IEEE CEDA Spain Chapter / NANOVAR Workshop

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The Spain Chapter of the IEEE Council on Electronic Design Automation (CEDA)  and the NANOVAR network present the workshop:

Title: How to survive in an unreliable world

Date: November 21, 2017

Time: 9:00 CET

Venue: Escola d'Enginyeria de Barcelona Est (EEBE), UPC Campus Diagonal-Besòs, Barcelona, Spain.

Registration: Registration required by November 15. No registration fee.

Details: Agenda included below. Click here for additional information.

Activity supported by Universitat Politècnica de Catalunya



  Date and Time

  Location

  Contact

  Registration


  • UPC Campus Diagonal-Besòs
  • Av. d'Eduard Maristany, 10-14
  • Barcelona, Cataluna
  • Spain 08930
  • Building: Escola d'Enginyeria de Barcelona Est (EEBE)
  • Click here for Map

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  • Co-sponsored by NANOVAR Spanish Network of Excellence
  • Registration closed






Agenda

Time

Activity

Speakers

9:00-9:15

Presentation IEEE CEDA Spain Chapter and NANOVAR network

Montserrat Nafría

Francisco V. Fernández-José Luis Ayala

9:15-10:15

Opening lecture

Lifetime simulation of semiconductor circuits

Dr. Linda Milor

Georgia Tech

 

10:30-11:10

Modeling of unreliability effects in electronic devices

Dr. J. Martin-Martinez

UAB

11:10-11:50

Reliability in the circuit design flow: from characterization and modelling to design automation

Dr. R. Castro-López

IMSE-CNM

11:50-12:10

Break

 

12:10-12:50

Benefactory factors of noise and degradation in the performance of non-linear circuits

Dr. A. Rubio

UPC

12:50-13:30

Exploiting the variability of semiconductor fabrication process for hardware security

Dr. I. Baturone

IMSE-CNM

13:30-14:30

Lunch

 

14:30-15:10

Robust design based on variability monitoring 

Dr. M. Lopez Vallejo

UPM

15:10-15:50

Transient Radiation effects on SRAM memories

Dr. G. Torrens

UIB

15:50-16:10

Break

 

16:10-16:50

Why is systematic AMS-RF test not there yet?

Dr. G. Leger

IMSE-CNM

16:50-17:30

Test and fault diagnosis in digital circuits

Dr. R.  Rodriguez

UPC