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DTSTART:20260308T030000
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DTSTART:20261101T010000
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DTSTAMP:20260907T155150Z
UID:D8D20E74-9F05-486E-8B94-1F71635338DA
DTSTART;TZID=US/Central:20260909T160000
DTEND;TZID=US/Central:20260909T170000
DESCRIPTION:Rethinking Power Quality Metrics for Modern Power Electronic Sy
 stems\n\n- Power Quality in Rapidly Growing Grids\n- Impact of PQ Disturba
 nces on DC-link capacitors\n- Limitations of Existing PQ Metrics for Relia
 bility\n- Proposal Reliability-Oriented PQ Metrics\n\nCo-sponsored by: Lar
 ry Jackson\n\nSpeaker(s): Dinesh Kumar\n\nAgenda: \n\n\nRoom: Training Roo
 m\, 1853 Data Drive\, Birmingham\, Alabama\, United States\, 35244
LOCATION:Room: Training Room\, 1853 Data Drive\, Birmingham\, Alabama\, Uni
 ted States\, 35244
ORGANIZER:ljackson@wgyates.com
SEQUENCE:17
SUMMARY:September 9th\, 2026 - ONLINE ONLY Industry Applications Meeting - 
 Rethinking Power Quality Metrics for Modern Power Electronic Systems
URL;VALUE=URI:https://events.vtools.ieee.org/m/576328
X-ALT-DESC:Description: &lt;br /&gt;&lt;p class=&quot;elementtoproof&quot; style=&quot;background: 
 white\; margin: 12.0pt 0in 12.0pt 0in\;&quot;&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p class=&quot;elementtop
 roof&quot; style=&quot;background: white\; margin: 12.0pt 0in 12.0pt 0in\;&quot;&gt;&lt;span st
 yle=&quot;font-size: 16.0pt\; font-family: &#39;Arial&#39;\,sans-serif\; color: black\;
 &quot;&gt;Rethinking Power Quality Metrics for Modern Power Electronic Systems&amp;nbs
 p\;&lt;/span&gt;&lt;/p&gt;\n&lt;ul style=&quot;margin-top: 0in\;&quot; type=&quot;disc&quot;&gt;\n&lt;li class=&quot;ele
 menttoproof&quot; style=&quot;margin-top: 12.0pt\; margin-bottom: 12.0pt\; margin-le
 ft: .5in\; mso-list: l0 level1 lfo1\; background: white\;&quot;&gt;&lt;span style=&quot;fo
 nt-family: Arial\, sans-serif\;&quot;&gt;&lt;span style=&quot;font-size: 18.6667px\;&quot;&gt;Powe
 r Quality in Rapidly Growing Grids&lt;/span&gt;&lt;/span&gt;&lt;/li&gt;\n&lt;li class=&quot;elementt
 oproof&quot; style=&quot;margin-top: 12.0pt\; margin-bottom: 12.0pt\; margin-left: .
 5in\; mso-list: l0 level1 lfo1\; background: white\;&quot;&gt;&lt;span style=&quot;font-fa
 mily: Arial\, sans-serif\;&quot;&gt;&lt;span style=&quot;font-size: 18.6667px\;&quot;&gt;Impact of
  PQ Disturbances on DC-link capacitors&lt;/span&gt;&lt;/span&gt;&lt;/li&gt;\n&lt;li class=&quot;elem
 enttoproof&quot; style=&quot;margin-top: 12.0pt\; margin-bottom: 12.0pt\; margin-lef
 t: .5in\; mso-list: l0 level1 lfo1\; background: white\;&quot;&gt;&lt;span style=&quot;fon
 t-family: Arial\, sans-serif\;&quot;&gt;&lt;span style=&quot;font-size: 18.6667px\;&quot;&gt;Limit
 ations of Existing PQ Metrics for Reliability&lt;/span&gt;&lt;/span&gt;&lt;/li&gt;\n&lt;li clas
 s=&quot;elementtoproof&quot; style=&quot;margin-top: 12.0pt\; margin-bottom: 12.0pt\; mar
 gin-left: .5in\; mso-list: l0 level1 lfo1\; background: white\;&quot;&gt;&lt;span sty
 le=&quot;font-family: Arial\, sans-serif\;&quot;&gt;&lt;span style=&quot;font-size: 18.6667px\;
 &quot;&gt;Proposal Reliability-Oriented PQ Metrics&lt;/span&gt;&lt;/span&gt;&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p&gt;&lt;
 span style=&quot;font-size: 16.0pt\; font-family: &#39;Arial&#39;\,sans-serif\;&quot;&gt; &lt;/spa
 n&gt;&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&lt;br&gt;&lt;br&gt;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\
 ;&lt;/p&gt;\n&lt;p&gt;&lt;br&gt;&lt;br&gt;&lt;br&gt;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&lt;br&gt;&lt;br&gt;&lt;br&gt;&lt;br&gt;&lt;/p&gt;\n&lt;p&gt;&lt;b
 r&gt;&lt;br&gt;&lt;/p&gt;\n&lt;p&gt;&lt;br&gt;&lt;br&gt;&lt;/p&gt;
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