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RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3
TZNAME:EDT
END:DAYLIGHT
BEGIN:STANDARD
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TZOFFSETFROM:-0400
TZOFFSETTO:-0500
RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11
TZNAME:EST
END:STANDARD
END:VTIMEZONE
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UID:82B9AE54-A955-4B9A-9D2E-8A4DD5DE3132
DTSTART;TZID=America/New_York:20251205T090000
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DESCRIPTION:Join us for a Lunch &amp; Learn at INRS with Rohde &amp; Schwarz!\n\nDi
 scover key techniques for testing RF and microwave components using state-
 of-the-art Rohde &amp; Schwarz measurement equipment. This session will cover 
 fundamental and advanced concepts useful for students\, researchers\, and 
 engineers working in wireless systems\, electronics\, and signal processin
 g.\n\nProgram\n\n10:00 – 12:00 — Core RF Measurement Topics\n\n-\nVNA 
 architectures and measurements\n\n-\nCalibration methods\n\n-\nDe-embeddin
 g techniques\n\n12:00 – 13:30 — Lunch Break\n\n13:30 – 15:30 — Adv
 anced Applications\n\n-\nNonlinear amplifier measurements\n\n-\nNoise figu
 re measurements with a VNA\n\n-\nSignal integrity applications\n\nDon&#39;t mi
 ss this opportunity to learn from industry experts and explore cutting-edg
 e test solutions!\n\nEvent Highlights:\n\n- Attendees will get access to a
  free course material\n- Technical presentations by Rohde &amp; Schwarz\n- Ope
 n discussions on future wireless communication trends\n\nWho should attend
 :\n\n- Graduate and undergraduate students in Electrical\, Computer\, Soft
 ware Engineering.\n- Faculty and researchers working in electronics\, wire
 less communication\, RF\, and signal processing\n- Anyone interested in cu
 tting-edge communication technologies and measurement solutions\n\nCo-spon
 sored by: Staracom\, INRS\n\nSpeaker(s): Anis Ben Arfi \, Edmond Zauner \
 n\nRoom: 18\, Bldg: Bureau 6900\, INRS\, 800\, De La Gauchetière Ouest \,
  Montreal\, Quebec\, Canada\, H5A 1K6
LOCATION:Room: 18\, Bldg: Bureau 6900\, INRS\, 800\, De La Gauchetière Oue
 st \, Montreal\, Quebec\, Canada\, H5A 1K6
ORGANIZER:tarek.djerafi@inrs.ca
SEQUENCE:67
SUMMARY:Lunch &amp; Learn with Rohde &amp; Schwarz!
URL;VALUE=URI:https://events.vtools.ieee.org/m/519695
X-ALT-DESC:Description: &lt;br /&gt;&lt;p data-start=&quot;99&quot; data-end=&quot;160&quot;&gt;&lt;strong dat
 a-start=&quot;99&quot; data-end=&quot;160&quot;&gt;Join us for a Lunch &amp;amp\; Learn at INRS with 
 Rohde &amp;amp\; Schwarz!&lt;/strong&gt;&lt;/p&gt;\n&lt;p data-start=&quot;162&quot; data-end=&quot;458&quot;&gt;Dis
 cover key techniques for testing RF and microwave components using state-o
 f-the-art Rohde &amp;amp\; Schwarz measurement equipment. This session will co
 ver fundamental and advanced concepts useful for students\, researchers\, 
 and engineers working in wireless systems\, electronics\, and signal proce
 ssing.&lt;/p&gt;\n&lt;h3 data-start=&quot;460&quot; data-end=&quot;475&quot;&gt;&lt;strong data-start=&quot;464&quot; d
