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PRODID:IEEE vTools.Events//EN
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TZID:America/Sao_Paulo
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DTSTART:20380119T001407
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DTSTART:20190216T230000
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BEGIN:VEVENT
DTSTAMP:20260421T020952Z
UID:D29F66F3-8578-425F-BDA9-D6791C252710
DTSTART;TZID=America/Sao_Paulo:20251003T214500
DTEND;TZID=America/Sao_Paulo:20251003T234500
DESCRIPTION:This report summarizes an outreach activity carried out during 
 the Freshman Week of the Computer Science program\, organized in collabora
 tion with our IEEE Microwave Theory and Techniques Society Student Chapter
  at University of Campinas.\n\nThe event featured a technical lecture enti
 tled “Introduction to Radiation-Tolerant Electronic Devices”\, deliver
 ed by Vinicius Vono Peruzzi\, a researcher at CTI Renato Archer. The lectu
 re introduced fundamental concepts related to the effects of ionizing radi
 ation on electronic devices and strategies for developing radiation-tolera
 nt systems\, providing valuable insights to incoming students.\n\nIn addit
 ion to the technical content\, the event provided an opportunity to presen
 t the activities and mission of the IEEE MTT-S Student Chapter at UNICAMP.
  New students were introduced to the benefits of IEEE membership\, ongoing
  initiatives\, and opportunities for involvement in technical and academic
  activities.\n\nThis initiative contributed to early student engagement\, 
 promoted awareness of advanced topics in electronics\, and strengthened th
 e visibility of IEEE MTT-S within the university community.\n\nCampinas\, 
 Sao Paulo\, Brazil
LOCATION:Campinas\, Sao Paulo\, Brazil
ORGANIZER:allan137@decom.fee.unicamp.br
SEQUENCE:9
SUMMARY:Freshman Week Event SECOMP2025: Introduction to Radiation-Tolerant 
 Electronic Devices and IEEE MTT-S Activities
URL;VALUE=URI:https://events.vtools.ieee.org/m/556301
X-ALT-DESC:Description: &lt;br /&gt;&lt;p data-start=&quot;247&quot; data-end=&quot;492&quot;&gt;This repor
 t summarizes an outreach activity carried out during the Freshman Week of 
 the Computer Science program\, organized in collaboration with our &lt;span c
 lass=&quot;hover:entity-accent entity-underline inline cursor-pointer align-bas
 eline&quot;&gt;&lt;span class=&quot;whitespace-normal&quot;&gt;IEEE Microwave Theory and Technique
 s Society&lt;/span&gt;&lt;/span&gt; Student Chapter at &lt;span class=&quot;hover:entity-accen
 t entity-underline inline cursor-pointer align-baseline&quot;&gt;&lt;span class=&quot;whit
 espace-normal&quot;&gt;University of Campinas&lt;/span&gt;&lt;/span&gt;.&lt;/p&gt;\n&lt;p data-start=&quot;4
 94&quot; data-end=&quot;926&quot;&gt;The event featured a technical lecture entitled &lt;em dat
 a-start=&quot;542&quot; data-end=&quot;599&quot;&gt;&amp;ldquo\;Introduction to Radiation-Tolerant El
 ectronic Devices&amp;rdquo\;&lt;/em&gt;\, delivered by &lt;span class=&quot;hover:entity-acc
 ent entity-underline inline cursor-pointer align-baseline&quot;&gt;&lt;span class=&quot;wh
 itespace-normal&quot;&gt;Vinicius Vono Peruzzi&lt;/span&gt;&lt;/span&gt;\, a researcher at &lt;sp
 an class=&quot;hover:entity-accent entity-underline inline cursor-pointer align
 -baseline&quot;&gt;&lt;span class=&quot;whitespace-normal&quot;&gt;CTI Renato Archer&lt;/span&gt;&lt;/span&gt;
 . The lecture introduced fundamental concepts related to the effects of io
 nizing radiation on electronic devices and strategies for developing radia
 tion-tolerant systems\, providing valuable insights to incoming students.&lt;
 /p&gt;\n&lt;p data-start=&quot;928&quot; data-end=&quot;1241&quot;&gt;In addition to the technical cont
 ent\, the event provided an opportunity to present the activities and miss
 ion of the IEEE MTT-S Student Chapter at UNICAMP. New students were introd
 uced to the benefits of IEEE membership\, ongoing initiatives\, and opport
 unities for involvement in technical and academic activities.&lt;/p&gt;\n&lt;p data
 -start=&quot;1243&quot; data-end=&quot;1432&quot;&gt;This initiative contributed to early student
  engagement\, promoted awareness of advanced topics in electronics\, and s
 trengthened the visibility of IEEE MTT-S within the university community.&lt;
 /p&gt;\n&lt;p data-start=&quot;1243&quot; data-end=&quot;1432&quot;&gt;&lt;img src=&quot;https://events.vtools.
 ieee.org/vtools_ui/media/display/4a70e76d-5c8e-4194-99a1-e4e4af9a1998&quot;&gt;&lt;im
 g src=&quot;https://events.vtools.ieee.org/vtools_ui/media/display/98da67cb-a42
 e-4acb-80c7-cd48cd6a3967&quot;&gt;&lt;img src=&quot;https://events.vtools.ieee.org/vtools_
 ui/media/display/1547dfd2-8a41-470a-b1e3-9705fc488451&quot;&gt;&lt;img src=&quot;https://e
 vents.vtools.ieee.org/vtools_ui/media/display/af3486ac-1f93-49a4-8165-ab49
 9894e375&quot;&gt;&lt;/p&gt;\n&lt;p data-start=&quot;1243&quot; data-end=&quot;1432&quot;&gt;&amp;nbsp\;&lt;/p&gt;
END:VEVENT
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