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DESCRIPTION:Overview\n\nWebinar EDS SCV/SF event\, Topic: &quot;A device to circ
 uit framework for BTI\, HCD aging &quot;\, Presenter: Dr. Souvik Mahapatra\n\n&quot;
 A device to circuit framework for BTI\, HCD aging&quot; Lecture by Dr. Souvik M
 ahapatra\n\nThe Electron Devices Society Santa Clara Valley/San Francisco 
 joint Chapter and Device Reliability Physics committee are hosting Dr. Sou
 vik Mahapatra.\n\nWhen: Friday\, March 20th\, 2026 – 11:45AM to 1:15PM (
 PDT)\n\n11:45AM - 12PM: Introduction\n\n12PM-12:45PM: Lecture\n\n12:45PM-1
 2:55PM: Q&amp;A\n\n1PM Adjourn\n\nWhere: Zoom\n\nZoom\n\nJoin Zoom Meeting:\nh
 ttps://us06web.zoom.us/j/86948608699?pwd=sDcIAavzNqtsSSpFw4T46sb9f331od.1\
 n\nMeeting ID: 869 4860 8699\nPasscode: 506028\n\n—\n\nOne tap mobile\n+
 16694449171\,\,86948608699#\,\,\,\,*506028# US\n+12532158782\,\,8694860869
 9#\,\,\,\,*506028# US (Tacoma)\n\nJoin instructions\nhttps://us06web.zoom.
 us/meetings/86948608699/invitations?signature=u7Zd4xYAj-EoKdgIHXfc2f3mSFDM
 Z6U2UJrR7D8OKN8\n\nContact: ieeescveds at gmail.com\n\nSpeaker: Dr. Souvik
  Mahapatra\n\nAbstract:\n\nThe benefit of performance gain per power is sh
 rinking at advanced technology nodes. Several factors are responsible for 
 this - including increased thermals\, parasitics and aging issues. The tra
 ditional approach of treating aging as an afterthought with blanket guardb
 anding requires careful attention. In this talk we will propose a physics 
 based device aging framework and its implementation in a circuit aging sim
 ulation platform. The framework can handle circuit aging under actual miss
 ion profiles (input activity and turbo-throttle conditions). Several possi
 ble approaches towards realistic / functional input based aging aware desi
 gn modifications will be explored.\n\nVirtual: https://events.vtools.ieee.
 org/m/546751
LOCATION:Virtual: https://events.vtools.ieee.org/m/546751
ORGANIZER:ieeescveds@gmail.com
SEQUENCE:7
SUMMARY:IEEE EDS Webinar: A device to circuit framework for BTI\, HCD aging
URL;VALUE=URI:https://events.vtools.ieee.org/m/546751
X-ALT-DESC:Description: &lt;br /&gt;&lt;div class=&quot;Overview_title__FO2Z4&quot;&gt;Overview&lt;/
 div&gt;\n&lt;div class=&quot;Overview_summaryWrapper__xGQx4&quot;&gt;&amp;nbsp\;&lt;/div&gt;\n&lt;div clas
 s=&quot;AboutThisEventEmbedded_container__wdFiD&quot;&gt;\n&lt;div class=&quot;StructuredModule
 Renderer_structuredContent__k7mNB StructuredModuleRenderer_text__GaXOv&quot; da
 ta-testid=&quot;text-content&quot;&gt;\n&lt;div&gt;\n&lt;p&gt;Webinar EDS SCV/SF event\, Topic: &quot;A 
 device to circuit framework for BTI\, HCD aging &quot;\, Presenter: Dr. Souvik 
 Mahapatra&lt;/p&gt;\n&lt;/div&gt;\n&lt;/div&gt;\n&lt;div class=&quot;StructuredModuleRenderer_struct
 uredContent__k7mNB StructuredModuleRenderer_text__GaXOv&quot; data-testid=&quot;text
 -content&quot;&gt;\n&lt;p&gt;&lt;strong&gt;&quot;A device to circuit framework for BTI\, HCD aging&quot;
  Lecture by Dr.&lt;/strong&gt;&lt;strong&gt;&amp;nbsp\;&lt;/strong&gt;&lt;strong&gt;Souvik Mahapatra&lt;/
 strong&gt;&lt;/p&gt;\n&lt;h3&gt;&amp;nbsp\;&lt;/h3&gt;\n&lt;p&gt;The Electron Devices Society Santa Clara
  Valley/San Francisco joint Chapter and &lt;span class=&quot;organizer-info__name-
 link&quot;&gt;Device Reliability Physics committee are &lt;/span&gt;hosting Dr. Souvik M
 ahapatra.&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;h3&gt;When: Friday\, March 20th\, 2026 &amp;ndash
 \; 11:45AM to 1:15PM (PDT)&lt;/h3&gt;\n&lt;p&gt;11:45AM - 12PM: Introduction&lt;/p&gt;\n&lt;p&gt;1
 2PM-12:45PM: Lecture&lt;/p&gt;\n&lt;p&gt;12:45PM-12:55PM: Q&amp;amp\;A&lt;/p&gt;\n&lt;p&gt;1PM Adjourn
 &lt;/p&gt;\n&lt;h3&gt;Where: Zoom&lt;/h3&gt;\n&lt;h2 class=&quot;event-title css-0&quot;&gt;Zoom&lt;/h2&gt;\n&lt;p&gt;Jo
 in Zoom Meeting:&lt;br&gt;https://us06web.zoom.us/j/86948608699?pwd=sDcIAavzNqts
 SSpFw4T46sb9f331od.1&lt;/p&gt;\n&lt;p&gt;Meeting ID: 869 4860 8699&lt;br&gt;Passcode: 506028
 &lt;/p&gt;\n&lt;p&gt;&amp;mdash\;&lt;/p&gt;\n&lt;p&gt;One tap mobile&lt;br&gt;+16694449171\,\,86948608699#\,
 \,\,\,*506028# US&lt;br&gt;+12532158782\,\,86948608699#\,\,\,\,*506028# US (Taco
 ma)&lt;/p&gt;\n&lt;p&gt;Join instructions&lt;br&gt;https://us06web.zoom.us/meetings/86948608
 699/invitations?signature=u7Zd4xYAj-EoKdgIHXfc2f3mSFDMZ6U2UJrR7D8OKN8&lt;/p&gt;\
 n&lt;h4&gt;Contact: ieeescveds at gmail.com&lt;/h4&gt;\n&lt;h2&gt;&amp;nbsp\;&lt;/h2&gt;\n&lt;h2&gt;&lt;strong&gt;
 Speaker: Dr.&amp;nbsp\;&lt;/strong&gt;&lt;strong&gt;Souvik Mahapatra&lt;/strong&gt;&lt;/h2&gt;\n&lt;h3&gt;Ab
 stract:&lt;/h3&gt;\n&lt;p&gt;The benefit of performance gain per power is shrinking at
  advanced technology nodes. Several factors are responsible for this - inc
 luding increased thermals\, parasitics and aging issues. The traditional a
 pproach of treating aging as an afterthought with blanket guardbanding req
 uires careful attention. In this talk we will propose a physics based devi
 ce aging framework and its implementation in a circuit aging simulation pl
 atform. The framework can handle circuit aging under actual mission profil
 es (input activity and turbo-throttle conditions). Several possible approa
 ches towards realistic / functional input based aging aware design modific
 ations will be explored.&lt;/p&gt;\n&lt;/div&gt;\n&lt;/div&gt;
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