Nanostructured metal oxide gas sensors for Air Quality Monitoring

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ED/CAS DL Talk


Nanostructured metal oxide gas sensors help in pushing the boundaries of sensitivity and limit of detection. I will present various device architecture and process technologies, such as suspended core-shell, metal-semiconductor GasFET exploiting
work function modulation, harnessing electromigration and plasma oxidation to create core-shell structures, polystrene beads to achieve lithography free hexagonal nanostructures for high performance gas sensing. I will also present the results on single-chip gas sensor array for environmental pollution monitoring to quantify, CO, CO2, NO2 and SO2. Finally, I will present details on the Air Quality Monitoring (AQM) IoT system for continuous monitoring of ambient air pollution.



  Date and Time

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  Registration


  • 154 Summit Street, Newark, NJ 07102
  • Newark, New Jersey
  • United States 07102
  • Building: ECEC
  • Room Number: 202
  • Click here for Map

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  • Dr. Durga Misra, +1-973-596-5739, email: dmisra@ieee.org

    Dr. Ajay K. Poddar, Ph.: 201-560-3806, email:akpoddar@ieee.org

    Dr. Edip Niver, email: edip.niver@njit.edu

  • Co-sponsored by ED/CAS & AP01/MTT17
  • Registration closed


  Speakers

Dr. Navakanta Bhat
Dr. Navakanta Bhat of Centre for Nano Science and Engineering, Indian Institute of Science

Topic:

Nanostructured metal oxide gas sensors for Air Quality Monitoring

Nanostructured metal oxide gas sensors help in pushing the boundaries of sensitivity and limit of detection. I will present various device architecture and process technologies, such as suspended core-shell, metal-semiconductor GasFET exploiting
work function modulation, harnessing electromigration and plasma oxidation to create core-shell structures, polystrene beads to achieve lithography free hexagonal nanostructures for high performance gas sensing. I will also present the results on single-chip gas sensor array for environmental pollution monitoring to quantify, CO, CO2, NO2 and SO2. Finally, I will present details on the Air Quality Monitoring (AQM) IoT system for continuous monitoring of ambient air pollution.

Biography:

Professor Navakanta Bhat received his Ph.D. in Electrical Engineering from Stanford University, in 1996. Then he worked at Motorola’s Advanced Products R&D Lab in Austin, TX until 1999. He joined IISc in 1999, where he is currently a Professor and Chairperson in Centre for Nano Science and Engineering. His current research is on Nanoelectronics and Sensors. He has more than 200 publications and 20 patents. He was instrumental in creating the National Nanofabrication Centre (NNfC) at IISc, benchmarked against the best university facilities in the world. He is the recipient of IBM Faculty award, Swarnajayanti Fellowship (DST) and Outstanding Research Investigator award (DAE). He is a Fellow of INAE. He was the Editor of IEEE Transactions on Electron Devices, during 2013-2016. He is the member of Board of Governors of IEEE Electron Devices Society. He was a member of the National Innovation Council in Nanoelectronics and member of the committee setup by PSA’s office (Govt. of India), to recommend strategies to develop semiconductor manufacturing ecosystem in India. He was the Chairman of Infrastructure and Human Resource Development committee under the National Program on Micro and Smart Systems. He is the founder and promoter of a startup called “PathShodh Healthcare”, which builds point-of-care diagnostic devices for diabetes and its complications.

Email:

Address:Centre for Nano Science and Engineering, Indian Institute of Science, Bangalore, Karnataka, India, 560012





Agenda

Event Time:4:45 PM to 7:00 PM

4:45 PM - Refreshments (Pizza) and Networking

5:00PM-7:00 PM: Talk by Prof. Navakanta Bhat, Centre for Nano Science and Engineering, Indian Institute of Science, Bangalore, India

Seminar in ECE 202 All Welcome: There is no fee/charge for attending IEEE technical semiar. You don't have to be an IEEE Member to attend. Refreshmen is free for all attendess. Please invite your friends and colleagues to take advantages of this Invited Distinguished Lecture.