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DTSTART:20260308T030000
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DTSTART:20251102T010000
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DTSTAMP:20260313T152008Z
UID:32F6CEA3-3BF8-4D29-A50F-16FDE684C363
DTSTART;TZID=America/New_York:20260304T190000
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DESCRIPTION:The subject of this presentation is the progress and status of 
 Prognostics and Health Management (PHM) for Electronics Systems related st
 andards at the IEEE Reliability Society Standards Committee (RS-SC).\n\nTh
 ere will be a discussion on the overall status of standards developed by t
 he IEEE RS-SC as well as a deep dive into standards related to PHM\, such 
 as IEEE 1856 “Standard Framework for Prognostic and Health Management of
  Electronic Systems”\, which stands as the first top tiered normative st
 andard applicable to PHM system development. The PHM system development wi
 ll include PHM systems designed into newly designed primary systems\, stan
 d-alone PHM systems applicable to multiple applications\, and PHM system c
 apabilities added to existing primary systems. Other PHM standards develop
 ed by IEEE external to the RS-SC\, such as P2848 and IEEE2851-2024\, will 
 be mentioned. PHM standards developed by Standards Development Organizatio
 ns (SDOs) external to IEEE\, such as the SAE\, will also be included in th
 is discussion.\n\nSpeaker(s): \, \, \n\nVirtual: https://events.vtools.iee
 e.org/m/540622
LOCATION:Virtual: https://events.vtools.ieee.org/m/540622
ORGANIZER:mazurowski@ieee.org
SEQUENCE:24
SUMMARY:IEEE PHM Standards Development Status and Collaboration with other 
 IEEE WGs and with SAE
URL;VALUE=URI:https://events.vtools.ieee.org/m/540622
X-ALT-DESC:Description: &lt;br /&gt;&lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: justi
 fy\;&quot;&gt;&lt;span style=&quot;font-size: 14.0pt\;&quot;&gt;The subject of this presentation i
 s the progress and status of &lt;strong&gt;&lt;span style=&quot;color: rgb(35\, 111\, 16
 1)\;&quot;&gt;Prognostics and Health Management (PHM) for Electronics Systems&lt;/spa
 n&gt;&lt;/strong&gt; related standards at the &lt;span style=&quot;color: rgb(35\, 111\, 16
 1)\;&quot;&gt;&lt;strong&gt;IEEE Reliability Society Standards Committee (RS-SC)&lt;/strong
 &gt;&lt;/span&gt;.&lt;span style=&quot;mso-spacerun: yes\;&quot;&gt;&amp;nbsp\; &lt;/span&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p 
 class=&quot;MsoNormal&quot; style=&quot;text-align: justify\;&quot;&gt;&lt;span style=&quot;font-size: 14
 .0pt\;&quot;&gt;There will be a discussion on the overall status of standards deve
 loped by the IEEE RS-SC as well as a deep dive into standards related to P
 HM\, such as IEEE 1856 &amp;ldquo\;&lt;strong&gt;&lt;span style=&quot;color: rgb(35\, 111\, 
 161)\;&quot;&gt;Standard Framework for Prognostic and Health Management of Electro
 nic Systems&lt;/span&gt;&lt;/strong&gt;&amp;rdquo\;\, which stands as the first top tiered
  normative standard applicable to PHM system development. The PHM system d
 evelopment will include PHM systems designed into newly designed primary s
 ystems\, stand-alone PHM systems applicable to multiple applications\, and
  PHM system capabilities added to existing primary systems. Other PHM stan
 dards developed by IEEE external to the RS-SC\, such as P2848 and IEEE2851
 -2024\, will be mentioned. PHM standards developed by Standards Developmen
 t Organizations (SDOs) external to IEEE\, such as the SAE\, will also be i
 ncluded in this discussion.&lt;/span&gt;&lt;/p&gt;
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