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PRODID:IEEE vTools.Events//EN
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TZID:America/Chicago
BEGIN:DAYLIGHT
DTSTART:20260308T030000
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TZOFFSETTO:-0500
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DTSTART:20261101T010000
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BEGIN:VEVENT
DTSTAMP:20260622T213401Z
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DTSTART;TZID=America/Chicago:20260717T120000
DTEND;TZID=America/Chicago:20260717T130000
DESCRIPTION:EMI/EMC contribute to around 30% of failures in the verificatio
 n stage costing the electronics industry billions in lost revenue. Today\,
  EMI/EMC compliance is achieved by preparing a prototype and performing me
 asurements in a standard laboratory. This results in iterative re-prototyp
 ing which causes delays in time-to-market and sometimes leads to cancelled
  projects and lost opportunities. This presentation will discuss a model-b
 ased system-level simulation approach for front-loading EMI/EMC. New resea
 rch into the generation of IC-models using physics and data-based approach
 es will be discussed. This approach can ensure first-time compliance pass 
 and reduce system-level functional failures.\n\nVirtual: https://events.vt
 ools.ieee.org/m/564773
LOCATION:Virtual: https://events.vtools.ieee.org/m/564773
ORGANIZER:tara.kellogg@ieee.org
SEQUENCE:64
SUMMARY:IC-modeling techniques towards a model-based analysis for EMI/EMC
URL;VALUE=URI:https://events.vtools.ieee.org/m/564773
X-ALT-DESC:Description: <br /><p><span style="font-size: 12.0pt\; font-fami
 ly: 'Aptos'\,sans-serif\; mso-fareast-font-family: DengXian\; mso-fareast-
 theme-font: minor-fareast\; mso-bidi-font-family: Aptos\; mso-ansi-languag
 e: EN-US\; mso-fareast-language: ZH-CN\; mso-bidi-language: AR-SA\;">EMI/E
 MC contribute to around 30% of failures in the verification stage costing 
 the electronics industry billions in lost revenue. Today\, EMI/EMC complia
 nce is achieved by preparing a prototype and performing measurements in a 
 standard laboratory. This results in iterative re-prototyping which causes
  delays in time-to-market and sometimes leads to cancelled projects and lo
 st opportunities. This presentation will discuss a model-based system-leve
 l simulation approach for front-loading EMI/EMC. New research into the gen
 eration of IC-models using physics and data-based approaches will be discu
 ssed. This approach can ensure first-time compliance pass and reduce syste
 m-level functional failures.</span></p>
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