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DESCRIPTION:Abstract:\n\nAs industry is starting to deploy systems based on
  224Gbps/lane and growing pains are becoming more apparent\, AI companies 
 are clamoring already for more bandwidth. A first look at 448Gbps is alrea
 dy highlighting the enormous challenges of running even very short links o
 n copper. However\, industry doesn’t seem yet ready to throw the towel o
 n pluggable modules as gateways to optical interconnect given the risks an
 d limitations of CPO.\n\nSome of the questions that will be covered:\n\n- 
 Can we clearly articulate what are the priorities in developing the next g
 eneration of interconnect for AI?\n- What are the main obstacles to the ad
 option of short reach optics to replace the last inches of electrical conn
 ectivity?\n- What can we learn from advances in C2C and in particular by t
 he success of UCIe?\n- Does it make sense to still have pluggable modules 
 and what is the best way to do that?\n- Was LPO a success or a bust and ca
 n we move forward with it?\n- What are the promises and possible pitfalls 
 of CPO?\n\nTopics touched upon:\n\n- System level (Computing\, AI) require
 ments &amp; considerations (architectural trends\, efficiency\, bw\, latency\,
  cost etc.)\n- Optical and electrical energy efficiency considerations\n- 
 HW technology developments and limitations (interposer\, packaging\, conne
 ctors\, cables)\n- System trade offs analysis (retiming vs. linear\, vs. C
 PO)\n- Chiplets and co-packaging technology\n- Analysis of latest OIF deve
 lopment on next generation interconnect\n\nAgenda: \n\n\nRoom: GB202\, Bld
 g: Galbraith Building\, University of Toronto\, 35 St George Street\, Toro
 nto\, Ontario\, Canada
LOCATION:Room: GB202\, Bldg: Galbraith Building\, University of Toronto\, 3
 5 St George Street\, Toronto\, Ontario\, Canada
ORGANIZER:dustin.dunwell@ieee.org
SEQUENCE:38
SUMMARY:The Toronto Wireline Workshop
URL;VALUE=URI:https://events.vtools.ieee.org/m/534508
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;img src=&quot;https://events.vtools.ieee.org/v
 tools_ui/media/display/9dbb5899-2aaa-4341-89c7-15922046076e&quot; width=&quot;349&quot; h
 eight=&quot;465&quot;&gt;&lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot;&gt;Abstract
 :&lt;/span&gt;&lt;/strong&gt;&lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;As industry
  is starting to deploy systems based on 224Gbps/lane and growing pains are
  becoming more apparent\, AI companies are clamoring already for more band
 width. A first look at 448Gbps is already highlighting the enormous challe
 nges of running even very short links on copper. However\, industry doesn&amp;
 rsquo\;t seem yet ready to throw the towel on pluggable modules as gateway
 s to optical interconnect given the risks and limitations of CPO.&lt;/span&gt;&lt;/
 p&gt;\n&lt;p class=&quot;MsoNormal&quot;&gt;&lt;strong&gt;&lt;span lang=&quot;EN-US&quot;&gt;Some of the questions 
 that will be covered:&lt;/span&gt;&lt;/strong&gt;&lt;/p&gt;\n&lt;ul type=&quot;disc&quot;&gt;\n&lt;li class=&quot;m_
 1854202069958619504MsoListParagraph&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;Can we clearly art
 iculate what are the priorities in developing the next generation of inter
 connect for AI?&lt;/span&gt;&lt;/li&gt;\n&lt;li class=&quot;m_1854202069958619504MsoListParagr
 aph&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;What are the main obstacles to the adoption of sho
 rt reach optics to replace the last inches of electrical connectivity?&lt;/sp
 an&gt;&lt;/li&gt;\n&lt;li class=&quot;m_1854202069958619504MsoListParagraph&quot;&gt;&lt;span lang=&quot;EN
 -US&quot;&gt;What can we learn from advances in C2C and in particular by the succe
 ss of UCIe?&lt;/span&gt;&lt;/li&gt;\n&lt;li class=&quot;m_1854202069958619504MsoListParagraph&quot;
 &gt;&lt;span lang=&quot;EN-US&quot;&gt;Does it make sense to still have pluggable modules and
  what is the best way to do that?&lt;/span&gt;&lt;/li&gt;\n&lt;li class=&quot;m_18542020699586
 19504MsoListParagraph&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;Was LPO a success or a bust and 
 can we move forward with it?&lt;/span&gt;&lt;/li&gt;\n&lt;li class=&quot;m_1854202069958619504
 MsoListParagraph&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;What are the promises and possible pi
 tfalls of CPO?&lt;/span&gt;&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p class=&quot;MsoNormal&quot;&gt;&lt;strong&gt;&lt;span lang
 =&quot;EN-US&quot;&gt;Topics touched upon:&lt;/span&gt;&lt;/strong&gt;&lt;/p&gt;\n&lt;ul type=&quot;disc&quot;&gt;\n&lt;li c
 lass=&quot;m_1854202069958619504MsoListParagraph&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;System lev
 el (Computing\, AI) requirements &amp;amp\; considerations (architectural tren
 ds\, efficiency\, bw\, latency\, cost etc.)&lt;/span&gt;&lt;/li&gt;\n&lt;li class=&quot;m_1854
 202069958619504MsoListParagraph&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;Optical and electrical
  energy efficiency considerations&lt;/span&gt;&lt;/li&gt;\n&lt;li class=&quot;m_18542020699586
 19504MsoListParagraph&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;HW technology developments and l
 imitations (interposer\, packaging\, connectors\, cables)&lt;/span&gt;&lt;/li&gt;\n&lt;li
  class=&quot;m_1854202069958619504MsoListParagraph&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;System t
 rade offs analysis (retiming vs. linear\, vs. CPO)&lt;/span&gt;&lt;/li&gt;\n&lt;li class=
 &quot;m_1854202069958619504MsoListParagraph&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;Chiplets and co
 -packaging technology&lt;/span&gt;&lt;/li&gt;\n&lt;li class=&quot;m_1854202069958619504MsoList
 Paragraph&quot;&gt;&lt;span lang=&quot;EN-US&quot;&gt;Analysis of latest OIF development on next g
 eneration interconnect&lt;/span&gt;&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agend
 a: &lt;br /&gt;&lt;p&gt;&lt;img src=&quot;https://events.vtools.ieee.org/vtools_ui/media/displ
 ay/0ac13c6b-b3a0-4862-94f3-9d0e9912aa22&quot; width=&quot;360&quot; height=&quot;480&quot;&gt;&lt;/p&gt;
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