BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/Los_Angeles BEGIN:DAYLIGHT DTSTART:20260308T030000 TZOFFSETFROM:-0800 TZOFFSETTO:-0700 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:PDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20261101T010000 TZOFFSETFROM:-0700 TZOFFSETTO:-0800 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:PST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20260825T204434Z UID:20E79128-AE39-4A89-90CC-6E194F10A26F DTSTART;TZID=America/Los_Angeles:20260925T093000 DTEND;TZID=America/Los_Angeles:20260925T113000 DESCRIPTION:Join the IEEE MTT-S of Thompson Okanagan Section for an engagin g technical seminar on Modern Methods for Component Measurements Using Vec tor Network Analyzers (VNAs) for 6G Test. As RF and microwave technologies continue to evolve toward 6G and beyond\, accurate and versatile measurem ent techniques are becoming increasingly important for the design\, valida tion\, and characterization of advanced components and systems.\n\nThis ta lk will trace the evolution of VNAs from their early use as fast power met ers to today’s highly capable measurement platforms. Participants will g ain insight into the advanced hardware and software technologies that enab le modern VNAs to deliver high-accuracy measurements across a broad range of applications.\n\nThe presentation will cover modern approaches to S-par ameter measurements\, noise figure\, third-order intercept (TOI)\, modulat ion and distortion measurements\, spectrum analysis\, and active-device ch aracterization\, with a focus on their relevance to next-generation RF and microwave testing.\n\nWhether you are a student\, researcher\, practicing engineer\, or RF/microwave enthusiast\, this event will provide valuable insight into how modern VNA technology is shaping the way components are m easured and characterized for 6G and future wireless systems.\n\nAll stude nts\, faculty\, and professionals are welcome. Spots are limited\, so kind ly RSVP at the earliest. Light food and refreshments will be provided.\n\n Speaker(s): Joel Dunsmore\n\nAgenda: \n9:30 AM - Lecture Begin\n\n11 AM - Lecture Ends\n\n11.30 AM - Social Mixer\n\nBldg: UBC Okanagan Engineering\ , Management and Education Building\, 1137 Alumni Avenue\, Kelowna\, Briti sh Columbia\, Canada\, V1V 1V8 LOCATION:Bldg: UBC Okanagan Engineering\, Management and Education Building \, 1137 Alumni Avenue\, Kelowna\, British Columbia\, Canada\, V1V 1V8 ORGANIZER:vishbala@ieee.org SEQUENCE:19 SUMMARY:Distinguished Microwave Lecture Series: Modern Methods for Componen t Measurements using Vector Network Analyzers for 6G Test URL;VALUE=URI:https://events.vtools.ieee.org/m/574228 X-ALT-DESC:Description: <br /><p class="isSelectedEnd">Join the IEEE MTT-S of Thompson Okanagan Section for an engaging technical seminar on&nbsp\;<s trong>Modern Methods for Component Measurements Using Vector Network Analy zers (VNAs) for 6G Test</strong>. As RF and microwave technologies continu e to evolve toward 6G and beyond\, accurate and versatile measurement tech niques are becoming increasingly important for the design\, validation\, a nd characterization of advanced components and systems.</p>\n<p class="isS electedEnd">This talk will trace the evolution of VNAs from their early us e as fast power meters to today&rsquo\;s highly capable measurement platfo rms. Participants will gain insight into the advanced hardware and softwar e technologies that enable modern VNAs to deliver high-accuracy measuremen ts across a broad range of applications.</p>\n<p class="isSelectedEnd">The presentation will cover modern approaches to <strong>S-parameter measurem ents\, noise figure\, third-order intercept (TOI)\, modulation and distort ion measurements\, spectrum analysis\, and active-device characterization< /strong>\, with a focus on their relevance to next-generation RF and micro wave testing.</p>\n<p>Whether you are a student\, researcher\, practicing engineer\, or RF/microwave enthusiast\, this event will provide valuable i nsight into how modern VNA technology is shaping the way components are me asured and characterized for <strong>6G and future wireless systems</stron g>.</p>\n<p>&nbsp\;</p>\n<p>All students\, faculty\, and professionals are welcome. Spots are limited\, so kindly RSVP at the earliest. Light food a nd refreshments will be provided.</p><br /><br />Agenda: <br /><p>9:30 AM - Lecture Begin</p>\n<p>11 AM - Lecture Ends</p>\n<p>11.30 AM - Social Mix er</p> END:VEVENT END:VCALENDAR