BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/Denver BEGIN:DAYLIGHT DTSTART:20110313T030000 TZOFFSETFROM:-0700 TZOFFSETTO:-0600 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:MDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20111106T010000 TZOFFSETFROM:-0600 TZOFFSETTO:-0700 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:MST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20120404T154039Z UID:4754D0CA-8C4A-102E-A426-0050568D3657 DTSTART;TZID=America/Denver:20110425T121500 DTEND;TZID=America/Denver:20110425T133000 DESCRIPTION:Prof. Juin J. Liou \, Distinguished Professor and speaker\, and IEEE fellow\, will be presenting a talk on "ESD protection Circuits" at U CCS under IEEE Pikes peak chapter CAS/ED on April 25th\, 12.15 to 1.30 PM. No Admission Charge. Electrostatic discharge (ESD) is one of the most pre valent threats to electronic components. It is an event in which a finite amount of charge is transferred from one object (i.e.\, human body) to the other (i.e.\, microchip). This process can result in a very high current passing through the microchip within a very short period of time\, and mor e than 35% of chip damages can be attributed to such an event. As such\, d esigning on-chip ESD structures to protect microchips against the ESD stre ss is a high priority in the semiconductor industry. The continuing scalin g of CMOS technology makes the ESD-induced failures even more prominent\, and one can predict with certainty that the availability of effective and robust ESD protection solutions will become a critical and essential compo nent to the successful advancement and commercialization of the next-gener ation CMOS technology. An overview on the ESD sources\, models\, protectio n schemes\, and testing will first be given in this talk. This is followed by the discussions of the challenges for designing and realizing ESD prot ection solutions in modern and next-generation integrated circuits. ****** Biography of Dr. Juin J. Liou ****** Dr. Juin J. Liou received the B.S. ( honors)\, M.S.\, and Ph.D. degrees in electrical engineering from the Univ ersity of Florida\, Gainesville\, in 1982\, 1983\, and 1987\, respectively . In 1987\, he joined the Department of Electrical and Computer Engineerin g at the University of Central Florida (UCF)\, Orlando\, Florida where he is now the Pegasus Distinguished Professor and UCF-Analog Devices Fellow. His current research interests are Micro/nanoelectronics computer-aided de sign\, RF device modeling and simulation\, and electrostatic discharge (ES D) protection design and simulation. Dr. Liou holds 6 U.S. patents (2 more filed and pending)\, and has published 8 books (another in preparation)\, more than 240 journal papers (including 14 invited articles)\, and more t han 180 papers (including 72 keynote or invited papers) in international a nd national conference proceedings. He has been awarded more than $10.0 mi llion of research contracts and grants from federal agencies (i.e.\, NSF\, DARPA\, Navy\, Air Force\, NASA\, NIST)\, state government\, and industry (i.e.\, Semiconductor Research Corp.\, Intel Corp.\, Intersil Corp.\, Luc ent Technologies\, Alcatel Space\, Conexant Systems\, Texas Instruments\, Fairchild Semiconductor\, National Semiconductor\, Analog Devices\, RF Mic ro Device\, Lockheed Martin)\, and has held consulting positions with rese arch laboratories and companies in the United States\, China\, Japan\, Tai wan\, and Singapore. In addition\, Dr. Liou serves as a technical reviewer for various journals and publishers\, general chair or technical program chair for a large number of international conferences\, and regional edito r (in USA\, Canada and South America) for the Microelectronics Reliability journal. Dr. Liou received ten different awards on excellence in teaching and research from the University of Central Florida (UCF) and six differe nt awards from the IEEE Electron Device Society. Among them\, he was award ed the UCF Pegasus Distinguished Professor (2009) – the highest hon or bestowed to a faculty member at UCF\, UCF Distinguished Researcher Awar d (four times: 1992\, 1998\, 2002\, 2009)\, UCF Research Incentive Award ( two times: 2000\, 2005)\, UCF Trustee Chair Professor (2002)\, and IEEE Jo seph M. Biedenbach Outstanding Engineering Educator Award in 2004 for his exemplary teaching\, research\, and international collaboration. His other honors are Fellow of IEEE\, Fellow of IET\, Fellow of Singapore Institute of Manufacturing Technology\, Fellow of UCF-Analog Devices\, Distinguishe d Lecturer of IEEE Electron Device Society (EDS)\, and Distinguished Lectu rer of National Science Council. He holds several honorary professorships\ , including Chang Jiang Scholar Endowed Professor of Ministry of Education \, China – the highest honorary professorship in China\, NSVL Disti nguished Professor of National Semiconductor Corp.\, USA\, Chang Gung Endo wed Professor of Chang Gung University\, Taiwan\, Feng Chia Endowed Profes sor of Feng Chia University\, Taiwan\, Chunhui Eminent Scholar of Peking U niversity\, China\, Cao Guang-Biao Endowed Professor of Zhejiang Universit y\, China\, Honorary Professor of Xidian University\, China\, Consultant P rofessor of Huazhong University of Science and Technology\, China\, and Co urtesy Professor of Shanghai Jiao Tong University\, China. Dr. Liou was a recipient of U.S. Air Force Fellowship Award and National University Singa pore Fellowship Award. Dr. Liou served as the IEEE EDS Vice-President for Regions/Chapters\, IEEE EDS Treasurer\, IEEE EDS Finance Committee Chair\, IEEE EDS Administrative Committee Elected Member\, and IEEE EDS Education al Activities Committee Member.