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PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
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TZID:America/Chicago
BEGIN:DAYLIGHT
DTSTART:20260308T030000
TZOFFSETFROM:-0600
TZOFFSETTO:-0500
RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3
TZNAME:CDT
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BEGIN:STANDARD
DTSTART:20261101T010000
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BEGIN:VEVENT
DTSTAMP:20260630T175314Z
UID:0827B5FE-9C3C-4E59-9B29-D861961DC17E
DTSTART;TZID=America/Chicago:20260630T103000
DTEND;TZID=America/Chicago:20260630T113500
DESCRIPTION:This session introduces the fundamental concepts and practical 
 applications of boundary-scan testing\, enabling engineers to efficiently 
 validate\, diagnose\, and program complex electronic circuits.\nParticipan
 ts will explore how IEEE 1149.1 revolutionizes PCB and IC testing by minim
 izing physical test points\, supporting in-system programming\, and enhanc
 ing system-level diagnostics.\nThe workshop highlights how mastering bound
 ary-scan methods ensures design for testability\, improves production yiel
 ds\, and simplifies troubleshooting in embedded systems.\n\nPDH certificat
 es will be provided.\nOffered by the IEEE Oklahoma City Section as part of
  the Standard Marathon Program.\n\nVirtual: https://events.vtools.ieee.org
 /m/558818
LOCATION:Virtual: https://events.vtools.ieee.org/m/558818
ORGANIZER:reza.kandezy@ou.edu
SEQUENCE:7
SUMMARY:IEEE 1149.1 (JTAG) workshop: Boundary-Scan Engineering: Unlocking E
 mbedded Testing
URL;VALUE=URI:https://events.vtools.ieee.org/m/558818
X-ALT-DESC:Description: &lt;br /&gt;&lt;p class=&quot;&quot; data-start=&quot;217&quot; data-end=&quot;934&quot;&gt;T
 his session introduces the fundamental concepts and practical applications
  of boundary-scan testing\, enabling engineers to efficiently validate\, d
 iagnose\, and program complex electronic circuits.&lt;br data-start=&quot;572&quot; dat
 a-end=&quot;575&quot;&gt;Participants will explore how IEEE 1149.1 revolutionizes PCB a
 nd IC testing by minimizing physical test points\, supporting in-system pr
 ogramming\, and enhancing system-level diagnostics.&lt;br data-start=&quot;760&quot; da
 ta-end=&quot;763&quot;&gt;The workshop highlights how mastering boundary-scan methods e
 nsures design for testability\, improves production yields\, and simplifie
 s troubleshooting in embedded systems.&lt;/p&gt;\n&lt;p class=&quot;&quot; data-start=&quot;936&quot; d
 ata-end=&quot;1112&quot;&gt;&lt;strong data-start=&quot;936&quot; data-end=&quot;956&quot;&gt;PDH certificates&lt;/s
 trong&gt; will be provided.&lt;br data-start=&quot;974&quot; data-end=&quot;977&quot;&gt;Offered by the
  &lt;strong data-start=&quot;992&quot; data-end=&quot;1022&quot;&gt;IEEE Oklahoma City Section&lt;/stro
 ng&gt; as part of the &lt;strong data-start=&quot;1038&quot; data-end=&quot;1111&quot;&gt;Standard Mara
 thon Program&lt;/strong&gt;.&lt;/p&gt;
END:VEVENT
END:VCALENDAR