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DTSTART:20260308T030000
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DTSTAMP:20260909T180245Z
UID:87FF7833-98E2-4275-9652-C1EE7B57B5C2
DTSTART;TZID=America/New_York:20260914T140000
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DESCRIPTION:ABSTRACT:\n\nModern Vector Network Analyzers (VNAs) have flexib
 le hardware and software with much higher performance than VNAs of even a 
 few years ago. Modern VNAs address a wide range of applications\, and curr
 ent versions can address almost every type of RF measurement. This talk wi
 ll detail the evolution of network analyzers from their early implementati
 on as fast power meters to the advanced component test systems they are to
 day. We will take a look at the advanced technology inside that allows VNA
 s to achieve supreme accuracy not only in S-parameter measurements\, but i
 n nearly all areas of characterization including noise figure\, TOI\, modu
 lation/distortion\, spectrum analysis\, and active-device characterization
 .\n\nAgenda: \n[]\n\nRoom: 3142\, Bldg: EIT\, Univerisity of Waterloo\, Wa
 terloo\, Ontario\, Canada\, N2L 3G1
LOCATION:Room: 3142\, Bldg: EIT\, Univerisity of Waterloo\, Waterloo\, Onta
 rio\, Canada\, N2L 3G1
ORGANIZER:mabuyaghi@gmail.com
SEQUENCE:13
SUMMARY:Modern Methods for Component Measurements Using Vector Network Anal
 yzers for 6G Test
URL;VALUE=URI:https://events.vtools.ieee.org/m/576503
X-ALT-DESC:Description: <br /><p>ABSTRACT:<br><br>Modern Vector Network Ana
 lyzers (VNAs) have flexible hardware and software with much higher perform
 ance than VNAs of even a few years ago. Modern VNAs address a wide range o
 f applications\, and current versions can address almost every type of RF 
 measurement. This talk will detail the evolution of network analyzers from
  their early implementation as fast power meters to the advanced component
  test systems they are today. We will take a look at the advanced technolo
 gy inside that allows VNAs to achieve supreme accuracy not only in S-param
 eter measurements\, but in nearly all areas of characterization including 
 noise figure\, TOI\, modulation/distortion\, spectrum analysis\, and activ
 e-device characterization.</p><br /><br />Agenda: <br /><p><img src="https
 ://events.vtools.ieee.org/vtools_ui/media/display/107c6a67-9e09-474e-b984-
 289f4a8ac961" alt="" width="1000" height="1414"></p>
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