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DTSTART:20260329T030000
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DTSTART:20261025T020000
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DTSTAMP:20260914T090059Z
UID:EACEF3C9-8BF4-4202-957D-81D3BBEAAB37
DTSTART;TZID=Europe/Berlin:20261007T170000
DTEND;TZID=Europe/Berlin:20261007T190000
DESCRIPTION:Join four EMC Young Professionals Ambassadors from industry and
  academia for an evening of talks\, a live panel discussion\, and audience
  Q&A — covering career paths in EMC\, measurement science\, consumer-dev
 ice reliability\, and grounding fundamentals. Open to students\, young pro
 fessionals\, and anyone curious about how EMC shapes the technology we use
  every day.\n\nSpeaker(s): Madhavi Dhara\, Simone Negri\, Niamat Hussain\,
  Gaurav Mahajan\n\nAgenda: \nAGENDA\n\n17:00 – 17:10: Welcome & Introduc
 tion – Dr.-Ing. Mathias Magdowski (Chair for Electromagnetic Compatibili
 ty\, Otto von Guericke University Magdeburg\, Germany)\n\n17:10 – 17:25:
  Madhavi Dhara (Robert Bosch GmbH\, Germany) – Designing a High-Impact C
 areer in EMC\n\n17:25 – 17:40: Simone Negri (Politecnico di Milano\, Ita
 ly) – Non-Intrusive Characterization Methods for Multiport Electrical De
 vices\n\n17:40 – 17:55: Niamat Hussain (University of Glasgow\, UK) – 
 From Drop-Damage to Radiation Risk: Rethinking Smartphone Case Engineering
 \n\n17:55 – 18:10: Gaurav Mahajan (Apple Inc.\, USA) – Grounds for Gro
 unding\n\n18:10 – 18:40: Panel Discussion\n\n18:40 – 18:55: Audience Q
 &A / Chat Box Questions\n\n18:55 – 19:00: Closing Remarks\n\nVirtual: ht
 tps://events.vtools.ieee.org/m/575899
LOCATION:Virtual: https://events.vtools.ieee.org/m/575899
ORGANIZER:madhavismurthy@gmail.com
SEQUENCE:12
SUMMARY:EMC Young Professionals Panel 2026
URL;VALUE=URI:https://events.vtools.ieee.org/m/575899
X-ALT-DESC:Description: <br /><p>Join four EMC Young Professionals Ambassad
 ors from industry and academia for an evening of talks\, a live panel disc
 ussion\, and audience Q&amp\;A &mdash\; covering career paths in EMC\, mea
 surement science\, consumer-device reliability\, and grounding fundamental
 s. Open to students\, young professionals\, and anyone curious about how E
 MC shapes the technology we use every day.</p><br /><br />Agenda: <br /><p
 >AGENDA</p>\n<p>17:00 &ndash\; 17:10: Welcome &amp\; Introduction &ndash\;
  Dr.-Ing. Mathias Magdowski (Chair for Electromagnetic Compatibility\, Ott
 o von Guericke University Magdeburg\, Germany)</p>\n<p>17:10 &ndash\; 17:2
 5: Madhavi Dhara (Robert Bosch GmbH\, Germany) &ndash\; Designing a High-I
 mpact Career in EMC</p>\n<p>17:25 &ndash\; 17:40: Simone Negri (Politecnic
 o di Milano\, Italy) &ndash\; Non-Intrusive Characterization Methods for M
 ultiport Electrical Devices</p>\n<p>17:40 &ndash\; 17:55: Niamat Hussain (
 University of Glasgow\, UK) &ndash\; From Drop-Damage to Radiation Risk: R
 ethinking Smartphone Case Engineering</p>\n<p>17:55 &ndash\; 18:10: Gaurav
  Mahajan (Apple Inc.\, USA) &ndash\; Grounds for Grounding</p>\n<p>18:10 &
 ndash\; 18:40: Panel Discussion</p>\n<p>18:40 &ndash\; 18:55: Audience Q&a
 mp\;A / Chat Box Questions</p>\n<p>18:55 &ndash\; 19:00: Closing Remarks</
 p>
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