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PRODID:IEEE vTools.Events//EN
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TZID:America/Phoenix
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DTSTART:19671029T010000
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BEGIN:VEVENT
DTSTAMP:20260623T182908Z
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DTSTART;TZID=America/Phoenix:20260702T110000
DTEND;TZID=America/Phoenix:20260702T120000
DESCRIPTION:[]\n\nMany biomedical and medical-device systems\, especially i
 mplantable electronics\, require mission-critical reliability to support p
 atient safety\, therapy delivery\, and measurement accuracy. These systems
  rely heavily on mixed-signal circuits such as sensor front ends\, amplifi
 ers\, data converters\, stimulators\, references\, clocks\, and power-mana
 gement blocks.\nWhile these circuits are rigorously verified during produc
 tion test\, burn-in\, and characterization\, long-term reliability challen
 ges can persist after manufacturing. Over a device’s lifetime\, circuit 
 behavior can drift due to aging\, leakage\, environmental stress\, packagi
 ng effects\, and varying operating conditions.\n\nThis webinar explores ho
 w embedded mixed-signal test and self-monitoring techniques can support th
 e lifetime reliability of biomedical electronics. The discussion will conn
 ect traditional production-test concepts with periodic or in-field health 
 monitoring and safe diagnostics. Topics will include analog and mixed-sign
 al built-in self-test (BIST) architectures\, embedded current and leakage 
 monitoring\, IDDQ-style measurements\, burn-in support\, self-calibration\
 , and compact diagnostic signatures.\n\nThe talk will also highlight how l
 imited external access can be complemented by on-chip diagnostic resources
  and firmware-coordinated test flows. Ultimately\, the session will show h
 ow reusing embedded resources can reduce dependence on external test acces
 s\, improve observability\, and support data-driven decisions about device
  performance and reliability over time.\n\nSpeaker(s): Krishna  Pramod Mad
 abhushi\n\nVirtual: https://events.vtools.ieee.org/m/564141
LOCATION:Virtual: https://events.vtools.ieee.org/m/564141
ORGANIZER:embs.phx@ieee.org
SEQUENCE:16
SUMMARY:Embedded Mixed-Signal Test & Reliability Monitoring in Biomedical E
 lectronics
URL;VALUE=URI:https://events.vtools.ieee.org/m/564141
X-ALT-DESC:Description: <br /><p><img src="https://events.vtools.ieee.org/v
 tools_ui/media/display/65f4e6c1-5bfa-4a7d-95fa-0ce3c13d0f68" alt="" width=
 "998" height="561"></p>\n<p>Many biomedical and medical-device systems\, e
 specially implantable electronics\, require mission-critical reliability t
 o support patient safety\, therapy delivery\, and measurement accuracy. Th
 ese systems rely heavily on mixed-signal circuits such as sensor front end
 s\, amplifiers\, data converters\, stimulators\, references\, clocks\, and
  power-management blocks.<br>While these circuits are rigorously verified 
 during production test\, burn-in\, and characterization\, long-term reliab
 ility challenges can persist after manufacturing. Over a device&rsquo\;s l
 ifetime\, circuit behavior can drift due to aging\, leakage\, environmenta
 l stress\, packaging effects\, and varying operating conditions.</p>\n<p>T
 his webinar explores how embedded mixed-signal test and self-monitoring te
 chniques can support the lifetime reliability of biomedical electronics. T
 he discussion will connect traditional production-test concepts with perio
 dic or in-field health monitoring and safe diagnostics. Topics will includ
 e analog and mixed-signal built-in self-test (BIST) architectures\, embedd
 ed current and leakage monitoring\, IDDQ-style measurements\, burn-in supp
 ort\, self-calibration\, and compact diagnostic signatures.</p>\n<p>The ta
 lk will also highlight how limited external access can be complemented by 
 on-chip diagnostic resources and firmware-coordinated test flows. Ultimate
 ly\, the session will show how reusing embedded resources can reduce depen
 dence on external test access\, improve observability\, and support data-d
 riven decisions about device performance and reliability over time.</p>
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