BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:America/Chicago
BEGIN:DAYLIGHT
DTSTART:20260308T030000
TZOFFSETFROM:-0600
TZOFFSETTO:-0500
RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3
TZNAME:CDT
END:DAYLIGHT
BEGIN:STANDARD
DTSTART:20261101T010000
TZOFFSETFROM:-0500
TZOFFSETTO:-0600
RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11
TZNAME:CST
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BEGIN:VEVENT
DTSTAMP:20260518T141107Z
UID:44BF4521-50F6-4A7A-A291-3729310EE008
DTSTART;TZID=America/Chicago:20260702T103000
DTEND;TZID=America/Chicago:20260702T113500
DESCRIPTION:This session explores advanced techniques for embedded instrume
 ntation access\, enabling engineers to perform in-depth diagnostics\, moni
 toring\, and configuration inside complex integrated circuits.\nParticipan
 ts will learn how IEEE 1687 extends traditional JTAG capabilities to inter
 nal chip structures\, standardizing access protocols and significantly enh
 ancing system-level debug\, validation\, and maintenance processes.\nThe w
 orkshop highlights how mastering iJTAG accelerates testing\, improves syst
 em observability\, and reduces product development cycles in modern electr
 onic design.\n\nPDH certificates will be provided.\nOffered by the IEEE Ok
 lahoma City Section as part of the 2nd Standard Marathon Program.\n\nVirtu
 al: https://events.vtools.ieee.org/m/560272
LOCATION:Virtual: https://events.vtools.ieee.org/m/560272
ORGANIZER:reza.kandezy@ou.edu
SEQUENCE:21
SUMMARY:IEEE 1687 (iJTAG) workshop: Inside the Chip: Advanced Embedded Diag
 nostics
URL;VALUE=URI:https://events.vtools.ieee.org/m/560272
X-ALT-DESC:Description: &lt;br /&gt;&lt;p class=&quot;&quot; data-start=&quot;207&quot; data-end=&quot;990&quot;&gt;T
 his session explores advanced techniques for embedded instrumentation acce
 ss\, enabling engineers to perform in-depth diagnostics\, monitoring\, and
  configuration inside complex integrated circuits.&lt;br data-start=&quot;599&quot; dat
 a-end=&quot;602&quot;&gt;Participants will learn how IEEE 1687 extends traditional JTAG
  capabilities to internal chip structures\, standardizing access protocols
  and significantly enhancing system-level debug\, validation\, and mainten
 ance processes.&lt;br data-start=&quot;824&quot; data-end=&quot;827&quot;&gt;The workshop highlights
  how mastering iJTAG accelerates testing\, improves system observability\,
  and reduces product development cycles in modern electronic design.&lt;/p&gt;\n
 &lt;p class=&quot;&quot; data-start=&quot;992&quot; data-end=&quot;1168&quot;&gt;&lt;strong data-start=&quot;992&quot; data
 -end=&quot;1012&quot;&gt;PDH certificates&lt;/strong&gt; will be provided.&lt;br data-start=&quot;103
 0&quot; data-end=&quot;1033&quot;&gt;Offered by the &lt;strong data-start=&quot;1048&quot; data-end=&quot;1078
 &quot;&gt;IEEE Oklahoma City Section&lt;/strong&gt; as part of the &lt;strong data-start=&quot;1
 094&quot; data-end=&quot;1167&quot;&gt;2nd Standard Marathon Program.&lt;/strong&gt;&lt;/p&gt;
END:VEVENT
END:VCALENDAR