IEEE CEDA Spain Chapter / NANOVAR Workshop
The Spain Chapter of the IEEE Council on Electronic Design Automation (CEDA) and the NANOVAR network present the workshop:
Title: How to survive in an unreliable world
Date: November 21, 2017
Time: 9:00 CET
Venue: Escola d'Enginyeria de Barcelona Est (EEBE), UPC Campus Diagonal-Besòs, Barcelona, Spain.
Registration: Registration required by November 15. No registration fee.
Details: Agenda included below. Click here for additional information.
Activity supported by Universitat Politècnica de Catalunya
Date and Time
Location
Hosts
Registration
- Date: 21 Nov 2017
- Time: 09:00 AM to 05:30 PM
- All times are (UTC+01:00) Madrid
-
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- UPC Campus Diagonal-Besòs
- Av. d'Eduard Maristany, 10-14
- Barcelona, Cataluna
- Spain 08930
- Building: Escola d'Enginyeria de Barcelona Est (EEBE)
- Click here for Map
- Contact Event Host
- Co-sponsored by NANOVAR Spanish Network of Excellence
- Starts 04 October 2017 01:00 PM
- Ends 15 November 2017 11:00 PM
- All times are (UTC+01:00) Madrid
- No Admission Charge
Agenda
|
Time |
Activity |
Speakers |
|
9:00-9:15 |
Presentation IEEE CEDA Spain Chapter and NANOVAR network |
Montserrat Nafría Francisco V. Fernández-José Luis Ayala |
|
9:15-10:15 |
Opening lecture Lifetime simulation of semiconductor circuits |
Dr. Linda Milor Georgia Tech
|
|
10:30-11:10 |
Modeling of unreliability effects in electronic devices |
Dr. J. Martin-Martinez UAB |
|
11:10-11:50 |
Reliability in the circuit design flow: from characterization and modelling to design automation |
Dr. R. Castro-López IMSE-CNM |
|
11:50-12:10 |
Break |
|
|
12:10-12:50 |
Benefactory factors of noise and degradation in the performance of non-linear circuits |
Dr. A. Rubio UPC |
|
12:50-13:30 |
Exploiting the variability of semiconductor fabrication process for hardware security |
Dr. I. Baturone IMSE-CNM |
|
13:30-14:30 |
Lunch |
|
|
14:30-15:10 |
Robust design based on variability monitoring |
Dr. M. Lopez Vallejo UPM |
|
15:10-15:50 |
Transient Radiation effects on SRAM memories |
Dr. G. Torrens UIB |
|
15:50-16:10 |
Break |
|
|
16:10-16:50 |
Why is systematic AMS-RF test not there yet? |
Dr. G. Leger IMSE-CNM |
|
16:50-17:30 |
Test and fault diagnosis in digital circuits |
Dr. R. Rodriguez UPC |