BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:Asia/Kolkata
BEGIN:STANDARD
DTSTART:19451014T230000
TZOFFSETFROM:+0630
TZOFFSETTO:+0530
TZNAME:IST
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BEGIN:VEVENT
DTSTAMP:20260614T071918Z
UID:FC254A15-7F75-4DD6-B856-DF1365E410C5
DTSTART;TZID=Asia/Kolkata:20260604T190000
DTEND;TZID=Asia/Kolkata:20260604T194500
DESCRIPTION:The Department of Electronics & Communication Engineering\, Acr
 opolis Institute of Technology & Research\, Indore\, in association with I
 EEE Electron Devices Society (EDS) Student Branch Chapter\, IEEE Madhya Pr
 adesh Section\, and VLSI Society of India\, cordially invites you to atten
 d an insightful Distinguished Lecture on:\n\n🎯 AI-Based Reliability Pre
 diction in Semiconductor Devices\n\n👨‍🏫 Distinguished Speaker\nPro
 f. Cher Ming Tan\nProfessor & Director\, Center of Reliability Science & T
 echnology\n\n💡 Why Attend?\n🔹 Understand the role of AI in semicondu
 ctor reliability prediction\n🔹 Explore advanced reliability assessment 
 methodologies\n🔹 Gain insights into cutting-edge semiconductor research
 \n🔹 Learn about emerging opportunities in semiconductor technology\n\nI
 ndore\, Madhya Pradesh\, India\, 452012
LOCATION:Indore\, Madhya Pradesh\, India\, 452012
ORGANIZER:alpanadeshmukh@acropolis.in
SEQUENCE:38
SUMMARY:DISTINGUISHED LECTURE on " AI based reliability prediction in Semic
 onductor Devices" 
URL;VALUE=URI:https://events.vtools.ieee.org/m/562280
X-ALT-DESC:Description: <br /><p>The Department of Electronics &amp\; Commu
 nication Engineering\, Acropolis Institute of Technology &amp\; Research\,
  Indore\, in association with <strong>IEEE Electron Devices Society (EDS)<
 /strong> Student Branch Chapter\, <strong>IEEE Madhya Pradesh Section</str
 ong>\, and <strong>VLSI Society of India\,</strong> cordially invites you 
 to attend an insightful Distinguished Lecture on:</p>\n<p>🎯<strong> AI-
 Based Reliability Prediction in Semiconductor Devices</strong></p>\n<p>
 👨&zwj\;🏫 <strong>Distinguished Speaker</strong><br>Prof. Cher Ming T
 an<br>Professor &amp\; Director\, Center of Reliability Science &amp\; Tec
 hnology</p>\n<p>💡 <strong>Why Attend?</strong><br>🔹 Understand the r
 ole of AI in semiconductor reliability prediction<br>🔹 Explore advanced
  reliability assessment methodologies<br>🔹 Gain insights into cutting-e
 dge semiconductor research<br>🔹 Learn about emerging opportunities in s
 emiconductor technology</p>
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END:VCALENDAR