BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/Los_Angeles BEGIN:DAYLIGHT DTSTART:20260308T030000 TZOFFSETFROM:-0800 TZOFFSETTO:-0700 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:PDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20261101T010000 TZOFFSETFROM:-0700 TZOFFSETTO:-0800 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:PST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20260430T133817Z UID:EA8CBFE1-1B17-418D-BD0E-65033BCEF5CF DTSTART;TZID=America/Los_Angeles:20260625T180000 DTEND;TZID=America/Los_Angeles:20260625T200000 DESCRIPTION:EMC Scan Technologies"\n\nNear field scanning is a widely known and well received method for component\, module and system EMC characteri zation. One specific emission scan technology\, called the NF EMI scan\, i s the most common scan technology\, but the immunity scan is relatively le ss known and less widely used. Three immunity and two emission scan techno logies will be presented: ESD Scan\, RF Immunity Scan\, Current Spreading (CSP) and Phase Measurement Scan.\n\nESD scan is a very effective scan tec hnique to debug or pre-screen components or modules that are more likely t o cause problems (specially soft failures) before they are integrated to a system. Its main goal is localizing weak spots or traces causing ESD gun test failures with a well-controlled disturbance source.\n\nRF Immunity Sc an is very similar to ESD scan in concept\, but it is a narrow-band scan w hile the ESD scan is a wide-band.\n\nMost currents injected by an ESD gun follow the intended path by design\, but a small amount causing system ups et can flow through an unexpected route. CSP (Current Spreading) is a visu alization technique for surface current flows\, which identifies unexpecte d current paths and can verify ESD protection design.\n\nPhase information helps improving accuracies of modeling of EUT's for simulation or can be directly used for specific applications. Specific application of the phase information will be introduced after brief review of simultaneous magnitu de and phase measurement in time and frequency domain.\n\nSpeaker(s): Kyun gjin "Jin" Min\n\nAgenda: \nAgenda:\n\n6PM - 6:45PM Dinner and Networking\ n\n6:45PM - 8PM Talk and Questions\n\nThursday June 25\, 2026\n\nRoom: Bui lding C training room\, Bldg: C\, 10401 roselle street\, ATEC\, San Diego\ , California\, United States\, 92121 LOCATION:Room: Building C training room\, Bldg: C\, 10401 roselle street\, ATEC\, San Diego\, California\, United States\, 92121 ORGANIZER:galcala@atecorp.com SEQUENCE:25 SUMMARY:EMC Scan Technologies URL;VALUE=URI:https://events.vtools.ieee.org/m/557882 X-ALT-DESC:Description: <br /><p>EMC Scan Technologies"</p>\n<p>Near field scanning is a widely known and well received method for component\, module and system EMC characterization. One specific emission scan technology\, called the NF EMI scan\, is the most common scan technology\, but the immu nity scan is relatively less known and less widely used. Three immunity an d two emission scan technologies will be presented: ESD Scan\, RF Immunity Scan\, Current Spreading (CSP) and Phase Measurement Scan.</p>\n<p>ESD sc an is a very effective scan technique to debug or pre-screen components or modules that are more likely to cause problems (specially soft failures) before they are integrated to a system. Its main goal is localizing weak s pots or traces causing ESD gun test failures with a well-controlled distur bance source.</p>\n<p>RF Immunity Scan is very similar to ESD scan in conc ept\, but it is a narrow-band scan while the ESD scan is a wide-band.</p>\ n<p>Most currents injected by an ESD gun follow the intended path by desig n\, but a small amount causing system upset can flow through an unexpected route. CSP (Current Spreading) is a visualization technique for surface c urrent flows\, which identifies unexpected current paths&nbsp\;and can ver ify ESD protection design.</p>\n<p>Phase information helps improving accur acies of modeling of EUT's for simulation or can be directly used for spec ific applications. Specific application of the phase information will be i ntroduced after brief review of simultaneous magnitude and phase measureme nt in time and frequency domain.</p><br /><br />Agenda: <br /><p>Agenda:</ p>\n<p>6PM - 6:45PM Dinner and Networking</p>\n<p>6:45PM - 8PM Talk and Qu estions</p>\n<p>Thursday June 25\, 2026</p> END:VEVENT END:VCALENDAR