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DTSTART;TZID=America/Los_Angeles:20260717T180000
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DESCRIPTION:Modern semiconductor fabs generate vast amounts of data from eq
 uipment\, processes\, sensors\, metrology tools\, and factory automation s
 ystems. The real challenge is transforming this data into actionable insig
 hts that improve yield\, quality\, productivity\, and operational efficien
 cy.\n\nJoin the IEEE Oregon Section Joint EDS & MTT-S Chapter for the webi
 nar\, "From Data to Decisions: Smart Manufacturing Analytics in Semiconduc
 tor Production."\n\nThis session will explore how advanced analytics\, AI/
 ML\, predictive maintenance\, digital twins\, and smart manufacturing tech
 nologies are enabling data-driven decision-making in semiconductor factori
 es. Attendees will gain insights into how leading fabs use real-time data 
 to optimize performance\, enhance equipment utilization\, and drive operat
 ional excellence.\n\nIdeal for students\, researchers\, engineers\, and in
 dustry professionals interested in the future of smart semiconductor manuf
 acturing.\n\nSpeaker(s): \, Dr. Naznin Akter \n\nVirtual: https://events.v
 tools.ieee.org/m/564955
LOCATION:Virtual: https://events.vtools.ieee.org/m/564955
ORGANIZER:naznin@ieee.org
SEQUENCE:22
SUMMARY:From Data to Decisions: Smart Manufacturing Analytics in Semiconduc
 tor Production
URL;VALUE=URI:https://events.vtools.ieee.org/m/564955
X-ALT-DESC:Description: <br /><p class="isSelectedEnd">Modern semiconductor
  fabs generate vast amounts of data from equipment\, processes\, sensors\,
  metrology tools\, and factory automation systems. The real challenge is t
 ransforming this data into actionable insights that improve yield\, qualit
 y\, productivity\, and operational efficiency.</p>\n<p class="isSelectedEn
 d">Join the IEEE Oregon Section Joint EDS &amp\; MTT-S Chapter for the web
 inar\, <strong>"From Data to Decisions: Smart Manufacturing Analytics in S
 emiconductor Production."</strong></p>\n<p class="isSelectedEnd">This sess
 ion will explore how advanced analytics\, AI/ML\, predictive maintenance\,
  digital twins\, and smart manufacturing technologies are enabling data-dr
 iven decision-making in semiconductor factories. Attendees will gain insig
 hts into how leading fabs use real-time data to optimize performance\, enh
 ance equipment utilization\, and drive operational excellence.</p>\n<p>Ide
 al for students\, researchers\, engineers\, and industry professionals int
 erested in the future of smart semiconductor manufacturing.</p>\n<p><img s
 tyle="display: block\; margin-left: auto\; margin-right: auto\;" src="http
 s://events.vtools.ieee.org/vtools_ui/media/display/25e56b20-fc57-4015-877c
 -e39bd974b13a"></p>
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