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PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
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TZID:America/Los_Angeles
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DTSTART:20260308T030000
TZOFFSETFROM:-0800
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DTSTART:20251102T010000
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DTSTAMP:20260301T014900Z
UID:63FFB871-2358-445E-91AF-5CA830C3DFAE
DTSTART;TZID=America/Los_Angeles:20260205T120000
DTEND;TZID=America/Los_Angeles:20260205T130000
DESCRIPTION:[]As uOLED and uLED technologies transition from research to hi
 gh-volume manufacturing\, system performance is increasingly constrained b
 y process variability rather than design intent. Electrical\, thermal\, an
 d mechanical decisions made during manufacturing directly translate into o
 ptical non-uniformity\, efficiency loss\, and reliability challenges. Unde
 rstanding these process-to-performance linkages is critical for building s
 calable\, high-performance emissive display systems.\n\nSpeaker(s): Pavan 
 Shivareddy\, \, \n\nVirtual: https://events.vtools.ieee.org/m/532590
LOCATION:Virtual: https://events.vtools.ieee.org/m/532590
ORGANIZER:p.wesling@ieee.org
SEQUENCE:15
SUMMARY:From Process to Performance: Challenges in uOLED and uLED Electroni
 cs Manufacturing
URL;VALUE=URI:https://events.vtools.ieee.org/m/532590
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;img style=&quot;float: right\;&quot; src=&quot;https://e
 vents.vtools.ieee.org/vtools_ui/media/display/5ff6be50-d7a8-409d-885d-c22b
 8b34e869&quot; alt=&quot;&quot; width=&quot;500&quot; height=&quot;250&quot;&gt;As uOLED and uLED technologies t
 ransition from research to high-volume manufacturing\, system performance 
 is increasingly constrained by process variability rather than design inte
 nt. Electrical\, thermal\, and mechanical decisions made during manufactur
 ing directly translate into optical non-uniformity\, efficiency loss\, and
  reliability challenges. Understanding these process-to-performance linkag
 es is critical for building scalable\, high-performance emissive display s
 ystems.&lt;/p&gt;
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