BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:America/Chicago
BEGIN:DAYLIGHT
DTSTART:20260308T030000
TZOFFSETFROM:-0600
TZOFFSETTO:-0500
RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3
TZNAME:CDT
END:DAYLIGHT
BEGIN:STANDARD
DTSTART:20261101T010000
TZOFFSETFROM:-0500
TZOFFSETTO:-0600
RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11
TZNAME:CST
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BEGIN:VEVENT
DTSTAMP:20260627T185753Z
UID:8EF4FF60-9143-496E-AFA7-D92F3CB18AD6
DTSTART;TZID=America/Chicago:20260625T103000
DTEND;TZID=America/Chicago:20260625T113500
DESCRIPTION:This session examines the critical concepts and testing methodo
 logies behind high-accuracy data conversion in modern electronic systems.\
 nParticipants will explore how IEEE 1344 defines standardized terms\, perf
 ormance metrics\, and evaluation procedures to ensure consistency and prec
 ision in analog-to-digital conversion.\nThe workshop emphasizes the import
 ance of reliable data conversion for embedded systems\, communication netw
 orks\, measurement instrumentation\, and control systems.\n\nPDH certifica
 tes will be provided.\nOffered by the IEEE Oklahoma City Section as part o
 f the Standard Electrical and Electronic Engineering (SEEE) Workshop Serie
 s.\n\nVirtual: https://events.vtools.ieee.org/m/558815
LOCATION:Virtual: https://events.vtools.ieee.org/m/558815
ORGANIZER:reza.kandezy@ou.edu
SEQUENCE:10
SUMMARY:IEEE 1344: The Synchronization\, Measurement\, and Control System (
 2nd Standard Marathon Program 2026)
URL;VALUE=URI:https://events.vtools.ieee.org/m/558815
X-ALT-DESC:Description: &lt;br /&gt;&lt;p class=&quot;&quot; data-start=&quot;204&quot; data-end=&quot;842&quot;&gt;T
 his session examines the critical concepts and testing methodologies behin
 d high-accuracy data conversion in modern electronic systems.&lt;br data-star
 t=&quot;491&quot; data-end=&quot;494&quot;&gt;Participants will explore how IEEE 1344 defines sta
 ndardized terms\, performance metrics\, and evaluation procedures to ensur
 e consistency and precision in analog-to-digital conversion.&lt;br data-start
 =&quot;677&quot; data-end=&quot;680&quot;&gt;The workshop emphasizes the importance of reliable d
 ata conversion for embedded systems\, communication networks\, measurement
  instrumentation\, and control systems.&lt;/p&gt;\n&lt;p class=&quot;&quot; data-start=&quot;844&quot; 
 data-end=&quot;1020&quot;&gt;&lt;strong data-start=&quot;844&quot; data-end=&quot;864&quot;&gt;PDH certificates&lt;/
 strong&gt; will be provided.&lt;br data-start=&quot;882&quot; data-end=&quot;885&quot;&gt;Offered by th
 e &lt;strong data-start=&quot;900&quot; data-end=&quot;930&quot;&gt;IEEE Oklahoma City Section&lt;/stro
 ng&gt; as part of the &lt;strong data-start=&quot;946&quot; data-end=&quot;1019&quot;&gt;Standard Elect
 rical and Electronic Engineering (SEEE) Workshop Series&lt;/strong&gt;.&lt;/p&gt;
END:VEVENT
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