""Electrical Capacitance Tomography and Industrial Applications"

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IEEE - NEW YORK SECTION

Broadcast Technology Society Chapter


Among various industrial tomography modalities, electrical capacitance tomography (ECT) is the most mature and has been used for many challenging applications. ECT is obviously based on measuring capacitance and reconstructing permittivity distribution. ECT has advantages of no radioactive, rapid response, both non-intrusive and non-invasive, withstanding high temperature and high pressure and of low-cost. Because of extremely small capacitance to be measured (down to 0.0001 pF) and the soft-field nature, ECT does present challenges in circuit design, inverse problem and engineering. Our latest AC-based ECT system can generate online images at 300 frames per second with a signal-to-noise ratio (SNR) of 73 dB, and has been used in many challenging applications. During this talk, the principle of ECT will be introduced and some industrial applications will be discussed in detail, together with a demonstration of an AC-based ECT system.



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  • Manhattan College
  • 3825 Corlear Ave
  • Bronx, England
  • United States 10463
  • Building: Leo Engineering Building
  • Room Number: Scala Room

Staticmap?size=250x200&sensor=false&zoom=14&markers=40.8864983%2c 73
  • Co-sponsored by Manhattan College, Electrical & Computer Engineering Department
  • Starts 21 June 2017 02:00 PM
  • Ends 27 June 2017 05:00 PM
  • All times are America/New_York
  • No Admission Charge
  • Register


  Speakers

Prof. Wuqiang Yang, FIEEE, CEng of University of Manchester, UK

Topic:

"Electrical Capacitance Tomography and Industrial Applications"

Among various industrial tomography modalities, electrical capacitance tomography (ECT) is the most mature and has been used for many challenging applications. ECT is obviously based on measuring capacitance and reconstructing permittivity distribution. ECT has advantages of no radioactive, rapid response, both non-intrusive and non-invasive, withstanding high temperature and high pressure and of low-cost. Because of extremely small capacitance to be measured (down to 0.0001 pF) and the soft-field nature, ECT does present challenges in circuit design, inverse problem and engineering. Our latest AC-based ECT system can generate online images at 300 frames per second with a signal-to-noise ratio (SNR) of 73 dB, and has been used in many challenging applications. During this talk, the principle of ECT will be introduced and some industrial applications will be discussed in detail, together with a demonstration of an AC-based ECT system.

Biography:

Professor Wuqiang Yang (FIET, FInstMC, FIEEE, CEng)  received his BEng (Distinction) 1982, MSc 1985 and PhD (Distinction) 1988, from Tsinghua University. After 3 years as a Lecturer at Tsinghua University, he joined UMIST in 1991. His research is focused on electrical capacitance tomography (ECT), has published 300 papers and a book "Sensor Array", and holds 10 patents, including 2 WO patents, which have been licensed to industry. He is an Associate Editor of IEEE Trans. IM and an editorial board member of 7 other journals, including Meas. Sci. Technol. and Sensor Review, and reviews papers for 40 journals, including 6 IEEE journals. He has been invited by many universities and research institutions worldwide and international conferences to give lectures/seminars/keynotes. He is a visiting professor at 8 universities, including MIT, and Tsinghua University. He is recognised by International Center for Scientific Research (France), as one of top 30 technology researchers in the world, and Intota as an expert. Since 2010, he is an IEEE IMS Distinguished Lecturer.

Address:Manchester, United Kingdom





Agenda

5:30 PM - Professional networking

5:35 PM - Introductions and Opening remarks

5:40 PM - Presentation

6:30 PM - Q&A and Closing Remarks



Organizers: IEEE New York Section, Broadcast Technology Society Chapter and Manhattan College, Electrical and Computer Engineering Department

For more information please contact: Ahmed.hussein@manhattan.edu