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DTSTART:20260308T030000
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DTSTART:20261101T010000
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BEGIN:VEVENT
DTSTAMP:20260509T140033Z
UID:707B4762-0967-4CED-8915-B8A5ACFF68B5
DTSTART;TZID=America/New_York:20260508T180000
DTEND;TZID=America/New_York:20260508T200000
DESCRIPTION:Modern Vector Network Analyzers (VNAs) have flexible hardware a
 nd software with much higher performance than VNAs of even a few years ago
 . Modern VNAs address a wide range of applications\, and current versions 
 can address almost every type of RF measurement. This talk will detail the
  evolution of Network Analyzers from their early implementation as fast po
 wer meters to the advanced component test systems they are today. We will 
 take a look at the advanced technology inside that allows VNA to achieve s
 upreme accuracy not only in S-parameter measurements\, but in nearly all a
 reas of characterization including Noise Figure\, TOI\, Modulation/Distort
 ion\, Spectrum Analysis and Active Device characterization.\n\n[]\n\nSpeak
 er(s): \, Joel\n\nAgenda: \n- 6 pm to 6h15 pm: Welcome\n- 6h15 pm to 7 pm:
  Presentation\n- 7 pm to 7h15 pm: Q&amp;A\n- 7h15 pm to 8pm: Dinner and Netwok
 ing\n\nRoom: IEEE Room\, Post Office Pub: Rte. 140 &amp; Ray Street \, Grafton
 \, Massachusetts\, United States\, 01536
LOCATION:Room: IEEE Room\, Post Office Pub: Rte. 140 &amp; Ray Street \, Grafto
 n\, Massachusetts\, United States\, 01536
ORGANIZER:simoussa@ieee.org
SEQUENCE:34
SUMMARY:Modern Methods for Component Measurements using Vector Network Anal
 yzers
URL;VALUE=URI:https://events.vtools.ieee.org/m/552918
X-ALT-DESC:Description: &lt;br /&gt;&lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: justi
 fy\; tab-stops: 436.5pt\;&quot;&gt;&lt;span style=&quot;mso-bidi-font-size: 12.0pt\;&quot;&gt;Mode
 rn Vector Network Analyzers (VNAs) have flexible hardware and software wit
 h much higher performance than VNAs of even a few years ago. Modern VNAs a
 ddress a wide range of applications\, and current versions can address alm
 ost every type of RF measurement.&lt;span style=&quot;mso-spacerun: yes\;&quot;&gt;&amp;nbsp\;
  &lt;/span&gt;This talk will detail the evolution of Network Analyzers from thei
 r early implementation as fast power meters to the advanced component test
  systems they are today.&lt;span style=&quot;mso-spacerun: yes\;&quot;&gt;&amp;nbsp\; &lt;/span&gt;W
 e will take a look at the advanced technology inside that allows VNA to ac
 hieve supreme accuracy not only in S-parameter measurements\, but in nearl
 y all areas of characterization including Noise Figure\, TOI\, Modulation/
 Distortion\, Spectrum Analysis and Active Device characterization.&lt;/span&gt;&lt;
 /p&gt;\n&lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: justify\; tab-stops: 436.5pt\
 ;&quot;&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p class=&quot;MsoNormal&quot; style=&quot;text-align: justify\; tab-stop
 s: 436.5pt\;&quot;&gt;&lt;span style=&quot;mso-bidi-font-size: 12.0pt\;&quot;&gt;&lt;span style=&quot;mso-
 spacerun: yes\;&quot;&gt;&amp;nbsp\;&lt;img src=&quot;https://events.vtools.ieee.org/vtools_ui
 /media/display/47e28578-6de3-4615-a865-964e151a34cc&quot; alt=&quot;&quot; width=&quot;629&quot; he
 ight=&quot;629&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;/span&gt;&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;ul&gt;\n&lt;li&gt;6 
 pm to 6h15 pm: Welcome&amp;nbsp\;&lt;/li&gt;\n&lt;li&gt;6h15 pm to 7 pm: Presentation&lt;/li&gt;
 \n&lt;li&gt;7 pm to 7h15 pm: Q&amp;amp\;A&lt;/li&gt;\n&lt;li&gt;7h15 pm to 8pm: Dinner and Netwo
 king&lt;/li&gt;\n&lt;/ul&gt;
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