Terrestrial Radiation Induced Soft Errors in Integrated Circuits
The impact of background radiation on microelectronics is generally unappreciated. Soft errors, or single event upsets, are random, transient, recoverable failures unrelated to any defects or device shifts. There are three main types of radiation that cause soft errors in integrated circuits. The discoveries of these various mechanisms are discussed from a historical perspective, and the current physical understanding of each is presented. Next, methods used to test and model the soft error rate of circuits are explained. Finally, process, technology, and circuit mitigation techniques are covered.
Date and Time
Location
Hosts
Registration
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- 161 Warren Street
- Newark, New Jersey
- United States 07102
- Building: ECE Building, Room 202, NJIT
- Room Number: ECEC-202
- Click here for Map
- Contact Event Host
- Durga Misra, ECE Dept, NJIT; Phone: +1-973-596-5739, Edip Niver, +1-973-596-3542
- Co-sponsored by Durga Misra
- Starts 25 April 2012 03:00 PM UTC
- Ends 23 May 2012 09:00 PM UTC
- No Admission Charge
Speakers
Stewart Rauch of IBM Semiconductor Research and Development Center (NY)
Terrestrial Radiation Induced Soft Errors in Integrated Circuits
The impact of background radiation on microelectronics is generally unappreciated. Soft errors, or single event upsets, are random, transient, recoverable failures unrelated to any defects or device shifts. There are three main types of radiation that cause soft errors in integrated circuits. The discoveries of these various mechanisms are discussed from a historical perspective, and the current physical understanding of each is presented. Next, methods used to test and model the soft error rate of circuits are explained. Finally, process, technology, and circuit mitigation techniques are covered.
Biography:
Dr. Stewart Rauch is a Senior Technical Staff Member at IBM Semiconductor Research and Development Center (NY), specializing in hot carrier, bias temperature instability, and soft error reliability of state of the art CMOS technologies. He is a Senior Member of IEEE, a Member and Distinguished Lecturer of the Electron Devices Society, and frequent reviewer for the IEEE Transactions on Device and Material Reliability (TDMR.)
Email:
Address:Senior Member of Technical Staff, , IBM Semiconductor Research and Development Center (NY), New York, United States
Stewart Rauch of IBM Semiconductor Research and Development Center (NY)
Terrestrial Radiation Induced Soft Errors in Integrated Circuits
Biography:
Email:
Address:New York, United States
Agenda
Time: 5:00 PM, Wednesday, May 23, 2012. Refreshments (Pizza & Soda) will be at 4:45 PM.