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DTSTART:20260308T030000
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DTSTART:20261101T010000
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DTSTAMP:20261007T153310Z
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DTSTART;TZID=America/New_York:20261012T180000
DTEND;TZID=America/New_York:20261019T200000
DESCRIPTION:Join IEEE EPS/EDS With a technical talk by Fernando Guarín PhD
 \, IEEE Life-Fellow\, Distinguished Lecturer - Electron Devices Society ED
 S on Reliability topics for the miniaturization and qualification of Advan
 ced Silicon CMOS Technologies.\n\nSpeaker(s): Dr. Guarin\n\nRoom: 6113\, B
 ldg: Walker Lab\, 110 8th St\, Troy\, New York\, United States\, 12180
LOCATION:Room: 6113\, Bldg: Walker Lab\, 110 8th St\, Troy\, New York\, Uni
 ted States\, 12180
ORGANIZER:singea@rpi.edu
SEQUENCE:28
SUMMARY:RPI IEEE EPS/EDS DL Talk with Dr. Guarin
URL;VALUE=URI:https://events.vtools.ieee.org/m/579292
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;Join IEEE EPS/EDS With a technical talk by
  &lt;span class=&quot;TextRun SCXW32913844 BCX0&quot; lang=&quot;EN-US&quot; xml:lang=&quot;EN-US&quot; dat
 a-contrast=&quot;auto&quot;&gt;&lt;span class=&quot;NormalTextRun SCXW32913844 BCX0&quot;&gt;Fernando G
 uar&amp;iacute\;n &lt;/span&gt;&lt;span class=&quot;NormalTextRun SCXW32913844 BCX0&quot;&gt;PhD&lt;/sp
 an&gt;&lt;span class=&quot;NormalTextRun SCXW32913844 BCX0&quot;&gt;\, &lt;/span&gt;&lt;/span&gt;&lt;span cl
 ass=&quot;TextRun SCXW32913844 BCX0&quot; lang=&quot;EN-US&quot; xml:lang=&quot;EN-US&quot; data-contras
 t=&quot;none&quot;&gt;&lt;span class=&quot;NormalTextRun SCXW32913844 BCX0&quot;&gt;IEEE &lt;/span&gt;&lt;span c
 lass=&quot;NormalTextRun SCXW32913844 BCX0&quot;&gt;Life&lt;/span&gt;&lt;span class=&quot;NormalTextR
 un SCXW32913844 BCX0&quot;&gt;-Fellow\, &lt;/span&gt;&lt;/span&gt;&lt;span class=&quot;TextRun SCXW329
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 =&quot;NormalTextRun SCXW32913844 BCX0&quot;&gt;Distinguished Lecturer&lt;/span&gt;&lt;span clas
 s=&quot;NormalTextRun SCXW32913844 BCX0&quot;&gt; -&lt;/span&gt;&lt;span class=&quot;NormalTextRun SC
 XW32913844 BCX0&quot;&gt; Electron Devices Society EDS on R&lt;span class=&quot;TextRun SC
 XW87992738 BCX0&quot; lang=&quot;EN-US&quot; xml:lang=&quot;EN-US&quot; data-contrast=&quot;none&quot;&gt;&lt;span 
 class=&quot;NormalTextRun SCXW87992738 BCX0&quot;&gt;eliability topics for the miniatur
 ization and qualification of Advanced Silicon CMOS Technologies.&lt;/span&gt;&lt;/s
 pan&gt;&lt;/span&gt;&lt;/span&gt;&lt;/p&gt;
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