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PRODID:IEEE vTools.Events//EN
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TZID:Poland
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DTSTART:20130331T030000
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DTSTART:20131027T020000
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DTSTAMP:20140131T205259Z
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DTSTART;TZID=Poland:20130927T110000
DTEND;TZID=Poland:20130927T120000
DESCRIPTION:With decreasing minimum feature size\, nano-electronic circuits
  and systems exhibit an increasing variety of defect and fault mechanisms.
  Their rising sensitivity to radiation- and coupling induced single and mu
 ltiple event upsets is one problem\, new or enhanced aging processes that 
 may lead to early-lifetime failures pose another threat. The compensation 
 of transient fault effects is a well explored are of science\, while repai
 r technologies that tackle permanent faults have so far found a broad acce
 ptance only for embedded memories and for FPGA-based systems. However\, sp
 ecifically such methods and architectures are of great practical importanc
 e for the compensation of early-lifetime failures. The combination of fast
  error compensation and repair mechanisms is even more challenging\, since
  also aspects of minimum power consumption become important in many areas 
 of application.\n\nPoznan\, Wielkopolskie\, Poland
LOCATION:Poznan\, Wielkopolskie\, Poland
ORGANIZER:
SEQUENCE:0
SUMMARY:[Legacy Report] Combining Fault Tolerance and Self Repair in a Virt
 ual TMR Scheme
URL;VALUE=URI:https://events.vtools.ieee.org/m/98473
X-ALT-DESC:Description: <br />With decreasing minimum feature size\, nano-e
 lectronic circuits and systems exhibit an increasing variety of defect and
  fault mechanisms. Their rising sensitivity to radiation- and coupling ind
 uced single and multiple event upsets is one problem\, new or enhanced agi
 ng processes that may lead to early-lifetime failures pose another threat.
  The compensation of transient fault effects is a well explored are of sci
 ence\, while repair technologies that tackle permanent faults have so far 
 found a broad acceptance only for embedded memories and for FPGA-based sys
 tems. However\, specifically such methods and architectures are of great p
 ractical importance for the compensation of early-lifetime failures. The c
 ombination of fast error compensation and repair mechanisms is even more c
 hallenging\, since also aspects of minimum power consumption become import
 ant in many areas of application.
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