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DTSTART:20260329T020000
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DTSTAMP:20260319T143435Z
UID:4FE23C86-40B1-4C29-9690-D7955B8EC7AE
DTSTART;TZID=Europe/London:20260331T140000
DTEND;TZID=Europe/London:20260331T153000
DESCRIPTION:With the scaling of supply voltages\, sub-1V bandgap references
  are increasingly essential. This tutorial reviews modern architectures an
 d digital designs\, specifically addressing op-amp challenges like limited
  headroom and temperature-variant biasing. It provides a deep dive into se
 lf-bias loop dynamics and offers rigorous guidelines for mitigating system
 atic offset. Additionally\, the session covers chopping techniques for ran
 dom offset and concludes with robust startup circuit design tailored to th
 e unique constraints of self-bias loops.\n\nCo-sponsored by: N/A\n\nSpeake
 r(s): Dr. Rajasekhar\n\nRoom: SE 2.02\, Bldg: King’s College London\, Bu
 sh House (SE) 2.02\, Strand Campus\, Strand Campus\, London\, England\, Un
 ited Kingdom\, WC2R 2LS\, Virtual: https://events.vtools.ieee.org/m/549623
LOCATION:Room: SE 2.02\, Bldg: King’s College London\, Bush House (SE) 2.
 02\, Strand Campus\, Strand Campus\, London\, England\, United Kingdom\, W
 C2R 2LS\, Virtual: https://events.vtools.ieee.org/m/549623
ORGANIZER:tan.peng@kcl.ac.uk
SEQUENCE:48
SUMMARY:Systematic Design of Bandgap Reference Circuit with Emphasis on Sel
 f-bias Loop Dynamics
URL;VALUE=URI:https://events.vtools.ieee.org/m/549623
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;font-size: 11.0p
 t\; line-height: 115%\; font-family: &#39;Cambria&#39;\,serif\; mso-ascii-theme-fo
 nt: minor-latin\; mso-fareast-font-family: &#39;MS Mincho&#39;\; mso-fareast-theme
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 amily: &#39;Times New Roman&#39;\; mso-bidi-theme-font: minor-bidi\; mso-ansi-lang
 uage: EN-US\; mso-fareast-language: EN-US\; mso-bidi-language: AR-SA\;&quot;&gt;Wi
 th the scaling of supply voltages\, sub-1V bandgap references are increasi
 ngly essential. This tutorial reviews modern architectures and digital des
 igns\, specifically addressing op-amp challenges like limited headroom and
  temperature-variant biasing. It provides a deep dive into self-bias loop 
 dynamics&lt;/span&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;font-size: 11.0pt\; line-height: 
 115%\; font-family: &#39;Cambria&#39;\,serif\; mso-ascii-theme-font: minor-latin\;
  mso-fareast-font-family: SimSun\; mso-hansi-theme-font: minor-latin\; mso
 -bidi-font-family: &#39;Times New Roman&#39;\; mso-bidi-theme-font: minor-bidi\; m
 so-ansi-language: EN-US\; mso-fareast-language: ZH-CN\; mso-bidi-language:
  AR-SA\;&quot;&gt; &lt;/span&gt;&lt;span lang=&quot;EN-US&quot; style=&quot;font-size: 11.0pt\; line-heigh
 t: 115%\; font-family: &#39;Cambria&#39;\,serif\; mso-ascii-theme-font: minor-lati
 n\; mso-fareast-font-family: &#39;MS Mincho&#39;\; mso-fareast-theme-font: minor-f
 areast\; mso-hansi-theme-font: minor-latin\; mso-bidi-font-family: &#39;Times 
 New Roman&#39;\; mso-bidi-theme-font: minor-bidi\; mso-ansi-language: EN-US\; 
 mso-fareast-language: EN-US\; mso-bidi-language: AR-SA\;&quot;&gt;and offers rigor
 ous guidelines for mitigating systematic offset. Additionally\, the sessio
 n covers chopping techniques for random offset and concludes with robust s
 tartup circuit design tailored to the unique constraints of self-bias loop
 s.&lt;/span&gt;&lt;/p&gt;
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