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DTSTART:20260308T030000
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DTSTART:20261101T010000
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DTSTAMP:20260520T172242Z
UID:72F9B0E1-0BE0-4848-870A-91EECC66B485
DTSTART;TZID=America/Los_Angeles:20260721T180000
DTEND;TZID=America/Los_Angeles:20260721T200000
DESCRIPTION:This talk provides an overview of some prominent laminate mater
 ial characterization techniques that are crucial for evaluating laminate p
 ermittivity and losses. These techniques are compared and contrasted with 
 newer in-situ methodologies that excel at extracting parameters that yield
  highly accurate measurement-simulation correlation\, highlighting where t
 hey excel and where they fall short.\n\nThe talk also demonstrates some co
 mmon phenomena that can lead to dispersion in the measured time delay and 
 effective dielectric constant\, namely anomalous dispersion from discontin
 uities and non-TEM dispersion in microstrip structures.\n\nCo-sponsored by
 : San Diego EP Society Chapter\n\nSpeaker(s): Aditya Rao\n\nAgenda: \nTues
 day July 21\n\n6pm Networking and Dinner\n\n6:45pm Presentation\n\n7:30 pm
  Q&amp;A\n\n8:00 End of Meeting\n\nBldg: Q\, 6455 Lusk Blvd\, San Diego\, CA 9
 2121\, San Diego\, California\, United States\, 92121
LOCATION:Bldg: Q\, 6455 Lusk Blvd\, San Diego\, CA 92121\, San Diego\, Cali
 fornia\, United States\, 92121
ORGANIZER:devans0179@sdsu.edu
SEQUENCE:17
SUMMARY:PCB Material Characterization for Measurement-Simulation Correlatio
 n
URL;VALUE=URI:https://events.vtools.ieee.org/m/560565
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;This talk provides an overview of some pro
 minent laminate material characterization techniques that are crucial for 
 evaluating laminate permittivity and losses. These techniques are compared
  and contrasted with newer in-situ methodologies that excel at extracting 
 parameters that yield highly accurate measurement-simulation correlation\,
  highlighting where they excel and where they fall short.&lt;/p&gt;\n&lt;p&gt;The talk
  also demonstrates some common phenomena that can lead to dispersion in th
 e measured time delay and effective dielectric constant\, namely anomalous
  dispersion from discontinuities and non-TEM dispersion in microstrip stru
 ctures.&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;Tuesday July 21&lt;/p&gt;\n&lt;p&gt;&lt;br&gt;6pm Ne
 tworking and Dinner&lt;/p&gt;\n&lt;p&gt;6:45pm Presentation&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;7:30 pm Q&amp;a
 mp\;A&lt;/p&gt;\n&lt;p&gt;8:00 End of Meeting&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;
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