\n\nSpeaker(s): \, \, \, \n\nBldg: ENG 105\ , Engineering Building\, 1420 Austin Bluffs Pkwy\, Colorado Springs\, Univ ersity of Colorado at Colorado Springs\, Colorado Springs\, Colorado\, Uni ted States\, 80918 LOCATION:Bldg: ENG 105\, Engineering Building\, 1420 Austin Bluffs Pkwy\, C olorado Springs\, University of Colorado at Colorado Springs\, Colorado Sp rings\, Colorado\, United States\, 80918 ORGANIZER:y.yang@ieee.org SEQUENCE:1 SUMMARY:Outlook and Challenge in Electrostatic Discharge (ESD) Protection o f Modern and Future Integrated Circuits URL;VALUE=URI:https://events.vtools.ieee.org/m/5435 X-ALT-DESC:Description: <br /> Prof. Juin J. Liou \, Distinguished Profe ssor and speaker\, and IEEE fellow\, will be presenting a talk on "ESD pro tection Circuits" at UCCS under IEEE Pikes peak chapter CAS/ED on April 25 th\, 12.15 to 1.30 PM. No Admission Charge.\n\n Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. It i s an event in which a finite amount of charge is transferred from one obje ct (i.e.\, human body) to the other (i.e.\, microchip). This process can r esult in a very high current passing through the microchip within a very s hort period of time\, and more than 35% of chip damages can be attributed to such an event. As such\, designing on-chip ESD structures to protect m icrochips against the ESD stress is a high priority in the semiconductor i ndustry. The continuing scaling of CMOS technology makes the ESD-induced f ailures even more prominent\, and one can predict with certainty that the availability of effective and robust ESD protection solutions will become a critical and essential component to the successful advancement and comme rcialization of the next-generation CMOS technology.\n\n An overview on the ESD sources\, models\, protection schemes\, and testing will first be given in this talk. This is followed by the discussions of the challenges for designing and realizing ESD protection solutions in modern and next-g eneration integrated circuits.\n\n****** Biography of Dr. Juin J. Liou *** *** \n \n Dr. Juin J. Liou received the B.S. (honors)\, M.S.\, and P h.D. degrees in electrical engineering from the University of Florida\, Ga inesville\, in 1982\, 1983\, and 1987\, respectively. In 1987\, he joined the Department of Electrical and Computer Engineering at the University of Central Florida (UCF)\, Orlando\, Florida where he is now the Pegasus Dis tinguished Professor and UCF-Analog Devices Fellow. His current research i nterests are Micro/nanoelectronics computer-aided design\, RF device model ing and simulation\, and electrostatic discharge (ESD) protection design a nd simulation.\n \n Dr. Liou holds 6 U.S. patents (2 more filed and pending)\, and has published 8 books (another in preparation)\, more than 240 journal papers (including 14 invited articles)\, and more than 180 pap ers (including 72 keynote or invited papers) in international and national conference proceedings. He has been awarded more than $10.0 million of re search contracts and grants from federal agencies (i.e.\, NSF\, DARPA\, Na vy\, Air Force\, NASA\, NIST)\, state government\, and industry (i.e.\, Se miconductor Research Corp.\, Intel Corp.\, Intersil Corp.\, Lucent Technol ogies\, Alcatel Space\, Conexant Systems\, Texas Instruments\, Fairchild S emiconductor\, National Semiconductor\, Analog Devices\, RF Micro Device\, Lockheed Martin)\, and has held consulting positions with research labora tories and companies in the United States\, China\, Japan\, Taiwan\, and S ingapore. In addition\, Dr. Liou serves as a technical reviewer for vario us journals and publishers\, general chair or technical program chair for a large number of international conferences\, and regional editor (in USA\ , Canada and South America) for the Microelectronics Reliability journal.\ n \n Dr. Liou received ten different awards on excellence in teachin g and research from the University of Central Florida (UCF) and six differ ent awards from the IEEE Electron Device Society. Among them\, he was awar ded the UCF Pegasus Distinguished Professor (2009) – the highest ho nor bestowed to a faculty member at UCF\, UCF Distinguished Researcher Awa rd (four times: 1992\, 1998\, 2002\, 2009)\, UCF Research Incentive Award (two times: 2000\, 2005)\, UCF Trustee Chair Professor (2002)\, and IEEE J oseph M. Biedenbach Outstanding Engineering Educator Award in 2004 for his exemplary teaching\, research\, and international collaboration. His othe r honors are Fellow of IEEE\, Fellow of IET\, Fellow of Singapore Institut e of Manufacturing Technology\, Fellow of UCF-Analog Devices\, Distinguish ed Lecturer of IEEE Electron Device Society (EDS)\, and Distinguished Lect urer of National Science Council. He holds several honorary professorships \, including Chang Jiang Scholar Endowed Professor of Ministry of Educatio n\, China – the highest honorary professorship in China\, NSVL Dist inguished Professor of National Semiconductor Corp.\, USA\, Chang Gung End owed Professor of Chang Gung University\, Taiwan\, Feng Chia Endowed Profe ssor of Feng Chia University\, Taiwan\, Chunhui Eminent Scholar of Peking University\, China\, Cao Guang-Biao Endowed Professor of Zhejiang Universi ty\, China\, Honorary Professor of Xidian University\, China\, Consultant Professor of Huazhong University of Science and Technology\, China\, and C ourtesy Professor of Shanghai Jiao Tong University\, China. Dr. Liou was a recipient of U.S. Air Force Fellowship Award and National University Sing apore Fellowship Award.\n\n Dr. Liou served as the IEEE EDS Vice-Presid ent for Regions/Chapters\, IEEE EDS Treasurer\, IEEE EDS Finance Committee Chair\, IEEE EDS Administrative Committee Elected Member\, and IEEE EDS E ducational Activities Committee Member.\n\n END:VEVENT END:VCALENDAR