-ser if\; letter-spacing: .3pt\;">Real-world lessons learned from the COVID-19 supply chain disruptions</span></li>\n<li class="MsoNormal" style="color: black\; mso-margin-top-alt: auto\; mso-margin-bottom-alt: auto\; mso-list: l0 level1 lfo1\; tab-stops: list .5in\; background: white\;"><span style= "font-size: 10.0pt\; font-family: 'Arial'\,sans-serif\; letter-spacing: .3 pt\;">How a long-term storage strategy can ensure a consistent supply chai n\, long-term component availability\, and avoid unnecessary waste.</span> </li>\n</ul><br /><br />Agenda: <br /><p><span style="font-size: 10.0pt\; font-family: 'Arial'\,sans-serif\; color: black\; letter-spacing: .3pt\;"> In industries where reliability and authenticity are paramount\, tradition al metrics like the &ldquo\;two-year date code&rdquo\; are no longer suffi cient. This Rochester Electronics webinar explores the evolving landscape of semiconductor traceability and its critical role in ensuring long-term reliability\, counterfeit mitigation\, and supply chain resilience.</span> </p>\n<p style="background: white\;"><span style="font-size: 10.0pt\; font -family: 'Arial'\,sans-serif\; color: black\; letter-spacing: .3pt\;">As s ilicon fabrication technology advances\, older fab processes are phased ou t. At the same time\, package obsolescence is accelerating\, creating sour cing challenges for legacy and long-lifecycle systems. Attendees will gain a deeper understanding of:</span></p>\n<p style="margin: 0in\; background : white\;"><span style="font-size: 10.0pt\; font-family: 'Arial'\,sans-ser if\; color: black\; letter-spacing: .3pt\;">Why legacy date code constrain ts are outdated and how traditional solderability tests may over-reject ac ceptable aged material.</span></p>\n<ul type="disc">\n<li class="MsoNormal " style="color: black\; mso-margin-top-alt: auto\; mso-margin-bottom-alt: auto\; mso-list: l0 level1 lfo1\; tab-stops: list .5in\; background: white \;"><span style="font-size: 10.0pt\; font-family: 'Arial'\,sans-serif\; le tter-spacing: .3pt\;">How fully authorized and traceable sources support i ndustries with long product lifecycles</span></li>\n<li class="MsoNormal" style="color: black\; mso-margin-top-alt: auto\; mso-margin-bottom-alt: au to\; mso-list: l0 level1 lfo1\; tab-stops: list .5in\; background: white\; "><span style="font-size: 10.0pt\; font-family: 'Arial'\,sans-serif\; lett er-spacing: .3pt\;">Real-world lessons learned from the COVID-19 supply ch ain disruptions</span></li>\n<li class="MsoNormal" style="color: black\; m so-margin-top-alt: auto\; mso-margin-bottom-alt: auto\; mso-list: l0 level 1 lfo1\; tab-stops: list .5in\; background: white\;"><span style="font-siz e: 10.0pt\; font-family: 'Arial'\,sans-serif\; letter-spacing: .3pt\;">How a long-term storage strategy can ensure a consistent supply chain\, long- term component availability\, and avoid unnecessary waste.</span></li>\n</ ul> END:VEVENT END:VCALENDAR