 ata-end=&quot;475&quot;&gt;Program&lt;/strong&gt;&lt;/h3&gt;\n&lt;p data-start=&quot;476&quot; data-end=&quot;524&quot;&gt;&lt;s
 trong data-start=&quot;476&quot; data-end=&quot;522&quot;&gt;10:00 &amp;ndash\; 12:00 &amp;mdash\; Core R
 F Measurement Topics&lt;/strong&gt;&lt;/p&gt;\n&lt;ul data-start=&quot;525&quot; data-end=&quot;615&quot;&gt;\n&lt;
 li data-start=&quot;525&quot; data-end=&quot;563&quot;&gt;\n&lt;p data-start=&quot;527&quot; data-end=&quot;563&quot;&gt;VN
 A architectures and measurements&lt;/p&gt;\n&lt;/li&gt;\n&lt;li data-start=&quot;564&quot; data-end
 =&quot;587&quot;&gt;\n&lt;p data-start=&quot;566&quot; data-end=&quot;587&quot;&gt;Calibration methods&lt;/p&gt;\n&lt;/li&gt;
 \n&lt;li data-start=&quot;588&quot; data-end=&quot;615&quot;&gt;\n&lt;p data-start=&quot;590&quot; data-end=&quot;615&quot;
 &gt;De-embedding techniques&lt;/p&gt;\n&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p data-start=&quot;617&quot; data-end=&quot;
 648&quot;&gt;&lt;strong data-start=&quot;617&quot; data-end=&quot;648&quot;&gt;12:00 &amp;ndash\; 13:30 &amp;mdash\;
  Lunch Break&amp;nbsp\;&lt;/strong&gt;&lt;/p&gt;\n&lt;p data-start=&quot;650&quot; data-end=&quot;693&quot;&gt;&lt;stro
 ng data-start=&quot;650&quot; data-end=&quot;691&quot;&gt;13:30 &amp;ndash\; 15:30 &amp;mdash\; Advanced 
 Applications&lt;/strong&gt;&lt;/p&gt;\n&lt;ul data-start=&quot;694&quot; data-end=&quot;805&quot;&gt;\n&lt;li data-
 start=&quot;694&quot; data-end=&quot;730&quot;&gt;\n&lt;p data-start=&quot;696&quot; data-end=&quot;730&quot;&gt;Nonlinear 
 amplifier measurements&lt;/p&gt;\n&lt;/li&gt;\n&lt;li data-start=&quot;731&quot; data-end=&quot;771&quot;&gt;\n&lt;
 p data-start=&quot;733&quot; data-end=&quot;771&quot;&gt;Noise figure measurements with a VNA&lt;/p&gt;
 \n&lt;/li&gt;\n&lt;li data-start=&quot;772&quot; data-end=&quot;805&quot;&gt;\n&lt;p data-start=&quot;774&quot; data-en
 d=&quot;805&quot;&gt;Signal integrity applications&lt;/p&gt;\n&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p data-start=&quot;80
 7&quot; data-end=&quot;906&quot;&gt;Don&#39;t miss this opportunity to learn from industry exper
 ts and explore cutting-edge test solutions!&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;Event Highligh
 ts:&lt;/strong&gt;&lt;/p&gt;\n&lt;ul type=&quot;disc&quot;&gt;\n&lt;li&gt;Attendees will get access to a fre
 e course material&lt;/li&gt;\n&lt;li&gt;Technical presentations by Rohde &amp;amp\; Schwar
 z&lt;/li&gt;\n&lt;li&gt;Open discussions on future wireless communication trends&lt;/li&gt;\
 n&lt;/ul&gt;\n&lt;p&gt;&lt;strong&gt;Who should attend:&lt;/strong&gt;&lt;/p&gt;\n&lt;ul type=&quot;disc&quot;&gt;\n&lt;li&gt;
 Graduate and undergraduate students in Electrical\, Computer\, Software En
 gineering.&lt;/li&gt;\n&lt;li&gt;Faculty and researchers working in electronics\, wire
 less communication\, RF\, and signal processing&lt;/li&gt;\n&lt;li&gt;Anyone intereste
 d in cutting-edge communication technologies and measurement solutions&lt;/li
 &gt;\n&lt;/ul&gt;\n&lt;p aria-hidden=&quot;true&quot;&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p
 &gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;
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